Abstract: A magnetic tunnel junction (MTJ) memory cell and a metallic etch mask portion are formed over a substrate. At least one dielectric etch stop layer is deposited over the metallic etch mask portion, and a via-level dielectric layer is deposited over the at least one dielectric etch stop layer. A via cavity may be etched through the via-level dielectric layer, and a top surface of the at least one dielectric etch stop layer is physically exposed. The via cavity may be vertically extended by removing portions of the at least one dielectric etch stop layer and the metallic etch mask portion. A contact via structure is formed directly on a top surface of the top electrode in the via cavity to provide a low-resistance contact to the top electrode.

Abstract: In an embodiment, a method includes: forming a first inter-metal dielectric (IMD) layer over a semiconductor substrate; forming a bottom electrode layer over the first IMD layer; forming a magnetic tunnel junction (MTJ) film stack over the bottom electrode layer; forming a first top electrode layer over the MTJ film stack; forming a protective mask covering a first region of the first top electrode layer, a second region of the first top electrode layer being uncovered by the protective mask; forming a second top electrode layer over the protective mask and the first top electrode layer; and patterning the second top electrode layer, the first top electrode layer, the MTJ film stack, the bottom electrode layer, and the first IMD layer with an ion beam etching (IBE) process to form a MRAM cell, where the protective mask is etched during the IBE process.

Abstract: The present disclosure provides a semiconductor structure. The semiconductor structure includes an insulation layer. A bottom electrode via is disposed in the insulation layer. The bottom electrode via includes a conductive portion and a capping layer over the conductive portion. A barrier layer surrounds the bottom electrode via. A magnetic tunneling junction (MTJ) is disposed over the bottom electrode via.

Abstract: A method includes forming Magnetic Tunnel Junction (MTJ) stack layers, which includes depositing a bottom electrode layer; depositing a bottom magnetic electrode layer over the bottom electrode layer; depositing a tunnel barrier layer over the bottom magnetic electrode layer; depositing a top magnetic electrode layer over the tunnel barrier layer; and depositing a top electrode layer over the top magnetic electrode layer. The method further includes patterning the MTJ stack layers to form a MTJ; and performing a passivation process on a sidewall of the MTJ to form a protection layer. The passivation process includes reacting sidewall surface portions of the MTJ with a process gas comprising elements selected from the group consisting of oxygen, nitrogen, carbon, and combinations thereof.

Abstract: Provided is a method for testing a perovskite precursor solution, including: taking a perovskite precursor solution containing a plurality of dispersed perovskite colloids as a sample to perform liquid analysis, thereby obtaining an analysis information; and determining whether the perovskite precursor solution is a good product based on obtained analysis information from the liquid analysis, wherein the analysis information is at least one selected from the group consisting of element content of the colloid, element distribution, colloid size, and colloid appearance, thereby a feasible and effective testing method is defined through the correlation between the perovskite precursor colloid and the perovskite.

Abstract: The invention discloses a method for correcting screen display based on negative feedback. Correction of the G channel value, the B channel value and the R channel value in turn is marked as a correction of the working parameters of the screen. Measuring if the luminance, color temperature y-axis coordinate and color temperature x-axis coordinate of the screen display simultaneously reach the corresponding target values after correcting the working parameters for one time; if yes, the current gray scale correction is ended; otherwise, correcting the working parameters of the current gray scale again by starting from correction of the G channel value. The R channel value, the G channel value and the B channel value are corrected in a separate manner based on the feedback, and the correction process is simplified, such that the accuracy of a single correction is higher and the correction speed is improved.

Abstract: The present invention discloses a method of correcting screen brightness and color temperature, it relates to the field of display technology. The present invention is used for correcting the working parameters of the every m stages of gray-level pictures to adjust display of the screen to a maximum gray level, the correction is started from a gray level next to the maximum gray level, and only for correction of the first gray level, working parameters of the previous gray level are used as the initial values of working parameters of the current gray level correction; from correction of the second gray level, a correction estimated value of working parameters of a current gray level is estimated according to the working parameters and the local linearity relation of the two corrected gray levels, and the correction estimated value is taken as the initial working parameter of the current gray level correction.

Abstract: The present invention discloses a method of correcting screen brightness and color temperature, it relates to the field of display technology. The present invention is used for correcting the working parameters of the every m stages of gray-level pictures to adjust display of the screen to a maximum gray level, the correction is started from a gray level next to the maximum gray level, and only for correction of the first gray level, working parameters of the previous gray level are used as the initial values of working parameters of the current gray level correction; from correction of the second gray level, a correction estimated value of working parameters of a current gray level is estimated according to the working parameters and the local linearity relation of the two corrected gray levels, and the correction estimated value is taken as the initial working parameter of the current gray level correction.

Abstract: The present invention relates to a teeth washer structure, which includes: a guiding tube and an ejecting tube; the guiding tube includes a connection part, a tube body, an engage part and a first flow channel formed therein, a surface of the connection part is formed with a thread, and the portion of the first flow channel defined in the engage part is formed with a gradually-shrinking structure. One end of the ejecting tube is formed with a water inlet part connected to and communicated with the connection part in a watertight manner, another end thereof is disposed with an ejecting nozzle, the end of the ejecting tube where the ejecting nozzle is disposed is formed with a bendable structure, the interior of the ejecting tube is formed with a second flow channel mutually communicated with the first flow channel.

Abstract: A cell test method for a liquid crystal display panel includes the following steps. A waveform sequence to shorting bars is provided, wherein the waveform sequence includes that the first gate line sends a voltage of “turn on” signal and the second and third gate lines send a voltage of “turn off” signal at the first and second time periods; and the waveform sequence further comprises that the first and second data lines respectively send first and second voltages at the first and second time periods, the first threshold voltage is higher than the first voltage, the first voltage is higher than the common voltage, the common voltage is higher than the second voltage, and the second voltage is higher than the second threshold voltage, whereby pixels defined by the first gate line and the first and second data lines is turn on.

Abstract: A testing circuit of a dual gate cell panel and a color display method of the dual gate cell panel. There are many data lines and scan lines in the dual gate cell panel, and the data lines are divided into three groups, and the scan lines are divided into two groups. The data lines or scan lines of each group are connected respectively to metal wires with a test pad each. When an appropriate signal is inputted to each test pad, the dual gate cell panel shows red, green and blue colors individually, so that defects of the dual gate cell panel can be detected accurately to avoid any unnecessary waste on the defective dual gate cell panel incurred in the subsequent manufacturing processes.

Abstract: A cell test method for a liquid crystal display panel includes the following steps. A waveform sequence to shorting bars is provided, wherein the waveform sequence includes that the first gate line sends a voltage of “turn on” signal and the second and third gate lines send a voltage of “turn off” signal at the first and second time periods; and the waveform sequence further comprises that the first and second data lines respectively send first and second voltages at the first and second time periods, the first threshold voltage is higher than the first voltage, the first voltage is higher than the common voltage, the common voltage is higher than the second voltage, and the second voltage is higher than the second threshold voltage, whereby pixels defined by the first gate line and the first and second data lines is turn on.

Abstract: A testing circuit of a dual gate cell panel and a color display method of the dual gate cell panel. There are many data lines and scan lines in the dual gate cell panel, and the data lines are divided into three groups, and the scan lines are divided into two groups. The data lines or scan lines of each group are connected respectively to metal wires with a test pad each. When an appropriate signal is inputted to each test pad, the dual gate cell panel shows red, green and blue colors individually, so that defects of the dual gate cell panel can be detected accurately to avoid any unnecessary waste on the defective dual gate cell panel incurred in the subsequent manufacturing processes.

Abstract: A system for testing a die (or chip) of a semiconductor wafer is disclosed. It features measuring the temperature of the die according to a light beam originating from the die. The temperature so measured functions as part of test record and/or the basis for controlling the temperature of the die. Measuring the temperature of a die in such a way will replace measuring the temperature of a die conventionally via the wafer carrier on which the die being tested is placed. The system comprises: a die test device for testing the performance and/or quality of a die; and a temperature detector separated from the die and the wafer, for measuring the temperature of the die according to a light beam originating from the die. The temperature detector may be either connected to or embedded in the die test device, or be placed at another location. Another feature is the use of a light emitter which produces light beams directed to the die or the wafer for providing heat thereto.

Abstract: A low-density alloy for a golf club head includes 84 wt %-94 wt % of Ti, 6.5 wt %-9.5 wt % of Al, and/or V less than 1.5 wt %, providing a Ti—Al—V-based alloy having a density smaller than 4.40 g/cm3. Trace elements such as Mo, Cr, Fe, Si, and B may be added into the Ti—Al—V-based alloy to provide a titanium alloy having a low density and high elongation.

Abstract: A system for testing a die (or chip) of a semiconductor wafer is disclosed. It features measuring the temperature of the die according to a light beam radiated from the die. The temperature so measured functions as part of test record and/or the basis for controlling the temperature of the die. Measuring the temperature of a die in such a way will replace measuring the temperature of a die conventionally via the wafer carrier on which the die being tested is placed. The system comprises: a die test device for testing the performance and/or quality of a die; and a temperature detector separated from the die and the wafer, for measuring the temperature of the die according to a light beam radiated from the die. The temperature detector may be either connected to or embedded in the die test device, or be placed at another location. Another feature is the use of a light emitter which produces light beams directed to the die or the wafer for providing heat thereto.

Abstract: A popcorn apparatus comprised of a kettle having a contained space inside and a lipped rim along the circumference of the opening; a lid consisting of a first lid member and a second lid member, the first lid member having a latch fixture and a handle mount, with the latch fixture capable of engagement onto the lipped rim of the kettle; a stirring mechanism consisting of a crank rod disposed on the lid and a mixing rod extending into the contained space inside the kettle; a grip handle situated on the handle mount of the lid, the structure enabling the engagement of the latch fixture built into the lid onto the lipped rim of the kettle to secure the lid in position.

Abstract: A reelable keyboard, which includes a soft keyboard, a first shell body, and a second shell body. The soft keyboard is connected between the first shell body and the second shell body. The first shell body has a winding mechanism therein used to wind up the soft keyboard. A positioning button disposed on the first shell body is used to control whether the soft keyboard is pulled out from or is wound into the first shell body. When the keyboard is to be used, it is only necessary to pull out the soft keyboard from the first shell body. When not in use, the soft keyboard is wound in the first shell body. Thereby, the volume of the keyboard can be effectively shrunk to facilitate portability.