Patents by Inventor Takami Nagata

Takami Nagata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7646052
    Abstract: A semiconductor device in which a DRAM and a SRAM are mixedly mounted is provided. The DRAM and the SRAM have a stack-type structure in which a bitline is formed below a capacitive element. A cross couple connection of the SRAM is formed in a layer or below the layer in which a capacitive lower electrode of the DRAM is formed and in a layer or above the layer in which the bitline is formed. For example, the cross couple connection of the SRAM is formed in a same layer as a capacitive contact.
    Type: Grant
    Filed: October 4, 2007
    Date of Patent: January 12, 2010
    Assignee: NEC Electronics Corporation
    Inventors: Takami Nagata, Masaru Ushiroda
  • Publication number: 20080099812
    Abstract: A semiconductor device in which a DRAM and a SRAM are mixedly mounted is provided. The DRAM and the SRAM have a stack-type structure in which a bitline is formed below a capacitive element. A cross couple connection of the SRAM is formed in a layer or below the layer in which a capacitive lower electrode of the DRAM is formed and in a layer or above the layer in which the bitline is formed. For example, the cross couple connection of the SRAM is formed in a same layer as a capacitive contact.
    Type: Application
    Filed: October 4, 2007
    Publication date: May 1, 2008
    Applicant: NEC ELECTRONICS CORPORATION
    Inventors: Takami NAGATA, Masaru USHIRODA
  • Publication number: 20070048921
    Abstract: A method of manufacturing a semiconductor device includes performing a first etching process on a gate electrode layer to form a gate electrode of a first transistor group including a transistor pair, and performing a second etching process different from the first etching on the gate electrode layer to form a gate electrode of a second transistor group. Forming in this way enables characteristics of the transistor pair to be the same.
    Type: Application
    Filed: August 14, 2006
    Publication date: March 1, 2007
    Inventors: Takami Nagata, Hiroshi Furuta
  • Patent number: 6359297
    Abstract: A semiconductor device includes an interlayer formed to cover a semiconductor substrate, a circuit element, a preventing diffusion region, a power supply line and a ground line. The power supply line is formed on the interlayer to supply a positive voltage to the circuit element. The ground line is formed on the interlayer on an opposite side to the circuit element with respective to the power supply line. The circuit element is formed in a surface portion of a semiconductor substrate. The preventing diffusion region is formed in a surface portion of the semiconductor substrate in correspondence to the power supply line, and is applied with a predetermined positive voltage.
    Type: Grant
    Filed: November 23, 1999
    Date of Patent: March 19, 2002
    Assignee: NEC Corporation
    Inventors: Takami Nagata, Satoshi Yamaguchi