Patents by Inventor Takashi Niida

Takashi Niida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6726739
    Abstract: The present invention provides a pre-treatment apparatus for an analytical metal sample, the apparatus including (1) a treatment chamber having a sample charging port which can be opened and closed and provided at the top of the chamber, a sample discharging port which can be opened and closed and provided at the bottom of the chamber, and a gas inlet and gas outlet, (2) a sample carrying bar joined to a sample holder also used as a sputtering electrode, and provided to pass through at least one side wall of the treatment chamber so as to be substantially horizontally movable and axially rotatable, and (3) a sputtering counter electrode at least having portions arranged opposite to each other in a region not inhibiting the charge and discharge of an analytical metal sample so that the sample holder can be arranged in the counter electrode.
    Type: Grant
    Filed: July 24, 2002
    Date of Patent: April 27, 2004
    Assignees: JFE Steel Corporation, Japan Analyst Corporation, Ulvac-Phi Incorporated
    Inventors: Kenji Abiko, Hisao Yasuhara, Takashi Niida, Makoto Shimura, Hideo Iwai
  • Publication number: 20030010633
    Abstract: The present invention provides a pre-treatment apparatus for an analytical metal sample, the apparatus including (1) a treatment chamber having a sample charging port which can be opened and closed and provided at the top of the chamber, a sample discharging port which can be opened and closed and provided at the bottom of the chamber, and a gas inlet and gas outlet, (2) a sample carrying bar joined to a sample holder also used as a sputtering electrode, and provided to pass through at least one side wall of the treatment chamber so as to be substantially horizontally movable and axially rotatable, and (3) a sputtering counter electrode at least having portions arranged opposite to each other in a region not inhibiting the charge and discharge of an analytical metal sample so that the sample holder can be arranged in the counter electrode.
    Type: Application
    Filed: July 24, 2002
    Publication date: January 16, 2003
    Inventors: Kenji Abiko, Hisao Yasuhara, Takashi Niida, Makoto Shimura, Hideo Iwai
  • Publication number: 20020017459
    Abstract: A pretreatment method for element analysis of metal samples removes contaminants on the surface of the metal sample by sputtering while at least one electrode for sputtering is cooled. A pretreatment apparatus for element analysis of metal samples for performing the method includes a cathode for holding the metal sample, anodes arranged to counter the cathode for sputtering, and a pretreatment chamber to store the cathode, anodes and metal sample under an inert gas atmosphere. The apparatus includes a cooling device for cooling at least one of the electrodes. The cathode and the anodes may be interchanged in the apparatus.
    Type: Application
    Filed: May 29, 2001
    Publication date: February 14, 2002
    Applicant: Kawasaki Steel Corporation
    Inventors: Hisao Yasuhara, Makoto Shimura, Kenji Abiko, Hideo Iwai, Takashi Niida