Patents by Inventor Takao Minami
Takao Minami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240033657Abstract: A liquid chromatography column comprising: a column tube including a flow path that runs therethrough in an axial direction of the column tube and that is filled with a filler; a filter unit that is mounted at an axial direction end of the column tube to trap the filler inside the flow path; and a cap that includes a through hole communicated with the flow path through the filter unit and that is mounted at the column tube, wherein a gap, which is a space into which the filler overflowing from the flow path can escape when the cap is being attached to the column tube, is formed at an outer side of a contact surface at which the column tube and the filter unit contact each other.Type: ApplicationFiled: July 26, 2023Publication date: February 1, 2024Applicant: ARKRAY, Inc.Inventor: Takao MINAMI
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Patent number: 7133574Abstract: A position of a honeycomb structure, which is comprised of an outer shell, separation walls arranged in the form of a honeycomb within the outer shell, and a number of axially extending cells which are defined by the separation walls, is recognized. When the position recognition is carried out, the honeycomb structure is located with the axis extending in an upward and downward direction. A camera to pickup image data is disposed out of an area directly above an upper surface of the honeycomb structure in the axial direction. Image data including the entirety of the upper surface of the honeycomb structure is picked up by the camera, so that the position of the honeycomb structure is recognized based on the image data.Type: GrantFiled: August 22, 2002Date of Patent: November 7, 2006Assignee: Denso CorporationInventor: Takao Minami
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Publication number: 20030174320Abstract: A piercing inspection apparatus allows inspection of piercing of through-holes of a honeycomb structure having a number of parallel through-holes which extend therethrough from a first open end to a second open end of the honeycomb structure. The apparatus includes a lighting device which emits light onto the first open end of the honeycomb structure, so that the light passes through the through-holes, a telecentric optical system which converges the light emitted from the through-holes at the second open end to form inspection images corresponding to the through-holes, a camera which picks up the inspection images, and a monitor in which the picked up inspection images are indicated.Type: ApplicationFiled: March 6, 2003Publication date: September 18, 2003Inventors: Yoshio Yokoyama, Takao Minami, Tamaaki Sibuya, Kenji Yoneda
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Patent number: 6614511Abstract: In a light wavelength dispersion measuring apparatus 1, three band-pass filters BPa1 to BPa3 are connected in parallel, three band-pass filters BPb1 to BPb3 are connected in parallel, and three phase comparators PCa to PCc are connected in parallel for making it possible to conduct phase difference measurement of the nth-order harmonics (n=1, 4, 8) at the same time, so that a wavelength dispersion calculator 10 can calculate the wavelength dispersion values of the nth-order harmonics (n=1, 4, 8) at the same time. As a result, measurement time of measuring the wavelength dispersion characteristic in the light wavelength dispersion measuring apparatus 1 can be shortened.Type: GrantFiled: October 27, 2000Date of Patent: September 2, 2003Assignee: Ando Electric Co., Ltd.Inventors: Yoshiyuki Sakairi, Takao Minami
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Publication number: 20030048941Abstract: A position of a honeycomb structure, which is comprised of an outer shell, separation walls arranged in the form of a honeycomb within the outer shell, and a number of axially extending cells which are defined by the separation walls, is recognized. When the position recognition is carried out, the honeycomb structure is located with the axis extending in an upward and downward direction. A camera to pickup image data is disposed out of an area directly above an upper surface of the honeycomb structure in the axial direction. Image data including the entirety of the upper surface of the honeycomb structure is picked up by the camera, so that the position of the honeycomb structure is recognized based on the image data.Type: ApplicationFiled: August 22, 2002Publication date: March 13, 2003Inventor: Takao Minami
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Patent number: 6512610Abstract: A multi-branch optical network testing method (or device) is provided to perform a fault isolation test on an optical network that branches off at a branch point by a number of optical lines having terminal ends respectively. Herein, optical pulses are input to the optical network, from which they are returned as reflection beams. Then, response beams corresponding to mixture of the reflection beams are converted to OTDR waveform data representing a waveform whose optical power gradually decreases in accordance with a distance from an OTDR measurement device and which has a number of reflection peaks. The OTDR waveform data are subjected to logarithmic conversion to produce logarithmic waveform data representing a logarithmic waveform. An approximation method of least squares is effected on the logarithmic waveform data to produce an approximation line, which crosses the logarithmic waveform at points of intersection corresponding to Fresnel reflection points.Type: GrantFiled: March 3, 1999Date of Patent: January 28, 2003Assignees: Ando Electric Co., Ltd., The Kansai Electric Power Co., Inc.Inventors: Takao Minami, Nobuaki Takeuchi, Keiichi Shimizu, Koichi Shinozaki, Takamu Genji
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Patent number: 6310702Abstract: A testing device performs testing on a multistage multi-branch optical network, which contains optical lines (such as optical fibers) that are connected together at connection points (e.g., optical couplers) in a multistage multi-branch manner. An OTDR measurement device uses software to perform fault determination with respect to the multistage multi-branch optical network. Herein, optical pulses are input to an input end of the multistage multi-branch optical network, wherein they are reflected at certain portions of the optical lines and the connection points while propagating through the optical lines. Then, reflected beams are returned to the input end and are mixed together as response light, which is measured by the OTDR measurement device. The response light is converted to a plurality of digital waveform data representing a measured waveform, which is then divided into multiple ranges on the basis of the Fresnel reflection points and connection points.Type: GrantFiled: June 18, 1998Date of Patent: October 30, 2001Assignees: Ando Electric Co., Ltd., Kansai Electric Power Co., Inc.Inventors: Takao Minami, Nobuaki Takeuchi, Naoyuki Nozaki, Koichi Shinozaki, Takamu Genji
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Publication number: 20010007272Abstract: A veneer edge jointing apparatus which comprises a plurality of rows of conveyors (chains) for transporting a veneer piece until a trailing edge of the veneer piece in a direction of transportation comes to an abutting position; an adhesive-applying device for applying a hot melt adhesive to a leading edge of the transported veneer piece in the direction of transportation; and a bonding device for abutting the leading edge of the veneer piece transported by means of the conveyors against a trailing edge of a preceding veneer sheet in alignment with the abutting position, and then pushing and feeding the veneer piece to bond the veneer pieces to each other into a continuous veneer sheet. The bonding device is arranged at a position for substantially filling vacant regions in the direction of width orthogonal to the direction of transportation.Type: ApplicationFiled: December 27, 2000Publication date: July 12, 2001Applicant: MINAMI MACHINE CO., LTD.Inventor: Takao Minami
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Patent number: 6028661Abstract: A multi-branched optical line testing apparatus can automatically detect a faulty line in multi-branched optical lines and the distance to the fault point. An optical pulse is introduced to the branch point of optical fibers and is reflected inside the respective optical fibers. The waveform of the returning response light is analyzed by an optical time-domain reflectometer (OTDR) measuring apparatus to detect a fault in the respective optical fibers and to determine the fault point. The OTDR measuring apparatus periodically converts the response light which is returned from the respective optical fibers into a digital waveform data group, calculates the attenuation ratios of the respective optical fibers by performing separation analysis of the digital waveform data group, and determines the faulty line and the position of the fault point based on the change of the attenuation ratio of the respective optical fibers.Type: GrantFiled: December 8, 1997Date of Patent: February 22, 2000Assignees: Ando Electric Co., Ltd., The Kansai Electric Power Co., Inc.Inventors: Takao Minami, Nobuaki Takeuchi, Naoyuki Nozaki, Koichi Shinozaki, Takamu Genji
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Patent number: 5731869Abstract: In an optical fiber testing method, light are supplied to a measuring optical fiber so that return light, consisting of back-scattering light and Fresnel-reflection light, is outputted from the measuring optical fiber. A waveform representing the return light is used to perform testing of the measuring optical fiber. Herein, a detection range of the waveform used for detection of connections is defined and is partitioned into a plurality of regions in connection with Fresnel-reflection space. Then, at least a noise index and a constant are calculated for each region; and HOUGH conversion is performed on each region of the waveform. In addition, a center-value filtering process is performed, using the constant, with respect to each region of the waveform to create a filtered waveform. Further, a mean difference process is performed on the filtered waveform to create a mean difference waveform.Type: GrantFiled: June 28, 1996Date of Patent: March 24, 1998Assignee: Ando Electric Co., Ltd.Inventor: Takao Minami
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Patent number: 5668627Abstract: In an optical line testing device, light pulses are radiated to an optical line so as to receive response light, corresponding to each of the light pulses reflected by the optical line, for a certain period of time. The response light is converted to waveform data. The waveform data are averaged to create averaged data. The averaged data are stored in a memory and are also used to visually display a response waveform corresponding to the response light. A human operator manipulates an operator console while looking at the response waveform so as to analyze the response waveform, thus detecting a property of the optical line. A data range is set between first data and last data selected from among the averaged data representing the response waveform. According to an optical line testing method, the data range is partitioned into several regions so that an approximate line is calculated, using a method of least squares, with respect to each of the regions.Type: GrantFiled: April 22, 1996Date of Patent: September 16, 1997Assignee: Ando Electric Co., Ltd.Inventor: Takao Minami
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Patent number: 5372168Abstract: A thin plate cutting/joining apparatus includes a cutting apparatus for pressing the front end of a following thin plate and the rear end of a preceding thin plate together and cutting the pressed front and rear ends of the thin plates in stepped scarf shapes; an adhesive coating apparatus for coating an adhesive on the cut surfaces of the end portions of the thin plates; and a joining apparatus for pushing the thin plates coated with the adhesive against each other and vertically pressing them, so as to joining the end portions of the thin plates.Type: GrantFiled: October 12, 1993Date of Patent: December 13, 1994Assignee: Minami Machine Co., Ltd.Inventor: Takao Minami
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Patent number: 4715909Abstract: A nickel-chromium alloy excellent in a stress corrosion cracking resistance which is obtained by carrying out an annealing treatment under specific conditions, said alloy having the following composition:______________________________________ in terms of % by weight, ______________________________________ 0.04% or less of C; 1.0% or less of Si; 1.0% or less of Mn; 0.030% or less of P; 0.02% or less of S; 40 to 70% of Ni; 25 to 35% of Cr; 0.1 to 0.5% of Al; 0.05 to 1.0% of Ti; 0.5 to 5.0% in all of one or more of Mo, W and V, and ______________________________________the residue comprising substantially Fe. A nickel-chromium alloy further including 0.2 to 5.0% of Nb subject to Ti=0.2 to 1.0% and Nb/C=10 to 125.Type: GrantFiled: June 19, 1986Date of Patent: December 29, 1987Assignees: Mitsubishi Jukogyo Kabushiki Kaisha, Sumitomo Metal Industries, Ltd.Inventors: Takao Minami, Hiroo Nagano, Kazuo Yamanaka, Yasutaka Okada, Hiroshi Susukida, Kichiro Onimura, Toshio Yonezawa, Nobuya Sasaguri
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Patent number: 4714501Abstract: An alloy for heat transfer pipes excellent in an alkali stress corrosion cracking resistance which is obtained by heating and retaining said alloy at a temperature within the range of a temperature (T.degree.C.), at which a carbide in said alloy is thoroughly solubilized, to T+100.degree. C. for 1 minute or more; cooling it once to a level of 200.degree. C. or less; and carrying out a thermal treatment under conditions within a hatched range Z in FIG. 2, said alloy comprising: in terms of % by weight, 0.15% or less of C; 1.0% or less of Si; 1.0% or less of Mn; 25 to 35% of Cr; 40 to 70% of Ni; 0.5% or less of Al; 0.01 to 1.0% of Ti; 0.5 to 5.0%, in all, of one or more of Mo, W and V; 0.30% or less of P; 0.020% or less of S; and the residue of Fe and impurities.Type: GrantFiled: November 15, 1985Date of Patent: December 22, 1987Assignees: Mitsubishi Jukogyo Kabushiki Kaisha, Sumitomo Metal Industries, Ltd.Inventors: Kazuo Yamanaka, Hiroo Nagano, Takao Minami, Yaautaka Okada, Mamoru Inoue, Hiroshi Susukida, Kichiro Onimura, Toshio Yonezawa, Nobuya Sasaguri, Katsuji Kawaguchi, Takaya Kusakabe
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Patent number: 4710237Abstract: A method for a thermal treatment of a nickel based alloy, characterized in that said nickel based alloy for a material which will be subjected to a high-temperature and high-pressure water or vapor comprises, in terms of % by weight, 58% or more of Ni, 25 to 35% of Cr, 0.003% or less of B, 0.012 to 0.035% of C, 1% or less of Mn, 0.5% or less of Si, 0.015% or less of P, 0.015% or less of S, and the residue of Fe and usual impurities; in a first thermal treatment process, said nickel based alloy is heated and retained at a temperature of T.degree. C. to (T+100).degree.C. and is cooled at a cooling rate of a furnace cooling rate or more; and in a second thermal treatment process, said nickel based alloy is then retained at a temperature of 600.degree. to 750.degree. C. and at a temperature within a sensitization recovery range for a period of 0.1 to 100 hours and is cooled at a cooling rate of said furnace cooling rate or more.Type: GrantFiled: January 2, 1986Date of Patent: December 1, 1987Assignees: Mitsubishi Jukogyo Kabushiki Kaisha, Sumitomo Metal Industries, Ltd.Inventors: Toshio Yonezawa, Nobuya Sasaguri, Kichiro Onimura, Hiroshi Susukida, Katsuji Kawaguchi, Hiroo Nagano, Takao Minami, Kazuo Yamanaka, Yasutaka Okada, Mamoru Inoue