Abstract: A microscope apparatus includes a monitoring optical system, an imaging unit capturing an image of an observation target through the monitoring optical system to generate a plurality of images, a correction unit disposed in the optical monitoring system and correcting various aberrations which occur due to an observation condition, and a decision unit deciding a correction amount of the correction unit based on the plurality of images generated by the imaging unit, whereby an image deterioration ascribable to the aberration occurring due to the observation condition in the microscope apparatus is appropriately and easily corrected according to a use condition of the microscope apparatus.

Abstract: A microscope apparatus includes a monitoring optical system, an imaging unit capturing an image of an observation target through the monitoring optical system to generate a plurality of images, a correction unit disposed in the optical monitoring system and correcting various aberrations which occur due to an observation condition, and a decision unit deciding a correction amount of the correction unit based on the plurality of images generated by the imaging unit, whereby an image deterioration ascribable to the aberration occurring due to the observation condition in the microscope apparatus is appropriately and easily corrected according to a use condition of the microscope apparatus.

Abstract: A microscope apparatus includes a monitoring optical system, an imaging unit capturing an image of an observation target through the monitoring optical system to generate a plurality of images, a correction unit disposed in the optical monitoring system and correcting various aberrations which occur due to an observation condition, and a decision unit deciding a correction amount of the correction unit based on the plurality of images generated by the imaging unit, whereby an image deterioration ascribable to the aberration occurring due to the observation condition in the microscope apparatus is appropriately and easily corrected according to a use condition of the microscope apparatus.

Abstract: An objective lens to be fitted into a fitting hole of a nosepiece of a microscope includes an imaging lens that is composed of a plurality of lens groups, and a lens barrel that holds the imaging lens. The lens barrel is formed with a fitting portion that is fitted to the fitting hole of the nosepiece and provided at an outer circumference of a tip portion side away by a given distance from the tip portion where a first lens group in the imaging lens is held, and a mount surface that comes into contact with a contact surface of the fitting hole of the nosepiece upon fitting at the fitting portion. The nosepiece is equipped with the objective lens. The inverted microscope is equipped with the nosepiece fitting the objective lens.

Abstract: An environment holding apparatus includes: a first chamber that has an opening and holds a sample; a moving stage that is two-dimensionally moved with the first chamber being mounted thereon; and a first plane that includes an introduction port having a function of introducing gas adjusted to predetermined conditions into the first chamber from a pipe, and that is provided so as to cover the opening of the first chamber. The first plane is provided so as to be kept stationary regardless of a movement of the moving stage and the opening of the first chamber is two-dimensionally moved along the first plane by the movement of the moving stage.

Abstract: A microscope apparatus includes a monitoring optical system, an imaging unit capturing an image of an observation target through the monitoring optical system to generate a plurality of images, a correction unit disposed in the optical monitoring system and correcting various aberrations which occur due to an observation condition, and a decision unit deciding a correction amount of the correction unit based on the plurality of images generated by the imaging unit, whereby an image deterioration ascribable to the aberration occurring due to the observation condition in the microscope apparatus is appropriately and easily corrected according to a use condition of the microscope apparatus.

Abstract: A microscope for introducing light from a light source via an objective lens to a sample so that a user observes the sample via the objective lens includes: a minute opening arranged in an optical path between the light source and the objective lens and on a focal plane of the image side of the objective lens or at a position conjugate with its conjugate plane; position adjusting means for adjusting the position of the minute opening so that the light from the light source via the minute opening is incident to the sample at the Brewster's angle; an polarizing element arranged in the optical path between the light source and the objective lens for extracting rectilinear polarized light from the light from the light source and applying the rectilinear polarized light to the sample.

Abstract: An AF dark field illumination device and an objective lens are moved in unity. A tissue sample in a Petri dish is illuminated by infrared light incident with an oblique angle from an LED light source. The casting of the infrared light causes scattered light from the tissue sample. A part of the scattered light passes through the objective lens, thereby forming a dark-field microscope image, which is captured by a CCD camera. The sharpness of the dark-field microscope image is dependent upon the position of the objective lens. The position of the objective lens at which the dark-field microscopic image exhibits the highest sharpness is determined to be the focus position.

Abstract: Providing a microscope apparatus including an optical mount member capable of supporting various optical devices even without a large amount of space. A base body 10 arranged on a mount surface 9a of a vibration isolation table 9 is provided substantially perpendicularly to the mount surface 9a. A plurality of rails 32 through 36 are provided on the base body 31 vertically to the mount surface 9a so as to provide a plurality of extension optical devices such as a Galvanic scanner 64 to be combined with the microscope main body 10.

Abstract: A microscope for introducing light from a light source via an objective lens to a sample so that a user observes the sample via the objective lens includes: a minute opening arranged in an optical path between the light source and the objective lens and on a focal plane of the image side of the objective lens or at a position conjugate with its conjugate plane; position adjusting means for adjusting the position of the minute opening so that the light from the light source via the minute opening is incident to the sample at the Brewster's angle; an polarizing element arranged in the optical path between the light source and the objective lens for extracting rectilinear polarized light from the light from the light source and applying the rectilinear polarized light to the sample.

Abstract: An objective lens to be fitted into a fitting hole of a nosepiece of a microscope includes an imaging lens that is composed of a plurality of lens groups, and a lens barrel that holds the imaging lens. The lens barrel is formed with a fitting portion that is fitted to the fitting hole of the nosepiece and provided at an outer circumference of a tip portion side away by a given distance from the tip portion where a first lens group in the imaging lens is held, and a mount surface that comes into contact with a contact surface of the fitting hole of the nosepiece upon fitting at the fitting portion. The nosepiece is equipped with the objective lens. The inverted microscope is equipped with the nosepiece fitting the objective lens.

Abstract: Providing a microscope apparatus including an optical mount member capable of supporting various optical devices even without a large amount of space. A base body 10 arranged on a mount surface 9a of a vibration isolation table 9 is provided substantially perpendicularly to the mount surface 9a. A plurality of rails 32 through 36 are provided on the base body 31 vertically to the mount surface 9a so as to provide a plurality of extension optical devices such as a Galvanic scanner 64 to be combined with the microscope main body 10.

Abstract: Providing a space-and-energy-saving environment maintaining apparatus for a microscope. A first chamber 2 forms an enclosed space and houses a stage 3 that supports a specimen 23, an objective lens 5, 105 that changes divergent light from the specimen 23 on the stage 3 into parallel light, and a focusing apparatus 4 attached to the stage 3 allowing the objective lens 5, 105 to move along the direction of its optical axis. A plane parallel glass plate 121 is provided on the first chamber 2 to transmit the parallel light to the outside.

Abstract: An environment holding apparatus includes: a first chamber that has an opening and holds a sample; a moving stage that is two-dimensionally moved with the first chamber being mounted thereon; and a first plane that includes an introduction port having a function of introducing gas adjusted to predetermined conditions into the first chamber from a pipe, and that is provided so as to cover the opening of the first chamber. The first plane is provided so as to be kept stationary regardless of a movement of the moving stage and the opening of the first chamber is two-dimensionally moved along the first plane by the movement of the moving stage.

Abstract: An AF dark field illumination device and an objective lens are moved as the unity. A tissue sample in a petri dish is illuminated by infrared light incident with an oblique angle from an LED light source. The casting of the infrared light causes scattered light from the tissue sample. A part of the scattered light passes through the objective lens, thereby forming a dark-field microscopic image, which is captured by a CCD camera. The sharpness of the dark-field microscopic image is dependent upon the position of the objective lens. The position of the objective lens at which the dark-field microscopic image exhibits the highest sharpness is determined to be the focus position.

Abstract: An inverted microscope has a microscope base, a stage, an observation optical system, a stage support structure which is arranged on the microscope base and supports the stage, and a switching structure having a plurality of objective lenses and capable of inserting one of the objective lenses into an optical path of the observation optical system selectively. A support structure is fixed to a lower surface of the stage and supports the switching structure for movement in an optical axis direction of the objective lens inserted in the optical path of the observation optical system.

Abstract: A microscope turret assembly and a microscope with the turret assembly are provided so that active use is made of the space formed on an underside surface of a turret by providing an illuminator or an optical detector therein. The turret retains multiple objective lenses and, by rotation thereof, enables the selection of a single objective lens. At least a part of an illuminator that casts light on an observed specimen via the selected objective lens, or a part of an optical detector that detects light from an observed specimen, is located in the space.

Abstract: An inverted microscope has a microscope base, a stage, an observation optical system having an objective lens, a stage support member which is arranged on the microscope base and supports the stage at two ends, and a change member which can change the level position of the stage with respect to the microscope base.

Abstract: A microscope turret assembly and a microscope with the turret assembly are provided so that active use is made of the space formed on an underside surface of a turret by providing an illuminator or an optical detector therein. The turret retains multiple objective lenses and, by rotation thereof, enables the selection of a single objective lens. At least a part of an illuminator that casts light on an observed specimen via the selected objective lens, or a part of an optical detector that detects light from an observed specimen, is located in the space.

Abstract: An inverted microscope capable of confirming a marking or the like on an objective lens arranged under a stage from a normal viewpoint near an eyepiece without having to take a forced posture. The inverted microscope has a main body, a stage on the main body which holds a sample container, a nosepiece arranged under the stage, an objective lens fitted on the nosepiece, an eyepiece located diagonally above the stage, and an illumination system held over the stage by an illumination column. The stage has a confirmation opening, which is used for confirming conditions under the stage, and an observation opening, which is used to observe the sample. The confirmation opening is formed closer to the observer side of the optical axis of the objective lens than the observation opening, and is formed separately from the observation opening. The confirmation opening secures an optical path to view and observe the objective lens from a normal viewpoint near the eyepiece.