Patents by Inventor Taeg-Gyum Kim

Taeg-Gyum Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130235387
    Abstract: Disclosed herein is a three-dimensional (3D) measuring device and method. The 3D measuring device includes a light source emitting a laser beam, a focal point adjusting device adjusting a focal position of the laser beam, a rotating reflection mirror reflecting the laser beam of which the focal position is adjusted by the focal point adjusting device, a scanning lens disposed on a route of the laser beam so as to scan a measuring target with the laser beam reflected by the rotating reflection mirror, a condenser lens condensing the laser beam reflected on the measuring target, and at least one detection unit receiving the laser beam condensed on the condenser lens to thereby detect a laser beam signal.
    Type: Application
    Filed: March 5, 2013
    Publication date: September 12, 2013
    Applicant: Samsung Electro-Mechanics Co., Ltd.
    Inventor: Taeg Gyum KIM
  • Publication number: 20130208277
    Abstract: Disclosed herein is a laser scan device. The laser scan device according to a preferred embodiment of the present invention includes a laser light emitting unit emitting a laser beam; a scan unit irradiating the laser beam to a measurement portion of a measurement object; and a condensing unit including a spherical light collector condensing light generated by irradiating the laser beam to the measurement object.
    Type: Application
    Filed: June 28, 2012
    Publication date: August 15, 2013
    Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.
    Inventor: Taeg Gyum KIM
  • Publication number: 20120194810
    Abstract: Disclosed herein is an apparatus for inspecting a printed circuit board. The apparatus includes a first laser light source; a first light condensing unit condensing a light emitted from the first laser light source onto a printed circuit board having a via-hole; a first dichroic beam splitting unit separating fluorescent light a fluorescence generated from the printed circuit board by the light condensed by the first light condensing unit from the light emitted from the first laser light source; and a determining unit determining an unplated state of the printed circuit board from the light passing through the first dichroic beam splitting unit, wherein the via-hole formed in the printed circuit board includes an internal side surface having an unplated part which is not plated, and the light emitted from the first light condensing unit is incident at a first angle with respect to the printed circuit board and condensed to the unplated part of the internal side surface of the via-hole.
    Type: Application
    Filed: March 29, 2011
    Publication date: August 2, 2012
    Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.
    Inventors: Taeg Gyum Kim, Jae Youn Jeong
  • Patent number: 8228503
    Abstract: An apparatus for detecting a particle is disclosed. The apparatus for detecting a particle in a fluid in accordance with an embodiment of the present invention can include a first light source, which emits a first beam having a wavelength of a particular band toward the fluid, a second light source, which emits a second beam having a wavelength of a band that is different from that of the first beam, a first dichroic mirror, which is placed between the fluid and the first light source and allows the first beam to permeate and reflect the second beam toward the fluid, and a detecting unit, which detects a dispersed beam of the first beam and the second beam in the fluid. An embodiment of the invention can improve the reliability of detection by detecting a particle using a beam that has an optimal permeability according to the type of solution.
    Type: Grant
    Filed: August 17, 2010
    Date of Patent: July 24, 2012
    Assignee: Samsung Electro-Mechanics Co., Ltd.
    Inventors: Taeg-Gyum Kim, Kwang-Ho Ji
  • Publication number: 20110242534
    Abstract: An apparatus for detecting a particle is disclosed. The apparatus for detecting a particle in a fluid in accordance with an embodiment of the present invention can include a first light source, which emits a first beam having a wavelength of a particular band toward the fluid, a second light source, which emits a second beam having a wavelength of a band that is different from that of the first beam, a first dichroic mirror, which is placed between the fluid and the first light source and allows the first beam to permeate and reflect the second beam toward the fluid, and a detecting unit, which detects a dispersed beam of the first beam and the second beam in the fluid. An embodiment of the invention can improve the reliability of detection by detecting a particle using a beam that has an optimal permeability according to the type of solution.
    Type: Application
    Filed: August 17, 2010
    Publication date: October 6, 2011
    Inventors: Taeg-Gyum KIM, Kwang-Ho Ji