Patents by Inventor TAEER WEISS

TAEER WEISS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11425324
    Abstract: A method for time-of-flight (ToF) guided down-up sampling includes calculating a guide function from a full resolution output of a ToF sensor, downsampling the full resolution output by a predetermined scaling factor, calculating a downsampled depth data from the downsampled output and upsampling the downsampled depth data to full resolution using the full resolution guide function.
    Type: Grant
    Filed: June 22, 2020
    Date of Patent: August 23, 2022
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Taeer Weiss, Roy Yam, Gal Bitan
  • Publication number: 20210400217
    Abstract: A method for time-of-flight (ToF) guided down-up sampling includes calculating a guide function from a full resolution output of a ToF sensor, downsampling the full resolution output by a predetermined scaling factor, calculating a downsampled depth data from the downsampled output and upsampling the downsampled depth data to full resolution using the full resolution guide function.
    Type: Application
    Filed: June 22, 2020
    Publication date: December 23, 2021
    Inventors: TAEER WEISS, Roy Yam, Gal Bitan