Abstract: A filter protection apparatus includes a frame of a closed curve defining an inner space isolated from surroundings, the frame having a shape of a filter securing part for securing an air filter, an attaching part for attaching the frame to a filter securing part, and a protection part, which is coupled on the inner surface of the frame to occupy the inner space with a plurality of minute holes through which air passes, for protecting the filter from damage. In operation, the protection part is able to prevent damage to the filter that may be caused by work instruments during maintenance work.

Abstract: A method for safely storing an object includes loading the object into a storage box for receiving the object, sealing the storage box, spraying a cleaning gas into the storage box containing the object through a first valve connected to the storage box by providing the cleaning gas from an outside source, and exhausting the cleaning gas from the storage box through a second valve connected to the storage box by increasing a pressure of the cleaning gas in the storage box.

Abstract: A filter protection apparatus includes a frame of a closed curve defining an inner space isolated from surroundings, the frame having a shape of a filter securing part for securing an air filter, an attaching part for attaching the frame to a filter securing part, and a protection part, which is coupled on the inner surface of the frame to occupy the inner space with a plurality of minute holes through which air passes, for protecting the filter from damage. In operation, the protection part is able to prevent damage to the filter that may be caused by work instruments during maintenance work.

Abstract: A wafer holding stage used during a semiconductor device fabricating process decreases the number of particles that accumulate on a wafer. The wafer holding stage includes a stage having an upper surface for holding a wafer and a heating element disposed inside the stage for raising temperatures of the upper surface to a holding temperature above an ambient temperature. The heating element may be a heating wire for producing heat when supplied with a electric current or a heat exchange tube for carrying a heated fluid. The wafer holding stage may further comprise a low temperature particle collector, having a surface maintained at a collecting temperature below the ambient temperature, spaced apart a small distance from the stage.