Patents by Inventor Tae-Hung Ku
Tae-Hung Ku has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20100316478Abstract: A pick-and-place module for test handlers is disclosed that includes a main body and a kit. The main body forms vacuum paths therein and the kit also forms vacuum passages therein. The kit is detachably mounted to the main body in a hook coupling manner. The pick-and-place module can be applied to all customer trays having different loading capabilities when only the kit of the pick-and-place module needs to be replaced, so there is no need to manufacture the entire pick-and-place module and this reduces manufacturing costs. The pick-and-place module can reduce the amount of resources to be replaced and reduce the replacement time since the kit can be easily removed from the main body of the pick-and-place module in a hook manner.Type: ApplicationFiled: May 26, 2010Publication date: December 16, 2010Applicant: TECHWING CO., LTD.Inventors: Yun Sung NA, Tae-Hung KU, Cheul-Gyu BOO
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Patent number: 7741836Abstract: A test handler is disclosed. First and second gripping blocks for respective front and rear test trays to be transferred along a circulation path move together in a circulation direction, but move independently in a direction perpendicular to the circulation path and grip and release independently. The test trays can be transferred by a single power source and interference between an assisting a test and a transferring can be minimized.Type: GrantFiled: February 22, 2008Date of Patent: June 22, 2010Assignee: Techwing Co., Ltd.Inventors: Yun Sung Na, In Gu Jeon, Tae Hung Ku, Dong-Hyun Yo, Doo-Woo Kim
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Patent number: 7723981Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: GrantFiled: February 20, 2009Date of Patent: May 25, 2010Assignee: Techwing Co., Ltd.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Dong Han Kim
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Publication number: 20100097089Abstract: When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.Type: ApplicationFiled: December 10, 2009Publication date: April 22, 2010Applicant: TECHWING CO. LTD.Inventors: Jae-Gyun SHIM, Yun-Sung NA, In-Gu JEON, Tae-Hung KU, Hyun-Jun YOO
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Patent number: 7667453Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: GrantFiled: July 10, 2008Date of Patent: February 23, 2010Assignee: Techwing Co., Ltd.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Hyun Jun Yoo
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Patent number: 7656150Abstract: When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.Type: GrantFiled: January 25, 2007Date of Patent: February 2, 2010Assignee: TechWing Co., Ltd.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Hyun-Jun Yoo
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Publication number: 20100001739Abstract: A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.Type: ApplicationFiled: October 22, 2007Publication date: January 7, 2010Applicant: TechWing., CO. LTDInventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Jung-Woo Hwang
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Publication number: 20100001753Abstract: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.Type: ApplicationFiled: April 20, 2009Publication date: January 7, 2010Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
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Publication number: 20090245982Abstract: A unit for opening an insert of a test tray which comprises an accommodating space for accommodating a semiconductor device and a support for supporting the semiconductor device accommodated in the accommodating space, the unit includes a body, a pair of opening devices provided in the body to open the insert, and a positioning guide unit protruding to be inserted into an accommodating space for a semiconductor device when opening the insert and supporting the semiconductor device that is transferred into the accommodating space to be spaced upward apart from a support provided in the accommodating space.Type: ApplicationFiled: March 19, 2009Publication date: October 1, 2009Applicant: TECHWING CO., LTD.Inventors: Yun Sung NA, Tae Hung KU, Jung Woo HWANG
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Publication number: 20090230201Abstract: A system to support the testing of electronic devices and a temperature control unit for the system are disclosed. A temperature controlling method for a chamber of the system is also disclosed. Low or high temperature air is supplied to the inside of the chamber when the electronic devices are tested at low or high temperature. External air is supplied to the inside of the chamber when the electronic devices are tested at room temperature.Type: ApplicationFiled: March 9, 2009Publication date: September 17, 2009Applicant: TECHWING CO., LTD.Inventors: Yun-Sung NA, Tae-Hung KU, Cheul-Gyu BOO
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Patent number: 7557564Abstract: A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.Type: GrantFiled: March 28, 2007Date of Patent: July 7, 2009Assignee: TechWing Co., Ltd.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Jae-Sung Park, Su-Myung Lee
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Publication number: 20090153178Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: ApplicationFiled: February 20, 2009Publication date: June 18, 2009Applicant: TECHWING CO., LTD.Inventors: Jae Gyun SHIM, Yun Sung NA, In Gu JEON, Tae Hung KU, Dong Han KIM
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Publication number: 20090148257Abstract: A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.Type: ApplicationFiled: February 10, 2009Publication date: June 11, 2009Applicant: TECHWING CO. LTDInventors: Jae-Gyun SHIM, Yun-Sung NA, In-Gu JEON, Tae-Hung KU, Jae-Sung PARK, Su-myung LEE
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Patent number: 7538542Abstract: A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.Type: GrantFiled: December 15, 2006Date of Patent: May 26, 2009Assignee: TechWing., Co. Ltd.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
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Publication number: 20080298946Abstract: A test handler is disclosed, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time. Also, the present invention can be easily applied to various types of testers.Type: ApplicationFiled: February 9, 2007Publication date: December 4, 2008Applicant: TECHWING CO., LTD.Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
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Publication number: 20080284186Abstract: A pick and place apparatus includes a 1st to an nth device holding element arranged in a lengthwise direction, every one of the 1st to the nth device holding element being connected to its neighboring one(s) of the 1st to the nth device holding element by means of at least one pitch setting ring; a belt having a first coupling part at an upper part thereof for being coupled to the 1st device holding element and a second coupling part at a lower part thereof for being coupled to the nth device holding element; and a driven pulley and a differential pulley. The driven and the differential pulley are rotated by being engaged with the belt to move the 1st and the nth device holding element such that the 1st device holding element moves in a direction opposite to the nth device holding element.Type: ApplicationFiled: November 15, 2006Publication date: November 20, 2008Applicant: TECHWING CO., LTD.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Dong Hyun Yo
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Publication number: 20080272764Abstract: The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.Type: ApplicationFiled: July 10, 2008Publication date: November 6, 2008Applicant: TECHWING CO., LTD.Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Hyun Jun Yoo
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Publication number: 20080265874Abstract: A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed.Type: ApplicationFiled: July 10, 2008Publication date: October 30, 2008Applicant: TECHWING CO., LTD.Inventors: Jae Gyun SHIM, Yun Sung NA, In Gu JEON, Tae Hung KU, Dong Han KIM
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Publication number: 20080213078Abstract: A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately.Type: ApplicationFiled: April 15, 2008Publication date: September 4, 2008Applicant: TECHWING CO., LTD.Inventors: Jae Gyun SHIM, Yun Sung NA, In Gu JEON, Tae Hung KU, Dong Hyun YO
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Publication number: 20080203999Abstract: A test handler is disclosed. First and second gripping blocks for respective front and rear test trays to be transferred along a circulation path move together in a circulation direction, but move independently in a direction perpendicular to the circulation path and grip and release independently. The test trays can be transferred by a single power source and interference between an assisting a test and a transferring can be minimized.Type: ApplicationFiled: February 22, 2008Publication date: August 28, 2008Applicant: TECHWING CO., LTD.Inventors: Yun Sung NA, In Gu JEON, Tae Hung KU, Dong-Hyun YO, Doo-Woo KIM