Patents by Inventor Takanori Ikegami

Takanori Ikegami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7742896
    Abstract: A plurality of first measured values (xi) are obtained by respectively measuring a plurality of measuring objects in a plurality of first measuring systems and a plurality of second measured values (yi) are obtained by respectively measuring the plurality of measuring objects in a plurality of second measuring systems, and a combination of a first measured value and a second measured value corresponding to each other is obtained as a sample point (Pi). A transformation function representing a relationship between a first reconstituted system derived from the plurality of first measuring systems and a second reconstituted system derived from the plurality of second measuring system is obtained statistically processing a plurality of sample points of the plurality of measuring objects. Subsequently, a transformed value (?i) is obtained by transforming a second measured value (yi) with the transformation function.
    Type: Grant
    Filed: October 27, 2005
    Date of Patent: June 22, 2010
    Inventor: Takanori Ikegami
  • Publication number: 20090150119
    Abstract: A plurality of first measured values (xi) obtained by respectively measuring a plurality of measuring objects in a plurality of first measuring systems and a plurality of second measured values (yi) obtained by respectively measuring the plurality of measuring objects in a plurality of second measuring systems are prepared, and a combination of a first measured value and a second measured value corresponding to each other is obtained as a sample point (Pi) (S11). A transformation function representing a relationship between a first reconstituted system derived from the plurality of first measuring systems and a second reconstituted system derived from the plurality of second measuring systems is obtained by statistically processing a plurality of sample points of the plurality of measuring objects (S12 to S18). Subsequently, a transformed value (?i) is obtained by transforming a second measured value (yi) with the transformation function (S19).
    Type: Application
    Filed: October 27, 2005
    Publication date: June 11, 2009
    Inventor: Takanori Ikegami