Abstract: A complex particle measurement apparatus comprising a first light source that irradiates a first storage cell; a photodetector that detects intensity of light; a second light source that irradiates a second storage cell; an imaging unit that images a particle group; an image data output unit that outputs image data; a supporter that supports the first storage cell and the second storage cell; and a communication pipe that connects the first storage cell and the second storage cell to pass a sample solution, wherein the first storage cell and the second storage cell have bottom surfaces located at positions different from each other, and the communication pipe is laid such that a channel from the first storage cell to the second storage cell has an incline of not less than 0 or not more than 0.

Abstract: The present invention is one that makes it possible to facilitate the assembly of an optical measurement cell, as well as shorten optical path length without taking account of handling of a spacer, and an optical measurement cell 2 including a pair of light transmitting plates 21 and 22 respectively having opposite surfaces 21a and 22a facing each other and containing test liquid X between the pair of opposite surfaces 21a and 22a of the pair of light transmitting plates 21 and 22. In addition, one 21a of the opposite surfaces 21a and 22a is formed with a spacer film 25 that contacts with the other opposite surface 22a to define the distance between the pair of opposite surfaces 21a and 22a.

Abstract: The present invention is one that makes it possible to facilitate the assembly of an optical measurement cell, as well as shorten optical path length without taking account of handling of a spacer, and an optical measurement cell 2 including a pair of light transmitting plates 21 and 22 respectively having opposite surfaces 21a and 22a facing each other and containing test liquid X between the pair of opposite surfaces 21a and 22a of the pair of light transmitting plates 21 and 22. In addition, one 21a of the opposite surfaces 21a and 22a is formed with a spacer film 25 that contacts with the other opposite surface 22a to define the distance between the pair of opposite surfaces 21a and 22a.

Abstract: In order to introduce a sample X into a particle size distribution measuring apparatus 200 while neither using a large amount of liquid nor leaving the sample X, a sample introduction system that introduces the sample X into the particle size distribution measuring apparatus 200 that measures the particle size distribution of the sample X is adapted to include: a sample load part 20 that has a load space S into which the sample X is loaded, and a lead-out port 20a adapted to lead out the sample X loaded into the load space S; and a liquid supply mechanism 50 adapted to, into the load space S, supply liquid that is mixed with the sample X and provided in order to measure the particle size distribution. In addition, the sample introduction system is also adapted such that the liquid supplied by the liquid supply mechanism 50 is conducted to the lead-out port 20a while circulating along an inner circumferential surface 24 forming the load space S of the sample load part 20.

Abstract: In order to introduce a sample X into a particle size distribution measuring apparatus 200 while neither using a large amount of liquid nor leaving the sample X, a sample introduction system that introduces the sample X into the particle size distribution measuring apparatus 200 that measures the particle size distribution of the sample X is adapted to include: a sample load part 20 that has a load space S into which the sample X is loaded, and a lead-out port 20a adapted to lead out the sample X loaded into the load space S; and a liquid supply mechanism 50 adapted to, into the load space S, supply liquid that is mixed with the sample X and provided in order to measure the particle size distribution. In addition, the sample introduction system is also adapted such that the liquid supplied by the liquid supply mechanism 50 is conducted to the lead-out port 20a while circulating along an inner circumferential surface 24 forming the load space S of the sample load part 20.