Abstract: In a method for measuring thermo electricity and an apparatus thereof, enabling to measure the physical characteristics including electrification of a sample even in a humid (water-vapor) atmosphere, a sample 10 of powder to be measured and formed in a predetermined shape is disposed within an inside of an electric furnace 30, building up a heating and temperature increasing portion, which is stored within a constant-temperature container of three(3)-layers (51, 52, 53) structure (or may be two(2)-layers structure), forming a measuring chamber 50 in an inside thereof. While increasing the temperature, a measuring apparatus for detecting the thermal stimulated current (TSC) by means of a minute current detector connected to electrodes, which are provided opposing to the sample 10, and there is further provided a water-vapor generating apparatus 100 for guiding a water-vapor atmosphere at a predetermined value into the measuring chamber 50 of the constant-temperature container.

Abstract: In a method for measuring thermoelectricity and an apparatus thereof, enabling to measure the physical characteristics including electrification of a sample even in a humid (water-vapor) atmosphere, a sample 10 of powder to be measured and formed in a predetermined shape is disposed within an inside of an electric furnace 30, building up a heating and temperature increasing portion, which is stored within a constant-temperature container of three(3)-layers (51, 52, 53) structure (or may be two(2)-layers structure), forming a measuring chamber 50 in an inside thereof. While increasing the temperature, a measuring apparatus for detecting the thermal stimulated current (TSC) by means of a minute current detector connected to electrodes, which are provided opposing to the sample 10, and there is further provided a water-vapor generating apparatus 100 for guiding a water-vapor atmosphere at a predetermined value into the measuring chamber 50 of the constant-temperature container.

Abstract: In a sample assembly for a thermoelectric analyzer, typically TSC (Thermally Stimulated Current) analyzer, a sample is fixed to an electrically-insulating substrate via an adhesive layer. The material of the adhesive layer is indium or gold-tin alloy. The substrate has a pair of junction electrode layers formed thereon and a pair of electrode layers formed on the same plane of the sample. One of the electrode layers is connected with one of the junction electrode layers by electrically-conductive wire, while the other of the electrode layers is connected with the other of the junction electrode layers by another electrically-conductive wire. The substrate is made of preferably made of a highly electrically-insulating and highly thermally-conductive material which may be, for example, aluminum nitride (AlN), boron nitride (BN), beryllium oxide (BeO) or aluminum oxide (Al2O3). The sample may preferably be a compound semiconductor such as GaAs.

Abstract: A method of measuring a surface leakage current includes applying a voltage between a pair of electrodes, which are apart from each other on a sample surface, during a predetermined period of time. A region of the sample surface between the pair of electrodes is irradiated by energy rays during an irradiation period of time which is within the voltage application time. The energy rays may be lasers, ultraviolet rays, X-rays or an electron beam. A current flowing between the pair of electrodes is measured during the voltage application time. The energy rays irradiation causes a surface leakage current, which is caused by adhered substances, to start to flow, and when the adhered substances have been eliminated perfectly, a relatively large current caused by the adhered substances disappears. Perfect elimination of the adhered substances can be verified by confirming that the relatively large current has disappeared.

Abstract: A method of measuring a surface leakage current includes applying a voltage between a pair of electrodes, which are apart from each other on a sample surface, during a predetermined period of time. A region of the sample surface between the pair of electrodes is irradiated by energy rays during an irradiation period of time which is within the voltage application time. The energy rays may be lasers, ultraviolet rays, X-rays or an electron beam. A current flowing between the pair of electrodes is measured during the voltage application time. The energy rays irradiation causes a surface leakage current, which is caused by adhered substances, to start to flow, and when the adhered substances have been eliminated perfectly, a relatively large current caused by the adhered substances disappears. Perfect elimination of the adhered substances can be verified by confirming that the relatively large current has disappeared.

Abstract: In a sample assembly for a thermoelectric analyzer, typically TSC (Thermally Stimulated Current) analyzer, a sample is fixed to an electrically-insulating substrate via an adhesive layer. The material of the adhesive layer is indium or gold-tin alloy. The indium has high thermal conductivity, resulting in good heat conduction between the sample and the substrate and therefore good temperature uniformity in the sample. Besides, the indium is soft metal, so that even when a stress occurs between the sample and the substrate because of the different rates of thermal expansion the indium can absorb the stress. The indium may be replaced by gold-tin alloy. The substrate has a pair of junction electrode layers formed thereon. The sample has a pair of electrode layers formed on the same plane of the sample.