Abstract: The present invention relates to a display device that measures display characteristics (such as luminance or chromaticity) associated with a display panel. The display device of the present invention has a light sensor (5) provided at a position allowing outgoing light from a screen (1a) of a liquid crystal panel (1), which serves as the display panel, and extraneous light reflected on the screen (1a) to enter the light sensor (5). Since the light sensor (5) is provided at the position, it is possible to measure the characteristics of the display panel and also the characteristics of the extraneous ambient light reflected on the screen. Thus, it is possible to accurately adjust the display characteristics based on the measurement results.

Abstract: The present invention relates to a display device that measures display characteristics (such as luminance or chromaticity) associated with a display panel. The display device of the present invention has a light sensor (5) provided at a position allowing outgoing light from a screen (1a) of a liquid crystal panel (1), which serves as the display panel, and extraneous light reflected on the screen (1a) to enter the light sensor (5). Since the light sensor (5) is provided at the position, it is possible to measure the characteristics of the display panel and also the characteristics of the extraneous ambient light reflected on the screen. Thus, it is possible to accurately adjust the display characteristics based on the measurement results.

Abstract: Provided are a display device, a computer program, a storage medium, and an image displaying method, which are capable of adjusting a light intensity of a display panel without using a photometric image. An optical sensor 5 measures the light intensity (tristimulus value) from a partial display area of a display panel (1) (measurement area of the display panel measured by the optical sensor (5)), and the partial display area has multiple pixels. A computation unit (20) computes the luminous intensity (tristimulus value) emanating from the measurement area based on a video level (image data) of each pixel for displaying an image in the measurement area. A comparison unit (19) compares the computed light intensity with the measured light intensity. A control unit (10) adjusts the light intensity (luminance, chromaticity, or the like) of the display panel (1) based on a comparison result by the comparison unit (19).

Abstract: The present invention relates to a display device that measures display characteristics (such as luminance or chromaticity) associated with a display panel. The display device of the present invention has a light sensor (5) provided at a position allowing outgoing light from a screen (1a) of a liquid crystal panel (1), which serves as the display panel, and extraneous light reflected on the screen (1a) to enter the light sensor (5). Since the light sensor (5) is provided at the position, it is possible to measure the characteristics of the display panel and also the characteristics of the extraneous ambient light reflected on the screen. Thus, it is possible to accurately adjust the display characteristics based on the measurement results.

Abstract: A method for fabricating a semiconductor device comprises the steps of: forming interconnection grooves 38 in an inter-layer insulation film 34; forming an interconnection layer 44 of Cu as the main material in the interconnection grooves 38; and concurrently injecting nitrogen gas and water to the surface of the interconnection layer 44 buried in the interconnection groove 38.

Abstract: A method for fabricating a semiconductor device comprises the steps of: forming interconnection grooves 38 in an inter-layer insulation film 34; forming an interconnection layer 44 of Cu as the main material in the interconnection grooves 38; and concurrently injecting nitrogen gas and water to the surface of the interconnection layer 44 buried in the interconnection groove 38.

Abstract: An interlayer insulation film is formed on a semiconductor substrate. A wiring is formed on a part of the surface area of the interlayer insulation film. This wiring has a laminated structure including two or more layers. That is, the wiring includes an underlayer or a first conductive layer which is made of Ta in an a phase, and an overlayer or a second conductive layer which is made of an Al alloy.