Patents by Inventor Tai Wai David CHIK

Tai Wai David CHIK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240048848
    Abstract: A movable camera travels along an inspection path for optically inspecting an inspection surface of an object for defect detection. In planning the inspection path, a set of viewpoints on the inspection surface is generated. Each viewpoint is associated with a patch, which is a largest area of the inspection surface within a field of view (FOV) of the camera when the camera is located over the viewpoint for capturing an image of FOV. An effective region of the patch is advantageously predicted by a neural network according to a three-dimensional geometric characterization of the patch such that the predicted effective region is valid for defect detection based on the captured image. A valid area is one whose corresponding area on the captured image is not blurred and is neither underexposed nor overexposed. The inspection path is determined according to respective effective regions associated with the set of viewpoints.
    Type: Application
    Filed: August 2, 2022
    Publication date: February 8, 2024
    Inventors: Tai Wai David CHIK, Chi Shing WONG