Patents by Inventor Takashi Omichi

Takashi Omichi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7708618
    Abstract: A polishing apparatus includes an arrangement of a plurality of units to deal with various operations and a robot having at least one arm. The plurality of units are disposed around the robot and include a loading unit for receiving thereon a, e.g. dry, workpiece to be polished, a polishing system including at least one polishing unit for polishing the workpiece, a washing system and a drying system at least including one washing unit for washing and drying the polished workpiece, and an unloading unit for receiving thereon a resultant clean and dry polished workpiece.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: May 4, 2010
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Hiromi Yajima, Yukio Imoto, Shoichi Kodama, Riichiro Aoki, Takashi Omichi, Toyomi Nishi, Tetsuji Togawa
  • Publication number: 20080166949
    Abstract: A polishing apparatus includes an arrangement of a plurality of units to deal with various operations and a robot having at least one arm. The plurality of units are disposed around the robot and include a loading unit for receiving thereon a, e.g. dry, workpiece to be polished, a polishing system including at least one polishing unit for polishing the workpiece, a washing system and a drying system at least including one washing unit for washing and drying the polished workpiece, and an unloading unit for receiving thereon a resultant clean and dry polished workpiece.
    Type: Application
    Filed: October 31, 2007
    Publication date: July 10, 2008
    Inventors: Hiromi Yajima, Yukio Imoto, Shoichi Kodama, Riichiro Aoki, Takashi Omichi, Toyomi Nishi, Tetsuji Togawa
  • Patent number: 5827110
    Abstract: A polishing facility integrates separate components of polishing such as wafer transport, polishing, cleaning and drying in one standardized facility to provide efficient polishing operation at low cost. The facility is designed to deal with a variety of different types of wafers, including different types of surface film, and is designed also to enables quick and low cost upgrading of the facility to meet advancing requirements of customers. The polishing facility can be placed within a cleanroom to provide efficient handling of polished wafers for further processing and fabrication tasks. Individual work component of polishing is arranged in one block having its own power supply and signal lines, and is controlled by a central controller having a dedicated software program for each work component.
    Type: Grant
    Filed: December 28, 1995
    Date of Patent: October 27, 1998
    Assignees: Kabushiki Kaisha Toshiba, Ebara Corporation
    Inventors: Hiromi Yajima, Yukio Imoto, Shoichi Kodama, Riichiro Aoki, Takashi Omichi, Toyomi Nishi, Tetsuji Togawa