Patents by Inventor Tahllee Baynard

Tahllee Baynard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8078410
    Abstract: Provided herein are systems and methods capable of detecting and discriminating and/or classifying hazardous biological agents or other hazardous agents. In one aspect, a system measures electromagnetic energy scattered by a material at the different polarizations states and wavelengths. The system then combines the measured electromagnetic wavelengths at the different polarization states and wavelengths into different combinations to produce input parameters for a classifier. The input parameters include both depolarization and wavelength-dependent elastic backscatter measurements of the material illuminated by transmitted electromagnetic energy. The combination of wavelength dependent depolarization measurements and wavelength dependent backscatter measurements provides a unique capability to classify (or discriminate) based on size, shape, and refractive index.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: December 13, 2011
    Assignee: Lockheed Martin Coherent Technologies, Inc.
    Inventors: John H. Marquardt, Tahllee Baynard
  • Publication number: 20100280765
    Abstract: Provided herein are systems and methods capable of detecting and discriminating and/or classifying hazardous biological agents or other hazardous agents. In one aspect, a system measures electromagnetic energy scattered by a material at the different polarizations states and wavelengths. The system then combines the measured electromagnetic wavelengths at the different polarization states and wavelengths into different combinations to produce input parameters for a classifier. The input parameters include both depolarization and wavelength-dependent back scattering measurements of the material illuminated by transmitted electromagnetic energy. The depolarization measurement provides information on the shape and absorption features of the material and the wavelength-dependent information provides information on the shape and index of refraction of the material.
    Type: Application
    Filed: October 31, 2008
    Publication date: November 4, 2010
    Applicant: LOCKHEED MARTIN COHERENT TECHNOLOGIES, INC.
    Inventors: John H. MARQUARDT, Tahllee Baynard