Abstract: By a production method for producing a multilayer ceramic electronic device including dielectric layers and internal electrode layers comprising the steps of forming a green sheet to be said dielectric layer after firing, forming a pre-fired electrode layer to be said internal electrode layer after firing in a predetermined pattern on said green sheet by using a conductive material paste, forming a green chip by successively stacking said green sheets and said pre-fired electrode layers, and firing said green chip: wherein the conductive material paste for forming said pre-fired electrode layer is composed at least of conductive material particles, a first common material composed of ceramic powder and a second common material composed of ceramic powder having a larger average particle diameter than that of said first common material; an average particle diameter of said first common material is 1/20 to ½ of an average particle diameter of said conductive material particles; and the average particle diameter

Abstract: A method of production of a multilayer ceramic electronic device having internal electrode layers and dielectric layers having thicknesses of less than 2 ?m, having a step of firing a stack formed using a dielectric layer paste including a dielectric paste dielectric material and an internal electrode layer paste including a sintering inhibiting dielectric material, the dielectric paste dielectric material including a main ingredient material and sub ingredient material, the sintering inhibiting dielectric material in the internal electrode paste including at least a sintering inhibiting main ingredient material, the sintering inhibiting main ingredient material being substantially the same in composition as the main ingredient material included in the dielectric paste dielectric material and having a lattice constant over 3.991 ? and less than 4.064 ?.

Abstract: A multilayer ceramic capacitor having an internal electrode layer and a dielectric layer having a thickness of less than 2 ?m is provided, wherein the dielectric layer contains a plurality of dielectric particles, and when it is assumed that standard deviation of a particle distribution of the entire dielectric particles in the dielectric layer is ? (no unit), an average particle diameter of the entire dielectric particles in the dielectric layer is D50 (unit: ?m), and a rate that dielectric particles (coarse particles) having an average particle diameter of 2.25 times of the D50 exist in the entire dielectric particles is p (unit: %), the ? and p satisfy ?<0.130 and p<12%; by which a TC bias characteristic can be expected to be improved while maintaining various electric characteristics, particularly a sufficient permittivity, even when the interlayer dielectric layer is made thin.

Abstract: A multilayer ceramic capacitor including an internal electrode layer, an internal dielectric layer having a thickness of less than 2 ?m, and an external dielectric layer is provided, wherein the internal dielectric layer and external dielectric layer contain a plurality of dielectric particles, and when assuming that an average particle diameter of the entire dielectric particles in the internal dielectric layer is D50a (unit: ?m), an average particle diameter of the entire dielectric particles existing at a position being away at least by 5 ?m from the outermost internal electrode layer in the thickness direction is D50b (unit: ?m), a ratio (D50a/D50b) of the D50a and D50b is y (no unit), standard deviation of a particle size distribution of the entire dielectric particles in the internal dielectric layer is ? (no unit), and a ratio that dielectric particles (coarse particles) having an average particle diameter of 2.

Abstract: A multilayer ceramic capacitor comprising an internal electrode layer and a dielectric layer having a thickness of less than 2 ?m is provided, wherein the dielectric layer contains a plurality of dielectric particles, and when it is assumed that standard deviation of a particle distribution of the entire dielectric particles in the dielectric layer is ? (no unit), an average particle diameter of the entire dielectric particles in the dielectric layer is D50 (unit: ?m), and a rate that dielectric particles (coarse particles) having an average particle diameter of 2.25 times of the D50 exist in the entire dielectric particles is p (unit: %), the ? and p satisfy ?<0.130 and p<12%; by which a TC bias characteristic can be expected to be improved while maintaining various electric characteristics, particularly a sufficient permittivity, even when the interlayer dielectric layer is made thin.

Abstract: A multilayer ceramic capacitor comprising an internal electrode layer, an internal dielectric layer having a thickness of less than 2 ?m, and an external dielectric layer is provided, wherein the internal dielectric layer and external dielectric layer contain a plurality of dielectric particles, and when assuming that an average particle diameter of the entire dielectric particles in the internal dielectric layer is D50a (unit: ?m), an average particle diameter of the entire dielectric particles existing at a position being away at least by 5 ?m from the outermost internal electrode layer in the thickness direction is D50b (unit: ?m), a ratio (D50a/D50b) of the D50a and D50b is y (no unit), standard deviation of a particle size distribution of the entire dielectric particles in the internal dielectric layer is ? (no unit), and a ratio that dielectric particles (coarse particles) having an average particle diameter of 2.

Abstract: A multilayer ceramic capacitor 1 having internal electrode layers 3, internal dielectric layers 2 having the thickness of less than 2 ?m, and external dielectric layers 20 wherein; the internal dielectric layers 2 and the external dielectric layers 20 include a plural number of dielectric particles 2a, 20a, and when y1 is ratio(D50a/D50b) of D50a and D50b where D50a is an average particle size of dielectric particles 2a included in the internal dielectric layers 2 and D50b is an average particle size of dielectric particles 20a included in the external dielectric layer 20 and located at least 5 ?m away from an internal electrode layer 3a, arranged outermost part of all the internal electrode layers, to the stacked direction, and x is thickness of the internal dielectric layer 2, y1 and x satisfy the following equations, y1??0.75x+2.275 and y1??0.75x+1.675.