Abstract: The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.

Abstract: The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.

Abstract: The present disclosure provides a laser processing apparatus. A laser processing apparatus includes a laser generator, a laser amplifier, a chromatic dispersion tuner and an optical focusing unit. The laser generator is configured to generate ultrashort pulse laser having chirp characteristics by simultaneously generating a plurality of wavelengths. The laser amplifier is configured to amplify the laser generated by the laser generator. The chromatic dispersion tuner is configured to adjust chirp and pulse width of the laser output from the laser amplifier. The optical focusing unit is configured to irradiate a workpiece with the laser after adjusting the depth of focus of the laser with the chirp and the pulse width adjusted by the chromatic dispersion tuner.

Abstract: An inspection method for a circuit substrate is disclosed, which inspects electrical properties of a circuit substrate having a multilayered structure, by controlling inspection environments so that dew forms on a surface of the circuit substrate and detecting change of states of the dew to thereby determining variation of a thermal capacity of a conductor with respect to defective contacts or vias, micro vias and a circuit pattern of an inner layer. According to this, the inspection can be performed with respect to a wide area simultaneously and therefore the inspection productivity can be improved. In addition, since the temperature of the conductive wire can be measured directly through change of the dew, the cost for the temperature measurement can be saved. Moreover, the cost for an area sensor to sense the temperature of a wide area may be reduced while improving the inspection speed.

Abstract: Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.

Abstract: An inspection method for a circuit substrate is disclosed, which inspects electrical properties of a circuit substrate having a multilayered structure, by controlling inspection environments so that dew forms on a surface of the circuit substrate and detecting change of states of the dew to thereby determining variation of a thermal capacity of a conductor with respect to defective contacts or vias, micro vias and a circuit pattern of an inner layer. According to this, the inspection can be performed with respect to a wide area simultaneously and therefore the inspection productivity can be improved. In addition, since the temperature of the conductive wire can be measured directly through change of the dew, the cost for the temperature measurement can be saved. Moreover, the cost for an area sensor to sense the temperature of a wide area may be reduced while improving the inspection speed.

Abstract: Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

Abstract: The present invention discloses an authentication method using a cellular phone in internet. According to the present invention, when connecting to internet or performing electronic commerce, the authentication is performed through the cellular phone in parallel with a personal information stored when user's joining the cellular phone service, a number particular to the cellular phone, a secret number in an authentication required for the connection or the settlement of accounts. Specifically, in authentication process for making up accounts, besides the line connected to internet, a separate cellular phone line is used and if the authentication data of the internet site server is identical to that of the cellular phone service company, the authentication process is completed, thereby eliminating the danger of hacking basically.

Abstract: Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.

Abstract: Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

Abstract: A non-contact type single side probe structure, in which a plurality of insulating films and conductive films are repeatedly stacked, includes probe electrodes formed at an inner conductive film portion of the cross-section of the structure and a guard portion formed at an outer conductive film portion surrounding the probe electrodes. Accordingly, it is possible to form the probe electrodes to have the thickness of the conductive films corresponding to a pitch of a pattern electrode, thereby detecting open and short circuit in a miniaturized pattern electrode. The cross-section used as a probe is spaced at a specified distance or further from contact holes, thereby having a high resistance to noises.

Abstract: A steerable inline skate which allows user to change direction more easily and reduce the abrasion of wheels to thus lengthen the life of the wheels by allowing front and rear wheels 30 and 50 among a plurality of wheels arranged in a line to be steered within a predetermined angle utilizing the structure of a trapezoidal linkage.

Abstract: An inspection apparatus and method of electrode patterns using rolling wire probes, which includes a rolling wire rotating for performing a rolling contact sliplessly across the electrode patterns, and a control unit for controlling operations of the inspection apparatus wholly and for discriminating the electrical characteristics according to the electrical signal sensed through the rolling wire provided to the rolling wire probe. The inspection method is used flexibly with electrode patterns having various forms regardless of the change of model or design of the product, unlike the inspection method of the conventional art by the test pin block. Upon inspecting a pixel portion of the electrode pattern, a scratch is not generated by the rolling contact operation, thereby increasing yield of the finished goods.

Abstract: The present invention relates to a steerable inline skate which allows user to change direction more easily and reduce the abrasion of wheels to thus lengthen the life of the wheels by allowing front and rear wheels 30 and 50 among a plurality of wheels arranged in a line to be steered within a predetermined angle utilizing the structure of a trapezoidal linkage.

Abstract: The present invention discloses an inspection apparatus and method of electrode patterns using roiling wire probes. It includes rolling wire probes, at least one more, having a rolling wire rotating to be performed a rolling contact shplessly across the electrode patterns; a control unit for controlling operations of the inspection apparatus wholly and discriminating the electrical characteristics according to the electrical signal sensed through the rolling wire provided to the rolling wire probe. According to the present invention, there is an advantage that the inspection method can be used flexibly up to electrode patterns having various forms regardless of the change of model or design of the product, unlike the inspection method of the conventional art by the test pin block. In the present invention, an advantage, which when inspecting a scratch also does not generated in the pixel portion, thereby increasing yield of the finished goods.

Abstract: The present invention discloses an authentication method using a cellular phone in internet. According to the present invention, when connecting to internet or performing electronic commerce, the authentication is performed through the cellular phone in parallel with a personal information stored when user's joining the cellular phone service, a number particular to the cellular phone, a secret number in an authentication required for the connection or the settlement of accounts. Specifically, in authentication process for making up accounts, besides the line connected to internet, a separate cellular phone line is used and if the authentication data of the internet site server is identical to that of the cellular phone service company, the authentication process is completed, thereby eliminating the danger of hacking basically.