Patents by Inventor Takao Namae

Takao Namae has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for correcting astigmatism in a scanning electron microscope or the like
    Patent number: 4214163
    Abstract: In a scanning electron microscope, a circle of least confusion of the electron beam is formed on a specimen without operation of a stigmator, then the circle of least confusion is minimized by a stigmator, thereby enabling lens astigmatism in said microscope to be fully corrected.
    Type: Grant
    Filed: December 18, 1978
    Date of Patent: July 22, 1980
    Assignee: Nihon Denshi Kabushiki Kaisha
    Inventors: Takao Namae, Teruo Someya
  • Method and apparatus for automatically focusing an electron beam in a scanning beam device
    Patent number: 4199681
    Abstract: An electron beam device comprising a scanning means for automatically focusing said electron beam and a related method. The scanning means is controlled at all times to operate under optimum magnification and scanning speed conditions.
    Type: Grant
    Filed: October 10, 1978
    Date of Patent: April 22, 1980
    Assignee: Nihon Denshi Kabushiki Kaisha
    Inventor: Takao Namae
  • Scanning electron device
    Patent number: 4071759
    Abstract: A scanning electron microscope for displaying a scanning image on a cathode ray tube screen. A high magnification image is displayed within a low magnification image displayed on a cathode ray tube screen so that the relative positions of the low and high magnification images can be immediately observed. The magnification and the display area of the high magnification image is varied continuously.
    Type: Grant
    Filed: December 15, 1976
    Date of Patent: January 31, 1978
    Assignee: Nihon Denshi Kabushiki Kaisha
    Inventor: Takao Namae
  • Scanning electron device
    Patent number: 4020343
    Abstract: A scanning electron microscope or other type of scanning electron device incorporating a light pen for automatically changing the field of view of a specimen on a CRT. The output of said light pen controls the center and/or width of the scanning area of the incident electron beam irradiating the specimen when said light pen is directed towards a certain point in the initial specimen field of view on the CRT, thereby displaying said point at the center of the changed field of view on the CRT.
    Type: Grant
    Filed: April 21, 1976
    Date of Patent: April 26, 1977
    Assignee: Nihon Denshi Kabushiki Kaisha
    Inventors: Takashi Shimaya, Takao Namae, Kazuo Ishikawa
  • Method and apparatus for automatically focusing
    Patent number: 3937959
    Abstract: The sum of the intensity changes of one polarity in the video signal is used as a signal indicative of the diameter of the electron beam irradiating a specimen. A storage counter which produces the signal indicative of the beam diameter is reset periodically in synchronism with the beam scan and two successive outputs of the counter are compared by a comparison circuit. The excitation current of the focusing lens is varied in synchronism with beam scan. The magnitude and polarity (increase or decrease) of the change in excitation current are controlled in response to the output of said comparison circuit to maximize the output of the storage counter.
    Type: Grant
    Filed: December 24, 1974
    Date of Patent: February 10, 1976
    Assignee: Nihon Denshi Kabushiki Kaisha
    Inventor: Takao Namae