Patents by Inventor Takashi KUSAKAI

Takashi KUSAKAI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10060834
    Abstract: A failure prediction apparatus includes a state feature amount acquisition unit that acquires plural state feature amounts indicating features of an operating state of an apparatus to be monitored, a statistic acquisition unit that acquires statistics of an environmental physical amount indicating an installation environment of the apparatus to be monitored for a specific period, and a calculation unit that acquires a selection condition corresponding to the statistics acquired by the statistic acquisition unit among plural selection conditions, and calculates probability of a failure occurring in the apparatus to be monitored, using the state feature amount satisfying the acquired selection condition, wherein the plural selection conditions are predetermined for each category of the statistics, and are conditions for selecting each of the state feature amounts required to calculate the probability of the failure occurring in the apparatus to be monitored.
    Type: Grant
    Filed: May 4, 2015
    Date of Patent: August 28, 2018
    Assignee: FUJI XEROX CO., LTD.
    Inventors: Norikazu Yamada, Takashi Kusakai
  • Publication number: 20160116375
    Abstract: A failure prediction apparatus includes a state feature amount acquisition unit that acquires plural state feature amounts indicating features of an operating state of an apparatus to be monitored, a statistic acquisition unit that acquires statistics of an environmental physical amount indicating an installation environment of the apparatus to be monitored for a specific period, and a calculation unit that acquires a selection condition corresponding to the statistics acquired by the statistic acquisition unit among plural selection conditions, and calculates probability of a failure occurring in the apparatus to be monitored, using the state feature amount satisfying the acquired selection condition, wherein the plural selection conditions are predetermined for each category of the statistics, and are conditions for selecting each of the state feature amounts required to calculate the probability of the failure occurring in the apparatus to be monitored.
    Type: Application
    Filed: May 4, 2015
    Publication date: April 28, 2016
    Inventors: Norikazu YAMADA, Takashi KUSAKAI