Patents by Inventor Taizo Okazaki

Taizo Okazaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6168712
    Abstract: An apparatus for the biological treatment of waste fluid from the coating process is presented in the present invention. Said apparatus comprises a biological treatment vessel filled with carriers immobilizing microorganism useful for the treatment of waste fluid from the coating process, a tank in which said biological treatment vessel is set, a heating means to heat said waste fluid in said tank, a stirrer to stir said waste fluid, an aeration means to blow air into said waste fluid, a filter for filtration of said waste fluid having been treated, and a return pass to return filtrate of said waste fluid to said tank.
    Type: Grant
    Filed: April 29, 1999
    Date of Patent: January 2, 2001
    Assignees: Kenko Sangyo Co., Ltd., Issei Co., Ltd.
    Inventors: Kimito Kubo, Masaaki Hamada, Taizo Okazaki
  • Patent number: 5501911
    Abstract: A copper film coated substrate includes a substrate and a copper film formed on a surface of the substrate. The copper film has an X-ray diffraction intensity of 2.0 cps/nm or more per unit film thickness at a crystal orientation (111) face of the copper film. A crystal orientation of a copper thin film is controlled by irradiating a surface of a substrate with inert gas ions before forming a copper thin film on the substrate by a physical vapor deposition process. A copper thin film is formed by irradiating a surface of a substrate with ions, and depositing a copper thin film on the irradiated substrate. In the ion irradiating step, an ion irradiation energy for a dosage of the irradiated ions is controlled, so that crystal is greatly grown to be orientated in a direction of copper (111) face with a less dosage of the irradiated ions.
    Type: Grant
    Filed: May 25, 1993
    Date of Patent: March 26, 1996
    Assignee: Nissin Electric Co., Ltd.
    Inventors: Akinori Ebe, Kiyoshi Ogata, Satoshi Nishiyama, Naoto Kuratani, Taizo Okazaki
  • Patent number: 5316802
    Abstract: A copper film coated substrate includes a substrate and a copper film formed on a surface of the substrate. The copper film has an X-ray diffraction intensity of 2.0 cps per unit film thickness at a crystal orientation (111) face of the copper film. A crystal orientation of a copper thin film is controlled by irradiating a surface of a substrate with inert gas ions before forming a copper thin film on the substrate by a physical vapor deposition process. A copper thin film is formed by irradiating a surface of a substrate with ions, and depositing a copper thin film on the irradiated substrate. In the ion irradiating step, an ion irradiation energy for a dosage of the irradiated ions is controlled, so that crystal is greatly grown to be orientated in a direction of copper (111) face with a less dosage of the irradiated ions.
    Type: Grant
    Filed: June 4, 1992
    Date of Patent: May 31, 1994
    Assignee: Nissin Electric Co., Ltd.
    Inventors: Akinori Ebe, Kiyoshi Ogata, Satoshi Nishiyama, Naoto Kuratani, Taizo Okazaki