Patents by Inventor Taiki Murata

Taiki Murata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical inspection tool and method
    Patent number: 10853959
    Abstract: A method of inspecting a device under test for defects includes detecting intensity and directional information of radiation rays emanating from a device under test by a light field camera, generating synthesized images of the device under test detected by the light field camera, and determining a depth of a defect in the device under test from the synthesized images.
    Type: Grant
    Filed: April 1, 2019
    Date of Patent: December 1, 2020
    Assignee: SANDISK TECHNOLOGIES LLC
    Inventors: Yasuhiro Yoshitake, Taiki Murata, Satoshi Shigematsu
  • OPTICAL INSPECTION TOOL AND METHOD
    Publication number: 20200311955
    Abstract: A method of inspecting a device under test for defects includes detecting intensity and directional information of radiation rays emanating from a device under test by a light field camera, generating synthesized images of the device under test detected by the light field camera, and determining a depth of a defect in the device under test from the synthesized images.
    Type: Application
    Filed: April 1, 2019
    Publication date: October 1, 2020
    Inventors: Yasuhiro Yoshitake, Taiki Murata, Satoshi Shigematsu