Abstract: A measurement result receiving apparatus receives measurement results transmitted from a plurality of measuring devices, the measurement results obtained by conducting a measurement at a predetermined sampling interval according to a reference clock of each measuring device. The measurement result receiving apparatus includes a receiving section that receives the measurement results from the plurality of measuring devices; and a sampling interval converting section that converts the measurement results into measurement values associated with a common sampling interval.

Abstract: A measurement result receiving apparatus receives measurement results transmitted from a plurality of measuring devices, the measurement results obtained by conducting a measurement at a predetermined sampling interval according to a reference clock of each measuring device. The measurement result receiving apparatus includes a receiving section that receives the measurement results from the plurality of measuring devices; and a sampling interval converting section that converts the measurement results into measurement values associated with a common sampling interval.

Abstract: A current sensor includes first and second magnetic sensors that are placed around a current line through which a current flows so that the current line is positioned therebetween, and that detect an induction field generated by the current. Each of the first and second magnetic sensors has a main sensitivity axis and a sub-sensitivity axis. The direction of the main sensitivity axis of each of the first and second magnetic sensors is oriented in a direction that is not orthogonal to the direction of the induction field. The directions of the main sensitivity axes of the first and second magnetic sensors are oriented in the same direction and the directions of the sub-sensitivity axes are oriented in the same direction, or the directions of the main sensitivity axes are oriented in opposite directions and the directions of the sub-sensitivity axes are oriented in opposite directions.

Abstract: A socket is electrically connected to a test carrier. The test carrier includes a film-shaped first member on which at least one internal terminal, which contacts at least one electrode of an electronic device, is provided; and at least one external terminal which is electrically connected to the internal terminal. The socket includes: at least one contactor which contacts the external terminal; and a first pusher which pushes a portion of the first member where the internal terminal is provided and a portion of the first member surrounding the internal terminal. The first pusher includes: a bag member which has a sealed space within the bag member; and a fluid which is housed in the sealed space.

Abstract: A test carrier includes a base film that holds a die and a cover film that overlaps the base film so as to cover the die. The cover film has a self-adhesive property and is more flexible than the base film. The base film has a through hole. The through hole is formed in the vicinity of a region of the base film which contacts the die.

Abstract: A socket is electrically connected to a test carrier. The test carrier includes a film-shaped first member on which at least one internal terminal, which contacts at least one electrode of an electronic device, is provided; and at least one external terminal which is electrically connected to the internal terminal. The socket includes: at least one contactor which contacts the external terminal; and a first pusher which pushes a portion of the first member where the internal terminal is provided and a portion of the first member surrounding the internal terminal. The first pusher includes: a bag member which has a sealed space within the bag member; and a fluid which is housed in the sealed space.

Abstract: A socket is electrically connected to a test carrier. The test carrier includes: a film-shaped first member on which at least one internal terminal, which contacts at least one electrode of an electronic device, is provided; and at least one external terminal which is electrically connected to the internal terminal. The socket includes: at least one contactor which contacts the external terminal; and a first pusher which pushes a portion of the first member where the internal terminal is provided and a portion of the first member surrounding the internal terminal. The first pusher has an elastic member which becomes softer in stages or gradually with distance to the first member.

Abstract: A test carrier includes a film-shaped base film which has first bumps which contact test pads of a die; and a cover film which is superposed over the base film, and the test carrier holds the die between the base film and the cover film. The first bumps are relatively higher than second bumps which the die has.

Abstract: A socket which enables occurrence of contact defects to be suppressed is provided. A socket 11 to which a test carrier 20, which has: a base film 32 on which bumps 324 are formed for contact with electrode pads 51 of a die 50; and external terminals 312 which are electrically connected to the bumps 324, is electrically connected comprises: contactors 125 which contact external terminals 312; and an elastic member 131 which pushes against bump-forming portions 32a and bump-surrounding portions 32b on the base film 32. The elastic member 131 has: a first elastic layer 132; and a second elastic layer 133 which is more flexible than the first elastic layer 132, and a second elastic layer 133 is laid over the first elastic layer 132 and contacts the base film 32.

Abstract: A test carrier 10A comprises: a base board 21A which holds a die 90; and a cover board 31A which is laid over the base board 21A so as to cover the die 90. The test carrier 10A comprises a seal member 24 which is interposed between the base board 21A and the cover board 31A and which surrounds the die 90.

Abstract: A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carrier 10 comprises: a base film 40 which has one main surface which has bumps which contact electrodes 91 of the die 90; and a cover film 70 which is laid over the base film 40, the die 90 is held between the base film 40 and the cover film 70, the base film 40 has: a first region 40a which has a first thickness t1; and a second region 40b which has a second thickness t2 which is thinner than the first thickness t1, and the second region 40b faces at least a part of the edge 92 of the die 90.

Abstract: There is provided a powder treating apparatus which can uniformly and successively combine and grow powders having different specific gravities or sizes together with a simple structure.

Abstract: Circuits and related methods for energy efficient battery supplied switching DC-to-DC regulators are disclosed. When entering a power-down state the energy in an output capacitor is harvested and charged back to the battery. This is achieved by ramping-down a reference voltage after a power-down sequence is initiated. The output voltage of the regulator is ramped-down accordingly. At the end of the power down sequence the output voltage of the regulator is down to 0V. The disclosure is especially important for regulators, which frequently are started up and switched down.

Abstract: Circuits and related methods for energy efficient battery supplied switching DC-to-DC regulators are disclosed. When entering a power-down state the energy in an output capacitor is harvested and charged back to the battery. This is achieved by ramping-down a reference voltage after a power-down sequence is initiated. The output voltage of the regulator is ramped-down accordingly. At the end of the power down sequence the output voltage of the regulator is down to 0V. The disclosure is especially important for regulators, which frequently are started up and switched down.

Abstract: A current sensor includes first and second magnetic sensors that are placed around a current line through which a current flows so that the current line is positioned therebetween, and that detect an induction field generated by the current. Each of the first and second magnetic sensors has a main sensitivity axis and a sub-sensitivity axis. The direction of the main sensitivity axis of each of the first and second magnetic sensors is oriented in a direction that is not orthogonal to the direction of the induction field. The directions of the main sensitivity axes of the first and second magnetic sensors are oriented in the same direction and the directions of the sub-sensitivity axes are oriented in the same direction, or the directions of the main sensitivity axes are oriented in opposite directions and the directions of the sub-sensitivity axes are oriented in opposite directions.

Abstract: A socket which enables occurrence of contact defects to be suppressed is provided. A socket 11 to which a test carrier 20, which has: a base film 32 on which bumps 324 are formed for contact with electrode pads 51 of a die 50; and external terminals 312 which are electrically connected to the bumps 324, is electrically connected comprises: contactors 125 which contact external terminals 312; and an elastic member 131 which pushes against bump-forming portions 32a and bump-surrounding portions 32b on the base film 32. The elastic member 131 has: a first elastic layer 132; and a second elastic layer 133 which is more flexible than the first elastic layer 132, and a second elastic layer 133 is laid over the first elastic layer 132 and contacts the base film 32.

Abstract: A test carrier which can suppress the occurrence of contact defects and secure positional precision of the terminals is provided. The test carrier 10 comprises: a film-shaped base film 40 which has a plurality of bumps 43 which respectively contact electrode pads 91 of a die 90; and a cover film 70 which is laid over the base film 40 and which covers the die 90, and the plurality of bumps 43 include first bumps 43a and second bumps 43b which are relatively higher than the first bumps 43a.

Abstract: A test carrier which can suppress the occurrence of contact defects and secure positional precision of the terminals is provided. The test carrier 10 comprises: a base film 40 which has bumps 43 which contact the electrode pads 91 of the die 90; a cover film 70 which is laid over the base film 40 and which covers the die 90; and a spacer 45 which is interposed between the base film 40 and the cover film 70 and which is arranged around the die 90.

Abstract: A test carrier which enables a reduction of cost to be achieved. The test carrier 10 comprises: a base film 40 which holds a die 90; and a film-shaped cover film 70 which is laid over the base film 40 and covers the die 90, the cover film 70 has a self-adhesiveness and is more flexible than the base film 40.

Abstract: A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carrier 10 comprises: a base film 40 which has one main surface which has bumps which contact electrodes 91 of the die 90; and a cover film 70 which is laid over the base film 40, the die 90 is held between the base film 40 and the cover film 70, the base film 40 has: a first region 40a which has a first thickness t1; and a second region 40b which has a second thickness t2 which is thinner than the first thickness t1, and the second region 40b faces at least a part of the edge 92 of the die 90.