Patents by Inventor Takashi Shimaya

Takashi Shimaya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6563115
    Abstract: A high-density recording scanning microscope in which a beam of charged particles finely focused scans the surface of a sample at a high density of, at least, 8,000 scannings, a signal thus detected is converted into a digital signal, and the digital signal is used for directly printing an image of high definition, high gradation and wide view. The signal of a scanning image at a very high density of, at least, 8,000 pixels×8,000 pixels in a scanning electron microscope, is converted into a digital signal, for example, a color image, and the image is directly printed, thereby to realize the observation of a very clear image of high definition, high gradation and wide view having hitherto been nonexistent.
    Type: Grant
    Filed: December 18, 2000
    Date of Patent: May 13, 2003
    Assignee: Sanyu Denshi Co. Ltd.
    Inventors: Katsuto Goto, Takashi Shimaya, Yutaka Hirano, Hiroyuki Teshima
  • Patent number: 4020343
    Abstract: A scanning electron microscope or other type of scanning electron device incorporating a light pen for automatically changing the field of view of a specimen on a CRT. The output of said light pen controls the center and/or width of the scanning area of the incident electron beam irradiating the specimen when said light pen is directed towards a certain point in the initial specimen field of view on the CRT, thereby displaying said point at the center of the changed field of view on the CRT.
    Type: Grant
    Filed: April 21, 1976
    Date of Patent: April 26, 1977
    Assignee: Nihon Denshi Kabushiki Kaisha
    Inventors: Takashi Shimaya, Takao Namae, Kazuo Ishikawa