Patents by Inventor Takashi Muramatsu
Takashi Muramatsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240146033Abstract: A laser device includes a support, a first heat sink, a plurality of laser light sources attached to the support, and a plurality of electrodes bridged between the plurality of laser light sources and the first heat sink. Each of the plurality of laser light sources is movable with respect to the support. Each of the plurality of electrodes is electrically connected to one of the plurality of laser light sources at a first connection portion, and is thermally connected to the first heat sink at a second connection portion. In each of the plurality of electrodes, an extension part between the first connection portion and the second connection portion has flexibility, and a length of the extension part is larger than a linear distance between the first connection portion and the second connection portion.Type: ApplicationFiled: February 10, 2022Publication date: May 2, 2024Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Yuma HATANO, Takashi SEKINE, Yuki MURAMATSU, Yoshinori TAMAOKI
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Publication number: 20240142682Abstract: A light absorption anisotropic layer which has a high S/N ratio for generating polarized light with respect to rays in an infrared wavelength region, is lightweight, and has excellent handleability, a laminate, and a sensor system including the light absorption anisotropic layer or the laminate. The light absorption anisotropic layer contains a dichroic coloring agent having a maximal absorption at a wavelength of 700 to 1500 nm, in which an average absorbance at a wavelength of 850 nm is 0.24 to 0.50 and a thickness is 5 ?m or less.Type: ApplicationFiled: October 4, 2023Publication date: May 2, 2024Applicant: FUJIFILM CorporationInventors: Mayumi NOJIRI, Ayako MURAMATSU, Naoya SHIBATA, Yuki HIRAI, Ryoji HIMENO, Shinichi MORISHIMA, Takashi KATOU
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Publication number: 20240110970Abstract: Main cells that constitute a semiconductor element having a trench gate structure include first cells, and second cells having a structure in which gate insulating films are more easily broken by energization than those in the first cells, and the number of which is smaller than that of the first cells. At a time of driving the semiconductor element, a common gate drive voltage is applied to gate electrodes of the first cells and the second cells. An electrical characteristic is measured to detect failure of the second cells due to energization at the time of driving. The gate electrodes of the failed second cells are electrically isolated from the gate electrodes of the first cells so that the gate drive voltage is not applied to the failed second cells. The failure of the first cells is predicted based on the failure of the second cells.Type: ApplicationFiled: December 13, 2023Publication date: April 4, 2024Applicant: DENSO CORPORATIONInventors: Masataka DEGUCHI, Junya MURAMATSU, Keita KATAOKA, Katsuhiro KUTSUKI, Isao AOYAGI, Takashi TOMINAGA, Ryosuke OKACHI, Takashi KOHYAMA
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Publication number: 20240106182Abstract: Disclosed is a laser medium unit that includes a laser medium and a holding body. The laser medium has a pair of end surfaces. The holding body surrounds the laser medium when viewed form a direction intersecting with the pair of end surfaces and holds the laser medium. The holding body includes a deformation allowing portion that extends from the inside to the outside of the holding body when viewed from the direction intersecting with the pair of end surfaces. The laser medium and the holding body are in contact with each other. A contact region of the holding body with the laser medium has a width in the direction intersecting with the pair of end surfaces and extends along a side surface of the laser medium when viewed from the direction intersecting with the pair of end surfaces.Type: ApplicationFiled: February 3, 2022Publication date: March 28, 2024Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Yuki MURAMATSU, Takashi SEKINE, Yuma HATANO, Yoshinori TAMAOKI, Masateru KURATA
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Patent number: 11920257Abstract: A method of evaluating cleanliness of a member having a silicon carbide surface, the method including bringing the silicon carbide surface into contact with a mixed acid of hydrofluoric acid, hydrochloric acid and nitric acid; concentrating the mixed acid brought into contact with the silicon carbide surface by heating; subjecting a sample solution obtained by diluting a concentrated liquid obtained by the concentration to quantitative analysis of metal components by Inductively Coupled Plasma-Mass Spectrometry; and evaluating cleanliness of the member having a silicon carbide surface on the basis of a quantitative result of metal components obtained by the quantitative analysis.Type: GrantFiled: August 3, 2021Date of Patent: March 5, 2024Assignee: SUMCO CORPORATIONInventors: Takashi Muramatsu, Hirokazu Kato
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Patent number: 11860037Abstract: An interferometer movable mirror position measurement apparatus for determining a position of a movable mirror of an interferometer. The interferometer movable mirror position measurement apparatus including: a laser light source; a phase separation optical system configured to make first light and second light separately detected; a signal conversion unit configured to detect the first light and the second light in synchronization with a position of a movable mirror to generate a first sinusoidal wave signal and a second sinusoidal wave signal, respectively; a phase calculation unit configured to perform normalization and phase difference correction on each of the first sinusoidal wave signal and the second sinusoidal wave signal, and then calculate a phase of the first sinusoidal wave signal or the second sinusoidal wave signal at each time point; and a movable mirror position determination unit configured to determine a position of the movable mirror at a predetermined time point.Type: GrantFiled: September 3, 2018Date of Patent: January 2, 2024Assignee: SHIMADZU CORPORATIONInventor: Takashi Muramatsu
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Patent number: 11768154Abstract: A Fourier transform infrared spectrophotometer includes a main interfersometer, a control interferometer, an infrared detector, a control light detector, and a beam splitter block. The beam splitter block is disposed between a beam splitter and the control light detector. The control light detector has an optical axis inclined with respect to an optical axis of a control interference light beam.Type: GrantFiled: February 14, 2022Date of Patent: September 26, 2023Assignee: Shimadzu CorporationInventors: Hideaki Katsu, Takashi Muramatsu, Hiromasa Maruno, Naoji Moriya
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Publication number: 20230170168Abstract: A sensor includes: a receptacle connectable to an external plug; a second housing accommodating at least part of the receptacle; a main substrate on which an electronic component used for sensing is mounted; a shield film covering at least part of the main substrate and shielding an electromagnetic wave emitted from the main substrate and/or an electromagnetic wave to penetrate the main substrate from the outside; a first housing accommodating at least part of the main substrate and at least part of the shield film; a flexible substrate connecting the main substrate and the receptacle; and a protection member abutting on an end of the shield film from the side opposite to the main substrate, the end of the shield film facing the flexible substrate.Type: ApplicationFiled: March 2, 2021Publication date: June 1, 2023Applicant: OMRON CorporationInventors: Yukitaka KISHIMOTO, Yusuke NAKAYAMA, Yuki USHIRO, Takashi MURAMATSU, Naoki NISHIMORI
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Patent number: 11421342Abstract: Provided is a method of decomposing a quartz sample, which includes contacting a liquid in which at least a part of a quartz sample to be analyzed is immersed with a gas generated from a mixed acid to decompose at least a part of the quartz sample, wherein the liquid is a liquid containing at least water; and the mixed acid is a mixed acid of hydrogen fluoride and sulfuric acid, and a mole fraction of sulfuric acid in the mixed acid ranges from 0.07 to 0.40.Type: GrantFiled: December 7, 2017Date of Patent: August 23, 2022Assignee: SUMCO CORPORATIONInventors: Hirokazu Kato, Takashi Muramatsu
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Publication number: 20220260485Abstract: A Fourier transform infrared spectrophotometer includes a main interfersometer, a control interferometer, an infrared detector, a control light detector, and a beam splitter block. The beam splitter block is disposed between a beam splitter and the control light detector. The control light detector has an optical axis inclined with respect to an optical axis of a control interference light beam.Type: ApplicationFiled: February 14, 2022Publication date: August 18, 2022Inventors: Hideaki KATSU, Takashi MURAMATSU, Hiromasa MARUNO, Naoji MORIYA
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Publication number: 20210363660Abstract: A method of evaluating cleanliness of a member having a silicon carbide surface, the method including bringing the silicon carbide surface into contact with a mixed acid of hydrofluoric acid, hydrochloric acid and nitric acid; concentrating the mixed acid brought into contact with the silicon carbide surface by heating; subjecting a sample solution obtained by diluting a concentrated liquid obtained by the concentration to quantitative analysis of metal components by Inductively Coupled Plasma-Mass Spectrometry; and evaluating cleanliness of the member having a silicon carbide surface on the basis of a quantitative result of metal components obtained by the quantitative analysis.Type: ApplicationFiled: August 3, 2021Publication date: November 25, 2021Applicant: SUMCO CORPORATIONInventors: Takashi MURAMATSU, Hirokazu KATO
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Patent number: 11118285Abstract: Provided is a method of evaluating cleanliness of a member having a silicon carbide surface, the method including bringing the silicon carbide surface into contact with a mixed acid of hydrofluoric acid, hydrochloric acid and nitric acid; concentrating the mixed acid brought into contact with the silicon carbide surface by heating; subjecting a sample solution obtained by diluting a concentrated liquid obtained by the concentration to quantitative analysis of metal components by Inductively Coupled Plasma-Mass Spectrometry; and evaluating cleanliness of the member having a silicon carbide surface on the basis of a quantitative result of metal components obtained by the quantitative analysis.Type: GrantFiled: February 28, 2017Date of Patent: September 14, 2021Assignee: SUMCO CORPORATIONInventors: Takashi Muramatsu, Hirokazu Kato
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Publication number: 20210190590Abstract: An interferometer movable mirror position measurement apparatus for determining a position of a movable mirror of an interferometer. The interferometer movable mirror position measurement apparatus including: a laser light source; a phase separation optical system configured to make first light and second light separately detected; a signal conversion unit configured to detect the first light and the second light in synchronization with a position of a movable mirror to generate a first sinusoidal wave signal and a second sinusoidal wave signal, respectively; a phase calculation unit configured to perform normalization and phase difference correction on each of the first sinusoidal wave signal and the second sinusoidal wave signal, and then calculate a phase of the first sinusoidal wave signal or the second sinusoidal wave signal at each time point; and a movable mirror position determination unit configured to determine a position of the movable mirror at a predetermined time point.Type: ApplicationFiled: September 3, 2018Publication date: June 24, 2021Applicant: SHIMADZU CORPORATIONInventor: Takashi MURAMATSU
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Publication number: 20210033528Abstract: A gas absorption spectroscopic device is provided with a laser light source with a variable wavenumber 113, a photodetector 114 for detecting intensity of laser light emitted from the laser light source with a variable wavenumber and passed through a measurement target gas, and a laser driver 112 for supplying a driving current to the laser light source with a variable wavenumber 113 to repeatedly sweep the laser light at a predetermined wavenumber range. The gas absorption spectroscopic device is further provided with a pressure-related value acquisition means 117 for acquiring a pressure-related value which is a value of the pressure of the measurement target gas or a value varying in synchronism with the pressure, and a control means 131 for controlling the laser driver 112 to vary a wavenumber range for performing the sweep depending on the pressure-related value are provided.Type: ApplicationFiled: January 15, 2019Publication date: February 4, 2021Inventors: Hideaki KATSU, Takashi MURAMATSU,, Naoki MATSUDA, Naoji MORIYA
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Publication number: 20200400503Abstract: Provided is a fixed mirror unit capable of adjusting the inclination of a reflection surface and moving the reflection surface in a direction intersecting with the reflection surface with a simple configuration, an interferometer equipped with the fixed mirror unit, and a Fourier transform spectrophotometer. The fixed mirror unit 8 is provided with a plurality of actuators 83 for axially displacing the mirror 87. By displacing the mirror 87 by different amounts of displacements with the plurality of actuators 83, the angle of the reflection surface 87A can be adjusted, while by displacing the mirror 87 by the same amount of displacement with the plurality of actuators 83, the reflection surface 87A can be moved while keeping the angle of the reflection surface 87A constant. As a result, with a simple configuration, the angle of the reflection surface 87A can be adjusted and the reflection surface 87A can be moved along the axial direction.Type: ApplicationFiled: June 21, 2019Publication date: December 24, 2020Inventors: Hiromasa MARUNO, Naoji MORIYA, Toyoyuki HASHIMOTO, Takashi MURAMATSU, Hideaki KATSU
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Publication number: 20200400504Abstract: Provided is a fixed mirror unit capable of adjusting the inclination of a reflection surface and moving the reflection surface in a direction intersecting with the reflection surface with a simple configuration, an interferometer equipped with the fixed mirror unit, and a Fourier transform spectrophotometer. The fixed mirror unit 8 is provided with a plurality of actuators 83 for axially displacing the mirror 87. By displacing the mirror 87 by different amounts of displacements with the plurality of actuators 83, the angle of the reflection surface 87A can be adjusted, while by displacing the mirror 87 by the same amount of displacement with the plurality of actuators 83, the reflection surface 87A can be moved while keeping the angle of the reflection surface 87A constant. As a result, with a simple configuration, the angle of the reflection surface 87A can be adjusted and the reflection surface 87A can be moved along the axial direction.Type: ApplicationFiled: June 24, 2019Publication date: December 24, 2020Inventors: Hiromasa MARUNO, Naoji MORIYA, Toyoyuki HASHIMOTO, Takashi MURAMATSU, Hideaki KATSU
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Patent number: 10661581Abstract: An ink jet recording apparatus contains a conveyer which conveys a recording medium, the conveyer having conveyance members on which the recording medium is mounted; a recorder which jets ink onto the recording medium being conveyed; and a fixer which fixes the ink landed on the recording medium. The ink is curable by a predetermined energy ray. The fixer irradiates the ink on the recording medium with the predetermined energy ray. The conveyer passes the recording medium for conveyance between the conveyance members and moves the recording medium in respective planes by movement of the conveyance members.Type: GrantFiled: May 11, 2017Date of Patent: May 26, 2020Assignee: KONICA MINOLTA, INC.Inventors: Takashi Muramatsu, Mitsuo Kaburagi, Masashi Ikeda
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Patent number: 10551234Abstract: A thermal type flow meter includes a first resistor (R1) is disposed along a flow path through which a fluid flows, generating heat when a current is applied, and outputting a first output signal indicating a heat generation temperature, a second resistor (R2) disposed at a position different from that of the first resistor along the flow path and outputting a second output signal indicating a temperature of the fluid, and a current application unit configured to apply a current to the first resistor so that the first output signal indicates a predetermined temperature. A parameter for converting the difference between the first output signal and the second output signal when a predetermined input is received if the current is applied into a target value is determined. The flow rate is acquired using the parameter, the difference detected after the parameter is determined, and a predetermined function.Type: GrantFiled: December 13, 2017Date of Patent: February 4, 2020Assignee: OMRON CorporationInventor: Takashi Muramatsu
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Publication number: 20190368071Abstract: Provided is a method of decomposing a quartz sample, which includes contacting a liquid in which at least a part of a quartz sample to be analyzed is immersed with a gas generated from a mixed acid to decompose at least a part of the quartz sample, wherein the liquid is a liquid containing at least water; and the mixed acid is a mixed acid of hydrogen fluoride and sulfuric acid, and a mole fraction of sulfuric acid in the mixed acid ranges from 0.07 to 0.40.Type: ApplicationFiled: December 7, 2017Publication date: December 5, 2019Applicant: SUMCO CORPORATIONInventors: Hirokazu KATO, Takashi MURAMATSU
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Publication number: 20190186993Abstract: In the voice coil motor and the interference spectrophotometer according to the invention, the angular deviation between the movable and fixed mirrors can always be suppressed to one second or less. The voice coil motor is provided with: a static unit 71 including a yoke 73 having a cylindrical part 73a fixed to the static unit 71 and a magnet 74 disposed in the cylindrical part 73a fixed to the static unit 71; a movable unit 72 including a circular coil 72b fixed thereto, the circular coil 72b disposed between the cylindrical part 73a of the yoke 73 and the magnet 74; and a power supply line 72c for connecting the coil 72b to a power supply.Type: ApplicationFiled: June 7, 2017Publication date: June 20, 2019Inventors: Hiromasa MARUNO, Naoji MORIYA, Toyoyuki HASHIMOTO, Takashi MURAMATSU, Hideaki KATSU