Abstract: The present disclosure provides a cache device and a LCD screen production line. The cache device provided by the present disclosure includes an outer frame having an opening for picking and placing cached items on a first side wall thereof and a support bracket for horizontally supporting cached items therein; and first blowing means disposed on the second side wall of the outer frame for blowing air toward the opening; second blowing means disposed on the third side wall or the fourth side wall of the outer frame; an exhaust means disposed on a fourth side wall opposite to the third side wall of the frame.

Abstract: The present disclosure provides a cache device and a LCD screen production line. The cache device provided by the present disclosure includes an outer frame having an opening for picking and placing cached items on a first side wall thereof and a support bracket for horizontally supporting cached items therein; and first blowing means disposed on the second side wall of the outer frame for blowing air toward the opening; second blowing means disposed on the third side wall or the fourth side wall of the outer frame; an exhaust means disposed on a fourth side wall opposite to the third side wall of the frame.

Abstract: A substrate inspection device and method are disclosed. The substrate inspection device includes a conveyance stage for carrying the substrate on its surface; a region scanning camera located at a first side of the conveyance stage, provided to be opposite to the surface, and configured for inspecting standard specification of the substrate; a line scanning camera located at the first side of the conveyance stage, provided to be opposite to the surface, and configured for inspecting edge line and size of the substrate; and a light source located at a second side of the conveyance stage opposite to the first side, configured for irradiating light rays onto the substrate, so as to be utilized by the region scanning camera and the line scanning camera for inspecting the substrate.

Abstract: A substrate inspection device and method are disclosed. The substrate inspection device includes a conveyance stage for carrying the substrate on its surface; a region scanning camera located at a first side of the conveyance stage, provided to be opposite to the surface, and configured for inspecting standard specification of the substrate; a line scanning camera located at the first side of the conveyance stage, provided to be opposite to the surface, and configured for inspecting edge line and size of the substrate; and a light source located at a second side of the conveyance stage opposite to the first side, configured for irradiating light rays onto the substrate, so as to be utilized by the region scanning camera and the line scanning camera for inspecting the substrate.

Abstract: Provided are a system and a method for monitoring welding operations. The system includes a welding machine, a current sensor sensing an operation time of the welding machine and a welding current, a welding information database storing information of the operation time of the welding machine and the welding current for each welding operator and storing information of a consumed charge amount of the welding machine, which is preset for each welding operation process, a data analyzer checking a charge amount consumed for the operation time by using the sensed operation time of the welding machine and the welding current and determining whether the welding operator achieves a task goal of a corresponding process by comparing the checked consumed charge amount with the preset consumed charge amount for a process performed by the welding machine, and a display unit outputting a result of the determining, performed by the data analyzer, whether the welding operator achieves a task goal of a corresponding process.