Abstract: A shape measurement apparatus includes: a linear light source that includes a superluminescent diode and applies linear light spreading in a width direction of the strip-shaped body to a surface of the strip-shaped body; a screen on which reflected light of the linear light off the surface of the strip-shaped body is projected; an area camera that captures an image of the reflected light of the linear light projected on the screen; and an arithmetic processing apparatus that calculates the surface shape of the strip-shaped body using the captured image of the reflected light of the linear light captured by the area camera.

Abstract: An inspection object imaging apparatus includes: a light source configured to produce a light beam belonging to an infrared wavelength band and having a predetermined spread half-angle on a surface of an inspection object; a projection optical system to project the light beam on the surface of the inspection object at a predetermined projection angle; and an imaging unit. The imaging unit includes an imaging optical system configured to condense reflected light and branch the reflected light to two different directions, and a first image sensor and a second image sensor, the first image sensor positioned on the inspection object side with respect to a position of the imaging optical system that is conjugate with the surface of the inspection object, along an optical axis of the reflected light, and the second image sensor positioned on the reflected-light travel direction side with respect to the conjugate position.

Abstract: [Object] To find, with high sensitivity, an unevenness defect or the like that has occurred on the surface of an inspection object having a surface roughness comparable to wavelengths of visible light and is comparable to several times the surface roughness, and accurately distinguish between dirt and an unevenness flaw present on the surface of the inspection object, and also enable a reduction in the size of an apparatus. [Solution] An inspection object imaging apparatus according to the present invention includes: a light source configured to produce a light beam belonging to an infrared wavelength band and having a predetermined spread half-angle on a surface of an inspection object; a projection optical system configured to project the light beam on the surface of the inspection object at a predetermined projection angle; and an imaging unit configured to image reflected light from the surface of the inspection object.

Abstract: [Object] To measure a surface shape of a strip-shaped body made of a metallic body at higher speed with higher precision while suppressing occurrence of speckle noise. [Solution] A shape measurement apparatus according to the present invention includes: a linear light source that includes a superluminescent diode and applies linear light spreading in a width direction of the strip-shaped body to a surface of the strip-shaped body; a screen on which reflected light of the linear light off the surface of the strip-shaped body is projected; an area camera that captures an image of the reflected light of the linear light projected on the screen; and an arithmetic processing apparatus that calculates the surface shape of the strip-shaped body using the captured image of the reflected light of the linear light captured by the area camera.

Abstract: A large amount of spinel type silicon nitride powders of a high-pressure phase is produced by mixing raw powders having a particle size of 10 ?m or less of ?-, ?- or amorphous silicon nitride, each of which is a low pressure phase, with non-nitrified metal powders at a ratio of 50 weight % or more, preferably copper powders with a particle size of 100 ?m or less, forming a compact with porosity of 50% or less and 10% or more, preferably around 30%, by pressing mixture powders obtained, and subjecting the compact to shock wave compression treatment at a pressure of 20 GPa or more, preferably around 60 GPa.

Abstract: A large amount of spinel type silicon nitride powders of a high-pressure phase is produced by mixing raw powders having a particle size of 10 &mgr;m or less of &agr;-, &bgr;- or amorphous silicon nitride, each of which is a low pressure phase, with non-nitrified metal powders at a ratio of 50 weight % or more, preferably copper powders with a particle size of 100 &mgr;m or less, forming a compact with porosity of 50% or less and 10% or more, preferably around 30%, by pressing mixture powders obtained, and subjecting the compact to shock wave compression treatment at a pressure of 20GPa or more, preferably around 60GPa.

Abstract: A high pressure phase spinel type sialon represented by the chemical formula Si6−xAlxOxN8−x (0<x≦4.2), and a high pressure phase spinel type silicon oxynitride represented by the chemical formula Si3+xO2xN4 (═Si3N4.xSiO2, 0<x<1). Methods for their production by instantaneous pressing by means of an impulse wave.

Abstract: A high pressure phase spinel type sialon represented by the chemical formula Si6−xAlxOxN8−x (0<x≦4.2), and a high pressure phase spinel type silicon oxynitride represented by the chemical formula Si3+xO2xN4 (═Si3N4.xSiO2, 0<x<1). Methods for their production by instantaneous pressing by means of an impulse wave.