Patents by Inventor Taehwa OH

Taehwa OH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230085028
    Abstract: A method of detecting abnormalities includes: calculating a reference failure rate using failure data at a plurality of points in time included in a particular period; calculating a detection failure rate and weighting, corresponding to failure data at a detection time point after the particular period, using the reference failure rate; calculating an abnormality index based on multiplying the detection failure rate by the weighting; comparing the abnormality index with an index corresponding to a control limit for stably controlling a failure rate; and detecting whether the failure data at the detection time point is abnormal, based on a result of the comparison of the abnormality index with the index corresponding to the control limit.
    Type: Application
    Filed: May 9, 2022
    Publication date: March 16, 2023
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Jiho GHIL, Taeyoung ROH, Taehwa OH, Bumsuk CHUNG, Bokyoung KANG