Patents by Inventor Taichi Banno

Taichi Banno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring ion activity
    Patent number: 4204917
    Abstract: In the disclosed method, ion activity is measured by placing a cup filled with a test solution to be measured on a cup receiver, lifting a cup lifting arm to engage the cup receiver with a rotary plate, rotating the rotary plate to stir the test solution in the cup, measuring a potential difference between a reference electrode and other electrodes after completion of the stirring of the solution, and indicating the ion activity as a function of the potential differences.
    Type: Grant
    Filed: December 18, 1978
    Date of Patent: May 27, 1980
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Tadao Yamamoto, Hiroshi Takekawa, Taichi Banno, Kiyozo Koshiishi
  • Apparatus for measuring ion activity
    Patent number: 4172777
    Abstract: In an apparatus for measuring ion activity, a reference electrode and an at least one test electrode project through an opening in a rotating plate while a cup receiver which holds a cup filled with the test solution is lifted from a disengaged position into a position where the cup receiver engages and is rotated by the rotating plate while the electrodes project into the solution. A measuring circuit connected to the electrodes measures the ion activity with the use of a reverse logarithmic amplifier.
    Type: Grant
    Filed: November 5, 1976
    Date of Patent: October 30, 1979
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Tadao Yamamoto, Hiroshi Takekawa, Taichi Banno, Kiyozo Koshiishi