Abstract: Disclosed is a memory system including a memory device including a plurality of memory blocks, and a controller suitable for controlling the memory device to perform pre-read reclaim on pre-victim blocks of pre-read blocks among the plurality of memory blocks, the pre-victim blocks including uncorrectable errors, the pre-read blocks being blocks on which a pre-read operation has been performed.

Abstract: A storage device may receive a program command requesting to program target data, determine a foggy-program address and a fine-program address, receive the target data, copy the target data to a buffer, and foggy-program the target data to the foggy program address and fine-programs the target data to the fine-program address.

Abstract: An automotive system includes a memory device and a controller. The memory device is installed in an automobile. The controller controls the memory device and an electronic device in the automobile. The controller controls the memory device to process a background operation during a time limit when a background operation trigger event may be detected.

Abstract: Provided herein is an electronic device including: a host configured to judge a possibility of occurrence of an SPO based on driving information of a transportation device, and determine an operation mode of a storage device to be an SPO protection mode or a performance mode based on the possibility of an SPO occurrence; a buffer memory device configured to temporarily store user data received from the host; a memory device configured to store the user data output from the buffer memory device; and a memory controller configured to set a size of the buffer memory device depending on the determined operation mode and to control the buffer memory device to output at least a part of the user data temporarily stored in the buffer memory device to the memory device based on an amount of the buffer memory device used.

Abstract: A storage device includes: a memory device including a plurality of system blocks for storing system data; and a memory controller configured to control the memory device to store cyclic system data that is cyclically provided from a host, in an open system block among the plurality of system blocks, and control the memory device to perform a garbage collection operation on the plurality of system blocks, when a size of data stored in the open system block reaches a predetermined size. The cyclic system data may include a plurality of data slices provided from the host at predetermined cycles. The predetermined size may be determined based on size of the cyclic system data provided for a period of time corresponding to a common multiple of the predetermined cycles.

Abstract: Embodiments of the present disclosure relate to a memory system and an operating method thereof. According to the embodiments of the present disclosure, the memory system may completely scan each of one or more target memory blocks among the plurality of memory blocks, once in each scan period to detect an error in data stored in the corresponding target memory block and may block an attempted second scan of each target memory block in a scan period in which the corresponding target memory block has already been scanned until the scan period is completed.

Abstract: A storage device may include: a memory device including a plurality of memory blocks; a buffer memory device to store event information; and a memory controller configured to: upon occurrence of the predetermined event while a write operation, store, in the buffer memory device, the event information for the event page, and control the memory device to perform a test read operation to read at least one page in the plurality of memory blocks except the event page, based on the event information; upon failure of the test read operation, control the memory device to perform a migration operation of moving, to a replacement block, data stored in valid pages except a page on which the test read operation has fails among pages included in a memory block on which the test read operation fails.

Abstract: A storage device may include: a memory device including a plurality of memory blocks; a buffer memory device to store event information; and a memory controller configured to: upon occurrence of the predetermined event while a write operation, store, in the buffer memory device, the event information for the event page, and control the memory device to perform a test read operation to read at least one page in the plurality of memory blocks except the event page, based on the event information; upon failure of the test read operation, control the memory device to perform a migration operation of moving, to a replacement block, data stored in valid pages except a page on which the test read operation has fails among pages included in a memory block on which the test read operation fails.

Abstract: A storage device includes: a memory device including a plurality of system blocks for storing system data; and a memory controller configured to control the memory device to store cyclic system data that is cyclically provided from a host, in an open system block among the plurality of system blocks, and control the memory device to perform a garbage collection operation on the plurality of system blocks, when a size of data stored in the open system block reaches a predetermined size. The cyclic system data may include a plurality of data slices provided from the host at predetermined cycles. The predetermined size may be determined based on size of the cyclic system data provided for a period of time corresponding to a common multiple of the predetermined cycles.

Abstract: Embodiments of the present disclosure relate to a memory system and an operating method thereof. According to the embodiments of the present disclosure, the memory system may completely scan each of one or more target memory blocks among the plurality of memory blocks, once in each scan period to detect an error in data stored in the corresponding target memory block and may block an attempted second scan of each target memory block in a scan period in which the corresponding target memory block has already been scanned until the scan period is completed.

Abstract: Embodiments of the present invention may provide a microchip applicable to an electrophoresis employing UV detection and a method of manufacturing the same. The microchip of the present invention has a glass channel plate, which is formed on an upper surface thereof with a loading channel and a separation channel and is provided on the upper surface thereof with an optical slit layer made of silicon except the channel region, and a glass reservoir plate, which is formed with sample solution reservoirs and buffer solution reservoirs. The loading channel and the separation channel are formed on the channel plate by deep reactive ion etching. The sample solution reservoirs and the buffer solution reservoirs are formed in the reservoir plate by sand blasting. The channel plate and the reservoir plate are combined by anodic bonding the optical slit layer and the reservoir plate. Electrodes for sample and electrodes for buffer are deposited by sputtering Pt with a shadow mask after anodic bonding.

Abstract: Embodiments of the present invention may provide a microchip applicable to an electrophoresis employing UV detection and a method of manufacturing the same. The microchip of the present invention has a glass channel plate, which is formed on an upper surface thereof with a loading channel and a separation channel and is provided on the upper surface thereof with an optical slit layer made of silicon except the channel region, and a glass reservoir plate, which is formed with sample solution reservoirs and buffer solution reservoirs. The loading channel and the separation channel are formed on the channel plate by deep reactive ion etching. The sample solution reservoirs and the buffer solution reservoirs are formed in the reservoir plate by sand blasting. The channel plate and the reservoir plate are combined by anodic bonding the optical slit layer and the reservoir plate. Electrodes for sample and electrodes for buffer are deposited by sputtering Pt with a shadow mask after anodic bonding.

Abstract: A system for manufacturing a print board assembly, which is implemented in a system having a computer for storing parts insertion instruction diagrams and displaying parts insertion instructions, and a soldering unit for soldering a printed circuit board, includes: assembling different types of the printed circuit boards from pieces of parts and inspecting them in a multitude of cells; installing different types of the printed circuit boards in carriers to assemble them separately according to the parts insertion instructions displayed by the computer of each cell, and moving them to the soldering unit through a transfer conveyor line; and returning the carriers having the printed circuit boards completely soldered to each cell identified for the carriers through a return conveyor line.

Abstract: A method of manufacturing a print board assembly, which is implemented in a system having a computer for storing parts insertion instruction diagrams and displaying parts insertion instructions, and a soldering unit for soldering a printed circuit board, includes the steps of: assembling different types of the printed circuit boards from pieces of parts and inspecting them in a multitude of cells; installing different types of the printed circuit boards in carriers to assemble them separately according to the parts insertion instructions displayed by the computer of each cell, and moving them to the soldering unit through a transfer conveyor line; and returning the carriers having the printed circuit boards completely soldered to each cell identified for the carriers through a return conveyor line.