Abstract: A control rod operation generates a rod insertion block signal during operation of a reactor. Four neutron detector assemblies including a plurality of LPRMs arranged in an axial direction of a core are arranged adjacent to a plurality of insertion selection control rods, respectively, which are simultaneously inserted into the core. Neutron flux ratio calculation units are arranged in each of the neutron detector assemblies, and ratios (neutron flux ratios BA/AA, CA/AA, and DA/AA) of an average LPRM signal of the respective LPRMs at positions B, C, and D to an average LPRM signal of the respective LPRMs at a position A which is closest to the control rod insertion end of the core are calculated. When the largest neutron flux ratio out of the neutron flux ratios exceeds a set neutron flux ratio, a rod insertion block signal which is generated by a local range rod insertion monitor is output.

Abstract: A control rod operation generates a rod insertion block signal during operation of a reactor. Four neutron detector assemblies including a plurality of LPRMs arranged in an axial direction of a core are arranged adjacent to a plurality of insertion selection control rods, respectively, which are simultaneously inserted into the core. Neutron flux ratio calculation units are arranged in each of the neutron detector assemblies, and ratios (neutron flux ratios BA/AA, CA/AA, and DA/AA) of an average LPRM signal of the respective LPRMs at positions B, C, and D to an average LPRM signal of the respective LPRMs at a position A which is closest to the control rod insertion end of the core are calculated. When the largest neutron flux ratio out of the neutron flux ratios exceeds a set neutron flux ratio, a rod insertion block signal which is generated by a local range rod insertion monitor is output.

Abstract: A semiconductor device is composed of an oscillator circuit developing a clock, and an oscillation failure detect unit. The an oscillation failure detect unit is configured to obtain at least one count value through counting clock pulses of the clock, and to activate an oscillation failure detect signal in response to the at least one count value being out of a predetermined count value range.

Abstract: A semiconductor device is composed of an oscillator circuit developing a clock, and an oscillation failure detect unit. The an oscillation failure detect unit is configured to obtain at least one count value through counting clock pulses of the clock, and to activate an oscillation failure detect signal in response to the at least one count value being out of a predetermined count value range.

Abstract: The improved process for producing a signature panel comprises the steps of forming on the writing surface of a panel substrate a printed graphic pattern that will change upon exposure to alcohols, organic solvents, bleaching agents and surfactants, and laminating the other surface of the panel substrate with a thermoplastic resin by extrusion or hot melt coating. According to this process, signature panels can be thermocompressed at comparatively low temperatures not only to roll mills of overprint cards using a polyvinyl chloride sheet as an oversheet base but also to card substrates such as PET sheets, metal sheets and glass sheets without causing any adverse effects on the graphic pattern printed on the writing surface of the panel which will change upon exposure to chemicals.