Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.

Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method and an evaluation apparatus are provided, including: causing a semiconductor device to perform a switching operation; measuring voltage variation occurring between main terminals of the semiconductor device during the switching operation; and outputting an evaluation benchmark for radiated noise of the semiconductor device based on the voltage variation. The outputting the evaluation benchmark may include calculating the voltage variation in the semiconductor device for each frequency component as the evaluation benchmark.

Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method and an evaluation apparatus are provided, including: causing a semiconductor device to perform a switching operation; measuring voltage variation occurring between main terminals of the semiconductor device during the switching operation; and outputting an evaluation benchmark for radiated noise of the semiconductor device based on the voltage variation. The outputting the evaluation benchmark may include calculating the voltage variation in the semiconductor device for each frequency component as the evaluation benchmark.

Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.

Abstract: A power conversion device including a power conversion portion that switches direct current voltage supplied by a positive line and negative line of a direct current power supply with a semiconductor switching element, and outputs converted voltage, is such that a plurality of interline capacitors are connected in parallel between the positive line and negative line, the capacitance of the plurality of interline capacitors is of a value that becomes smaller the nearer to the power conversion portion the position in which the interline capacitor is connected, and the capacitance of the interline capacitor with the smallest value of capacitance is set to a value greater than that of the capacitance between main electrodes when a direct current voltage is applied to the switching element used in the power conversion portion.

Abstract: A power conversion device including a power conversion portion that switches direct current voltage supplied by a positive line and negative line of a direct current power supply with a semiconductor switching element, and outputs converted voltage, is such that a plurality of interline capacitors are connected in parallel between the positive line and negative line, the capacitance of the plurality of interline capacitors is of a value that becomes smaller the nearer to the power conversion portion the position in which the interline capacitor is connected, and the capacitance of the interline capacitor with the smallest value of capacitance is set to a value greater than that of the capacitance between main electrodes when a direct current voltage is applied to the switching element used in the power conversion portion.

Abstract: A noise filter for suppressing conducted emission generated in a power conversion apparatus includes a grounding capacitor circuit, an interphase capacitor circuit and an impedance circuit. The impedance circuit is connected to at least one of the grounding capacitor circuit and the interphase capacitor circuit for adjusting attenuation characteristics of the noise filter.