Patents by Inventor Tain-Hong Pan

Tain-Hong Pan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8452441
    Abstract: The invention discloses a process quality prediction system and a method thereof. When a processing apparatus performs a process on a target, the process is measured by a measurement apparatus to receive a process value. The process value and several previous quality data collected from the measurement apparatus are used to predict the quality of the product which is processing inline. The method is composed of a moving window, a stepwise regression scheme and an analysis of covariance (ANCOVA). The drift and shift of process are overcome by the moving window. A key variable set is selected by the stepwise regression scheme and a virtual model is identified by the analysis of covariance.
    Type: Grant
    Filed: August 10, 2010
    Date of Patent: May 28, 2013
    Assignee: National Tsing Hua University
    Inventors: Shi-Shang Jang, Tain-Hong Pan, Shan-Hill Wong
  • Patent number: 8429100
    Abstract: The invention discloses a method for building adaptive soft sensor. The method comprises the following steps. The input and schedule vectors are constructed, and a novel learning algorithm that uses online subtractive clustering is used to recursively update the structure and parameters of a local model network. Three rules are proposed for updating centers and local model coefficients of existing clusters, for generating new clusters and new models as well as for merging existing clusters and their corresponding models. Once verified, the online inferential model can be created to generate the predicted value of process. Thus, it does not need much memory space to process the method and can be easily applied to any other machine.
    Type: Grant
    Filed: November 17, 2010
    Date of Patent: April 23, 2013
    Assignee: National Tsing Hua University
    Inventors: Shi-Shang Jang, Tain-Hong Pan, Shan-Hill Wong
  • Publication number: 20120016643
    Abstract: The present invention discloses a virtual measuring system and a method thereof for predicting the quality of thin film transistor liquid crystal display processes. The virtual measuring method comprises the steps of: capturing a plurality of process parameter data from at least one process machine by an advanced process control unit; normalizing the process parameter data by an original data processing unit; picking a plurality of key process parameter data from the process parameter data by a key parameter choosing unit; establishing a virtual measuring model by a predicting unit according to the key process parameter data, and generating a virtual measuring data by the virtual measuring model. The virtual measuring model is established after a disturbing coefficient is generated through a time sequence regression algorithm by the predicting unit.
    Type: Application
    Filed: October 29, 2010
    Publication date: January 19, 2012
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventors: SHI-SHANG JANG, TAIN-HONG PAN, SHAN-HILL WONG
  • Publication number: 20110295777
    Abstract: The invention discloses a method for building adaptive soft sensor. The method comprises the following steps. The input and schedule vectors are constructed, and a novel learning algorithm that uses online subtractive clustering is used to recursively update the structure and parameters of a local model network. Three rules are proposed for updating centers and local model coefficients of existing clusters, for generating new clusters and new models as well as for merging existing clusters and their corresponding models. Once verified, the online inferential model can be created to generate the predicted value of process. Thus, it does not need much memory space to process the method and can be easily applied to any other machine.
    Type: Application
    Filed: November 17, 2010
    Publication date: December 1, 2011
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventors: SHI-SHANG JANG, TAIN-HONG PAN, SHAN-HILL WONG
  • Publication number: 20110282480
    Abstract: The invention discloses a process quality prediction system and a method thereof. When a processing apparatus performs a process on a target, the process is measured by a measurement apparatus to receive a process value. The process value and several previous quality data collected from the measurement apparatus are used to predict the quality of the product which is processing inline. The method is composed of a moving window, a stepwise regression scheme and an analysis of covariance (ANCOVA). The drift and shift of process are overcome by the moving window. A key variable set is selected by the stepwise regression scheme and a virtual model is identified by the analysis of covariance.
    Type: Application
    Filed: August 10, 2010
    Publication date: November 17, 2011
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventors: Shi-Shang Jang, Tain-Hong Pan, Shan-Hill Wong