Patents by Inventor Taisia Tsukruk Lou
Taisia Tsukruk Lou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10937006Abstract: A method, system and computer program product are provided in order to evaluate corrosion loss and to establish maintenance actions based thereupon. In the context of a method, a structure is inspected to generate corrosion information and a corrosion model of the structure is generated based upon the corrosion information. The method also includes generating a combined corrosion model based upon the corrosion model and a baseline model of the structure including material types and thicknesses at respective locations on the structure. The method further includes establishing maintenance actions including modification of an inspection interval based upon the combined corrosion model. Corresponding systems and computer program products are also provided.Type: GrantFiled: June 9, 2017Date of Patent: March 2, 2021Assignee: The Boeing CompanyInventors: Roger W. Engelbart, Taisia Tsukruk Lou
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Patent number: 10773458Abstract: Apparatuses and systems comprising an additive manufacturing device and an associated terahertz inspection device for inspecting additively deposited layers in real time during or immediately following material deposition and parts made and inspected by the apparatuses and systems and their associated methods are disclosed herein.Type: GrantFiled: February 2, 2018Date of Patent: September 15, 2020Assignee: The Boeing CompanyInventors: Taisia Tsukruk Lou, Donald Duane Palmer, Jr., Nathan Rylan Smith, Shayne Andrew Dorrell
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Patent number: 10613041Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.Type: GrantFiled: September 4, 2019Date of Patent: April 7, 2020Assignee: The Boeing CompanyInventors: Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel, Morteza Safai, Yuan-Jye Wu, Taisia Tsukruk Lou, Rodney S. Wright
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Publication number: 20200003707Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.Type: ApplicationFiled: September 4, 2019Publication date: January 2, 2020Inventors: Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel, Morteza Safai, Yuan-Jye Wu, Taisia Tsukruk Lou, Rodney S. Wright
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Patent number: 10436724Abstract: A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.Type: GrantFiled: June 16, 2016Date of Patent: October 8, 2019Assignee: The Boeing CompanyInventors: Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel, Morteza Safai, Yuan-Jye Wu, Taisia Tsukruk Lou, Rodney S. Wright
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Publication number: 20190240908Abstract: Apparatuses and systems comprising an additive manufacturing device and an associated terahertz inspection device for inspecting additively deposited layers in real time during or immediately following material deposition and parts made and inspected by the apparatuses and systems and their associated methods are disclosed herein.Type: ApplicationFiled: February 2, 2018Publication date: August 8, 2019Inventors: Taisia Tsukruk Lou, Donald Duane Palmer, JR., Nathan Rylan Smith, Shayne Andrew Dorrell
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Publication number: 20180357613Abstract: A method, system and computer program product are provided in order to evaluate corrosion loss and to establish maintenance actions based thereupon. In the context of a method, a structure is inspected to generate corrosion information and a corrosion model of the structure is generated based upon the corrosion information. The method also includes generating a combined corrosion model based upon the corrosion model and a baseline model of the structure including material types and thicknesses at respective locations on the structure. The method further includes establishing maintenance actions including modification of an inspection interval based upon the combined corrosion model. Corresponding systems and computer program products are also provided.Type: ApplicationFiled: June 9, 2017Publication date: December 13, 2018Inventors: Roger W. Engelbart, Taisia Tsukruk Lou
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Publication number: 20170227478Abstract: A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.Type: ApplicationFiled: June 16, 2016Publication date: August 10, 2017Inventors: Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel, Morteza Safai, Yuan-Jye Wu, Taisia Tsukruk Lou, Rodney S. Wright
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Patent number: 9689813Abstract: A method and apparatus are presented. X-rays are directed at a workpiece. The workpiece includes a fastener installed in an opening. Backscatter is received from the workpiece. It is determined if the fastener installed in the opening has an out of tolerance gap using the backscatter. An output is generated if the fastener installed in the opening has the out of tolerance gap.Type: GrantFiled: February 27, 2015Date of Patent: June 27, 2017Assignee: THE BOEING COMPANYInventors: Taisia Tsukruk Lou, William Talion Edwards, Gregory Paul Saguto
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Patent number: 9506879Abstract: A method and system are provided for non-destructively evaluating a workpiece hidden by an overlying structure. In the context of a method, a workpiece is interrogated with radiation, such as x-ray radiation, that also propagates through the overlying structure. The method further includes collecting data representative of radiation backscattered from the workpiece. Based upon a thickness and material of the overlying structure, the method compares the data that has been collected from the workpiece with reference data representative of radiation backscattered from a standard that includes different respective material loss indicators hidden by an overlying structure of the same thickness and material. Each material loss indicator is a physical representation of a different amount of material loss. As a result of the comparison, the method estimates the material loss of the workpiece.Type: GrantFiled: October 2, 2014Date of Patent: November 29, 2016Assignee: The Boeing CompanyInventors: Roger W. Engelbart, Taisia Tsukruk Lou
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Publication number: 20160252468Abstract: A method and apparatus are presented. X-rays are directed at a workpiece. The workpiece includes a fastener installed in an opening. Backscatter is received from the workpiece. It is determined if the fastener installed in the opening has an out of tolerance gap using the backscatter. An output is generated if the fastener installed in the opening has the out of tolerance gap.Type: ApplicationFiled: February 27, 2015Publication date: September 1, 2016Inventors: Taisia Tsukruk Lou, William Talion Edwards, Gergory Paul Saguto
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Patent number: 9398676Abstract: A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.Type: GrantFiled: May 5, 2014Date of Patent: July 19, 2016Assignee: THE BOEING COMPANYInventors: Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel, Morteza Safai, Yuan-Jye Wu, Taisia Tsukruk Lou, Rodney S. Wright
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Publication number: 20150319832Abstract: A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.Type: ApplicationFiled: May 5, 2014Publication date: November 5, 2015Applicant: The Boeing CompanyInventors: Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel, Morteza Safai, Yuan-Jye Wu, Taisia Tsukruk Lou, Rodney S. Wright
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Publication number: 20150055757Abstract: A method and system are provided for non-destructively evaluating a workpiece hidden by an overlying structure. In the context of a method, a workpiece is interrogated with radiation, such as x-ray radiation, that also propagates through the overlying structure. The method further includes collecting data representative of radiation backscattered from the workpiece. Based upon a thickness and material of the overlying structure, the method compares the data that has been collected from the workpiece with reference data representative of radiation backscattered from a standard that includes different respective material loss indicators hidden by an overlying structure of the same thickness and material. Each material loss indicator is a physical representation of a different amount of material loss. As a result of the comparison, the method estimates the material loss of the workpiece.Type: ApplicationFiled: October 2, 2014Publication date: February 26, 2015Inventors: Roger W. Engelbart, Taisia Tsukruk Lou