Patents by Inventor Takahiro Nishino

Takahiro Nishino has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240073560
    Abstract: To control an excess bias to an appropriate value in a light detection device. A solid-state image sensor includes a photodiode, a resistor, and a control circuit. In this solid-state image sensor, the photodiode photoelectrically converts incident light and outputs a photocurrent. Furthermore, in the solid-state image sensor, the resistor is connected to a cathode of the photodiode. Furthermore, in the solid-state image sensor, the control circuit supplies a lower potential to an anode of the photodiode as a potential of the cathode of when the photocurrent flows through the resistor is higher.
    Type: Application
    Filed: October 12, 2023
    Publication date: February 29, 2024
    Inventors: Tatsuki Nishino, Hiroki Hiyama, Shizunori Matsumoto, Takahiro Miura, Akihiko Miyanohara, Tomohiro Matsumoto
  • Patent number: 11403747
    Abstract: A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: August 2, 2022
    Assignee: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Patent number: 11391662
    Abstract: Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: July 19, 2022
    Assignee: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Publication number: 20210102885
    Abstract: Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.
    Type: Application
    Filed: March 30, 2018
    Publication date: April 8, 2021
    Applicant: JFE Steel Corporation
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Publication number: 20190370953
    Abstract: A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.
    Type: Application
    Filed: November 29, 2017
    Publication date: December 5, 2019
    Inventors: Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Kazuro Tsuda, Toshiki Tsuboi
  • Patent number: 6741305
    Abstract: A color display device includes: a first substrate and a second substrate opposing each other via a display medium layer interposed therebetween; a plurality of pixel electrodes arranged in a matrix pattern on one side of the first substrate; a common electrode formed on one side of the second substrate so as to oppose the plurality of pixel electrodes; and a plurality of color filter layers each having a different color formed between the second substrate and the common electrode. The common electrode and the color filter layers of different colors have a display area superposed on the plurality of pixel electrodes and a frame area outside a periphery of the display area. At least one of the plurality of color filter layers of different colors is continuous across a boundary between the display area and the frame area and is flat.
    Type: Grant
    Filed: February 24, 2003
    Date of Patent: May 25, 2004
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Hidetoshi Nakagawa, Takahiro Nishino
  • Publication number: 20030160916
    Abstract: A color display device includes: a first substrate and a second substrate opposing each other via a display medium layer interposed therebetween; a plurality of pixel electrodes arranged in a matrix pattern on one side of the first substrate; a common electrode formed on one side of the second substrate so as to oppose the plurality of pixel electrodes; and a plurality of color filter layers each having a different color formed between the second substrate and the common electrode. The common electrode and the color filter layers of different colors have a display area superposed on the plurality of pixel electrodes and a frame area outside a periphery of the display area. At least one of the plurality of color filter layers of different colors is continuous across a boundary between the display area and the frame area and is flat.
    Type: Application
    Filed: February 24, 2003
    Publication date: August 28, 2003
    Inventors: Hidetoshi Nakagawa, Takahiro Nishino