Patents by Inventor Takane Kobayashi

Takane Kobayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6448554
    Abstract: From an ion source and accelerator an ion beam is generated, this ion beam is let go through a circular hole bored in the center of a detector and orifices to irradiate a sample in a sample chamber. The detector detects particles scattered from the sample and arrived at the detector through the orifices. With exhaust units and orifices, the region surrounding the detector is exhausted to be a prescribed degree of vacuum of higher vacuum than the inside of the sample chamber.
    Type: Grant
    Filed: May 28, 1999
    Date of Patent: September 10, 2002
    Assignee: The Institute of Physical and Chemical Research (Riken)
    Inventors: Masakazu Aono, Takane Kobayashi