Abstract: A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement.

Abstract: A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement.

Abstract: A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.

Abstract: A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.

Abstract: A surface texture measuring apparatus that ensures detection of surface texture of a workpiece even when the surface has a steep unevenness. A detecting device having a stylus is moved in the X axis direction along the surface of the workpiece, and displacement in the Z axis direction is converted into electric signals to detect unevenness of the surface of the workpiece. When the surface has a steep unevenness and the amount of displacement in the Z axis direction reaches or exceeds a threshold, a Z axis detected value and an X axis detected value obtained at that moment are output. The moving speed of the detecting device is decreased when the surface has a steep unevenness, while the moving speed is increased when the surface does not have a steep unevenness, making it possible to improve following characteristics and to reduce measurement time.