Abstract: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for holding the sample and a movable portion movable in a direction in which an inertial force generated during movement of the sample holding table is cancelled. The scanning stage further includes a memory for storing characteristic information of the scanning stage and is detachably or replaceably mountable to a main assembly of the apparatus.

Abstract: An electronic apparatus (1) includes a power receiver (2) and an electronic apparatus main body (3). The power receiver (2) includes a power receiving coil (11) having a spiral coil, a rectifier (12) and a secondary battery (13). The electronic apparatus main body (3) includes an electronic device (14) and a circuit board (15). A magnetic foil (16) is arranged in at least one position between the spiral coil (11) and one of the secondary battery (13), the rectifier (12), the electronic device (14) and the circuit board (15).

Abstract: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for holding the sample and a movable portion movable in a direction in which an inertial force generated during movement of the sample holding table is cancelled. The scanning stage further includes a drive circuit for driving the scanning stage and is detachably or replaceably mountable to a main assembly of the apparatus.

Abstract: A drive stage for a scanning probe apparatus includes a supporting member, a plurality of movable portions fixed to the supporting member, and a plurality of drive elements configured and positioned to drive the plurality of movable portions. The drive stage is driven in a direction in which inertial forces of the plurality of movable portions are mutually canceled during drive of the plurality of drive elements. The drive stage further includes an inertial force difference detection member configured and positioned to detect a difference in inertial force between the plurality of movable portions, and an inertial force adjustment member configured and positioned to effect inertial force adjustment so that the difference in inertial force between the plurality of movable portions is decreased on the basis of a detection output of the inertial force detection member.

Abstract: A scanning probe apparatus for obtaining information of a sample or processing the sample with relative movement between the sample and the apparatus includes a sample stage for holding the sample, and a drive stage with a probe, a cantilever supporting the probe, a cantilever holding member for holding the cantilever, and a drive element for driving the probe in three directions perpendicular to each other. In addition, a movable portion surrounds the drive element and is positioned outside of the drive element, with the movable portion movable in a direction in which an inertial force generated during movement of the probe is canceled. The drive stage includes an optical path, through which light passes, provided inside of the drive stage.

Abstract: Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the sample, and a potential measuring mechanism (circuit (K)) for measuring the surface potential of the sample caused by the contact electrification mechanism in a non-contact state of the electroconductive probe device and the surface of the sample, wherein the electrification induced by the contact electrification mechanism and the measurement of the surface potential by the potential measuring mechanism alternate in time series while the voltage applied during the contact is gradually changed, thereby measuring a correlation between the applied voltage and the surface potential.

Abstract: In a scanning probe apparatus capable of always effectively canceling an inertial force to suppress vibration even in repetitive use while replacing a sample holding table or a probe, a stage for a sample or the probe includes a drive element for moving the sample holding table and movable portions movable in a direction in which an inertial force generated during movement of the sample holding table. The stage is configured so that the drive element, the movable portions, and the sample holding table or the probe are integrally detachably mountable to a main assembly of the scanning probe apparatus.

Abstract: In a scanning probe apparatus capable of always effectively canceling an inertial force to suppress vibration even in repetitive use while replacing a sample holding table or a probe, a stage for a sample or the probe includes a drive element for moving the sample holding table and movable portions movable in a direction in which an inertial force generated during movement of the sample holding table. The stage is configured so that the drive element, the movable portions, and the sample holding table or the probe are integrally detachably mountable to a main assembly of the scanning probe apparatus.

Abstract: An electronic apparatus (1) includes a power receiving device (2) and an electronic apparatus main body (3). The power receiving device (2) includes a power receiving coil (11) having a spiral coil, a rectifier (12), and a secondary battery (13). The electronic apparatus main body (3) includes an electronic device (14) and a circuit board (15). A magnetic foil (16) is arranged in at least one position between the spiral coil (11) and the secondary battery (13), the rectifier (12), the electronic device (14), or the circuit board (15). The magnetic foil (16) has a ?r?·t value expressed as the product of the real component ?r? of relative permeability and the plate thickness t of 30000 or larger.

Abstract: An inductance element (1) comprises a core (2) having a multilayer body (6) composed of magnetic alloy thin ribbons (5) and an insulating coating layer (7) which covers the peripheral surface of the multilayer body without being bonded thereto, and a coil (4) wound around the core (2). The magnetic alloy thin ribbons (5) are stacked in a non-adhered state or with a flexible insulating adhesive layer therebetween. Having such a structure, the inductance element can stably attain good characteristics even when it is small-sized or made short.

Abstract: Disclosed is an electronic apparatus (1) comprising a power receiving device (2) and an electronic apparatus main body (3). The power receiving device (2) comprises a power receiving coil (11) having a spiral coil, a rectifier (12) and a secondary battery (13). The electronic apparatus main body (3) comprises an electronic device (14) and a circuit board (15). A magnetic foil (16) is arranged in at least one position between the spiral coil (11) and the secondary battery (13), the rectifier (12), the electronic device (14) or the circuit board (15). The magnetic foil (16) has a value expressed as the product of the saturation flux density MS and the thickness t, namely Ms·t, of not less than 15.

Abstract: There are provided a high hardness, high corrosion resistance and high wear resistance alloy, wherein the alloy is an aging heat treated Cr(chromium)-Al(aluminum)-Ni(nickel)-base alloy, the proportion of a mixed phase of (? phase+?? phase+? phase) precipitated at grain boundaries of ? phase grains in a metal structure in the cross section of the alloy is not less than 95% in terms of area ratio, and the intensity ratio as measured by X-ray diffractometry of the alloy is not less than 50% and not more than 200% in terms of I?(110)/[I?(200)+I??(004)]×100, and a component comprising this alloy, a material for an alloy which can form this alloy, and a process for producing this alloy. The present invention can provide a Cr—Al—Ni-base alloy possessing excellent corrosion resistance, hardness, wear resistance, releasability, fatigue strength, and planishing property in a molding face, a component comprising this alloy, a material for an alloy which can form this alloy, and a process for producing this alloy.

Abstract: Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the sample, and a potential measuring mechanism (circuit (K)) for measuring the surface potential of the sample caused by the contact electrification mechanism in a non-contact state of the electroconductive probe device and the surface of the sample, wherein the electrification induced by the contact electrification mechanism and the measurement of the surface potential by the potential measuring mechanism alternate in time series while the voltage applied during the contact is gradually changed, thereby measuring a correlation between the applied voltage and the surface potential.

Abstract: A drive stage for a scanning probe apparatus includes a supporting member, a plurality of movable portions fixed to the supporting member, and a plurality of drive elements configured and positioned to drive the plurality of movable portions. The drive stage is driven in a direction in which inertial forces of the plurality of movable portions are mutually canceled during drive of the plurality of drive elements. The drive stage further includes an inertial force difference detection member configured and positioned to detect a difference in inertial force between the plurality of movable portions, and an inertial force adjustment member configured and positioned to effect inertial force adjustment so that the difference in inertial force between the plurality of movable portions is decreased on the basis of a detection output of the inertial force detection member.

Abstract: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for holding the sample and a movable portion movable in a direction in which an inertial force generated during movement of the sample holding table is cancelled. The scanning stage further includes a memory for storing characteristic information of the scanning stage and is detachably or replaceably mountable to a main assembly of the apparatus.

Abstract: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for holding the sample and a movable portion movable in a direction in which an inertial force generated during movement of the sample holding table is cancelled. The scanning stage further includes a drive circuit for driving the scanning stage and is detachably or replaceably mountable to a main assembly of the apparatus.

Abstract: In a scanning probe apparatus capable of always effectively canceling an inertial force to suppress vibration even in repetitive use while replacing a sample holding table or a probe, a stage for a sample or the probe includes a drive element for moving the sample holding table and movable portions movable in a direction in which an inertial force generated during movement of the sample holding table. The stage is configured so that the drive element, the movable portions, and the sample holding table or the probe are integrally detachably mountable to a main assembly of the scanning probe apparatus.

Abstract: A drive stage, for driving a sample or a probe, capable of ensuring a movable range of a movable portion as a counterweight and always effectively canceling an inertial force to suppress vibration of a supporting member leading to vibration of the sample or the probe includes a counter drive element for moving the probe or a sample holding table and a movable portion movable in a direction in which the inertial force generated during movement of the probe or the sample holding table. The movable portion surrounds the counter drive element outside the counter drive element.

Abstract: An inductance element (1) comprises a core (2) having a multilayer body (6) composed of magnetic alloy thin ribbons (5) and an insulating coating layer (7) which covers the peripheral surface of the multilayer body without being bonded thereto, and a coil (4) wound around the core (2). The magnetic alloy thin ribbons (5) are stacked in a non-adhered state or with a flexible insulating adhesive layer therebetween. Having such a structure, the inductance element can stably attain good characteristics even when it is small-sized or made short.

Abstract: An inductance element comprises a coil having a hollow portion opened at both ends and provided with a winding of which number of turns (N) per length 10 mm is 20 or more and 500 or less, and a core having a single layer or a plurality of layers of magnetic ribbon of a thickness of 4 &mgr;m or more and 50 &mgr;m or less and a width of 2 mm or more and 40 mm or less, at least part thereof being disposed in the hollow portion. In such an inductance element, a ratio (N/n) of a number of turns (N) of the coil per length 10 mm to a number of layers (n) of the magnetic ribbon is set at 20 or more and 500 or less. The magnetic ribbon, for instance in a state disposed in the hollow portion of the coil, has an open magnetic circuit structure. Instead, the magnetic ribbon, by disposing penetrating the hollow portion and magnetically connecting both ends thereof, forms a closed magnetic circuit loop. Such an inductance element possesses excellent inductance characteristics and is good in winding efficiency.