Abstract: A semiconductor device testing fixture is provided in which the performance tests of a semiconductor device can be executed without increasing the time for testing and the equipment investment for a semiconductor tester with an increase in the practical operating frequency of a tested semiconductor device. A semiconductor device testing fixture (1A) has input terminals (2, 3, 4) and an output terminal (15) for receiving and sending a signal together with a semiconductor tester (18). These terminals are connected to the predetermined terminals of the semiconductor tester (8). A memory (7) which can perform first in first out operation is mounted as signal holding means on the semiconductor device testing fixture (1A).