Abstract: An oxide film (4) is provided on an upper surface of the semiconductor substrate (1). A guard ring (3) is provided on the upper surface of the semiconductor substrate (1). An organic insulating film (6) directly contacts the oxide film (4) in a termination region (7) between the guard ring (3) and an outer edge portion of the semiconductor substrate (1). A groove (8) is provided on the upper surface of the semiconductor substrate (1) in the termination region (7). The groove (8) is embedded with the organic insulating film (6).

Abstract: An electric-wire protection device that protects an electric wire by cutting off power to the wire when its temperature is elevated above a predetermined value is presented.

Abstract: An electric-wire protection device that protects an electric wire by cutting off power to the wire when its temperature is elevated above a predetermined value is presented.

Abstract: A mask inspection system comprises a mask inspection device for detecting defects on a mask according to a plurality of defect detection algorithms for each of which a threshold value is set; and a review device for utilizing an inspection result of the mask inspection device to review defects included in the inspection result while altering the threshold values. The review device includes an inspection result editor for editing a review result that is obtained when one of the threshold values is altered to an optimal value which achieves a desired defect detection level and thus producing an edited inspection result; and an inspection result output unit for outputting the edited inspection result to the mask inspection device. The mask inspection device includes an inspection result management unit for storing the edited inspection result output from the inspection result output unit on a storage unit.