Patents by Inventor TAKASHI TOMIZAKI

TAKASHI TOMIZAKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11933746
    Abstract: A device to host a crystallization medium, such as a solution, for crystal growth and a system for X-ray diffraction experiments to determine the atomic structure of crystals. A plurality of cells have a well, a sample holder placed in the well. The solution is hosted in the sample holder between thin-plates or one thin-plate. A cap seals an opening to the cell and each sample holder can be extracted independently from each well. A system for automated X-ray diffraction experiments for small crystals in the sample holder extracted from the wells utilizes an ultrasonic acoustic levitator to determine the crystal structure at atomic resolution. X-ray diffraction images are generated by scanning the X-ray beam over the levitated sample holder along a spiral trajectory by rotating the sample holder and moving in the direction perpendicular to the X-ray beam and the rotation axis at the same time.
    Type: Grant
    Filed: November 16, 2020
    Date of Patent: March 19, 2024
    Assignee: Paul Scherrer Institut
    Inventors: Soichiro Tsujino, Takashi Tomizaki, Michal Kepa
  • Publication number: 20220404296
    Abstract: A device to host a crystallization medium, such as a solution, for crystal growth and a system for X-ray diffraction experiments to determine the atomic structure of crystals. A plurality of cells have a well, a sample holder placed in the well. The solution is hosted in the sample holder between thin-plates or one thin-plate. A cap seals an opening to the cell and each sample holder can be extracted independently from each well. A system for automated X-ray diffraction experiments for small crystals in the sample holder extracted from the wells utilizes an ultrasonic acoustic levitator to determine the crystal structure at atomic resolution. X-ray diffraction images are generated by scanning the X-ray beam over the levitated sample holder along a spiral trajectory by rotating the sample holder and moving in the direction perpendicular to the X-ray beam and the rotation axis at the same time.
    Type: Application
    Filed: November 16, 2020
    Publication date: December 22, 2022
    Inventors: Soichiro Tsujino, Takashi Tomizaki
  • Patent number: 10753888
    Abstract: A method and a system for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images. The method includes the steps: a) ejecting a droplet of fluid comprising single or multiple of crystal into an ultrasonic acoustic levitator; b) levitating the droplet of fluid with the crystal in the ultrasonic acoustic levitator; b) monitoring the position and the spinning of the droplet with a visualization apparatus; c) applying X-ray to the crystal, the X-ray stemming from an X-ray source; and d) detecting the X-ray diffraction images from the crystal irradiated by the X-ray source by an X-ray detector being capable to capture two dimensional diffraction patterns.
    Type: Grant
    Filed: October 28, 2016
    Date of Patent: August 25, 2020
    Assignee: Paul Scherrer Institut
    Inventors: Takashi Tomizaki, Soichiro Tsujino
  • Publication number: 20180348149
    Abstract: A method and a system for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images. The method includes the steps: a) ejecting a droplet of fluid comprising single or multiple of crystal into an ultrasonic acoustic levitator; b) levitating the droplet of fluid with the crystal in the ultrasonic acoustic levitator; b) monitoring the position and the spinning of the droplet with a visualization apparatus; c) applying X-ray to the crystal, the X-ray stemming from an X-ray source; and d) detecting the X-ray diffraction images from the crystal irradiated by the X-ray source by an X-ray detector being capable to capture two dimensional diffraction patterns.
    Type: Application
    Filed: October 28, 2016
    Publication date: December 6, 2018
    Inventors: TAKASHI TOMIZAKI, SOICHIRO TSUJINO