Patents by Inventor Takashi Yabuta

Takashi Yabuta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11414514
    Abstract: The present invention aims to provide a method of producing a polyether polyol having a low aldehyde content, the method including simpler steps; and a method of producing polyurethane foam having a reduced amount of aldehyde volatilization. The present invention provides a method of producing a polyether polyol (F) including step (1) of obtaining a crude polyether polyol composition (D2) having a pH higher than 5.0 by contact of a crude polyether polyol composition (D1) containing a polyether polyol (A) with an acid catalyst (B) in the presence of water, the polyether polyol (A) being obtainable by ring-opening polymerization of an alkylene oxide with an active hydrogen compound; and step (2) of removing a volatile component containing an aldehyde (C) after step (1).
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: August 16, 2022
    Assignee: SANYO CHEMICAL INDUSTRIES, LTD.
    Inventors: Erika Nobukuni, Takashi Yabuta
  • Publication number: 20220037167
    Abstract: A substrate processing apparatus includes: at least one processing part for etching a polysilicon film or an amorphous silicon film formed on a substrate using an alkaline chemical liquid; a reservoir configured to recover and store the chemical liquid used in the at least one processing part; processing lines configured to supply the chemical liquid stored in the reservoir to the at least one processing part; a circulation line configured to take out the chemical liquid from the reservoir and to return the same to the reservoir; and a first gas supply line connected to the circulation line and configured to supply an inert gas to the circulation line. The circulation line includes an ejection port configured to eject a mixed fluid of the inert gas supplied by the first gas supply line and the chemical liquid taken out from the reservoir into the chemical liquid stored in the reservoir.
    Type: Application
    Filed: July 26, 2021
    Publication date: February 3, 2022
    Inventors: Takashi YABUTA, Hidetoshi NAKAO, Masatoshi KASAHARA, Daisuke SAIKI
  • Patent number: 10748790
    Abstract: A substrate processing apparatus includes a holding device that holds a substrate horizontally, a rotation device that rotates the holding device such that the substrate held by the holding device is rotated, a supply device that includes a nozzle and supplies etching liquid from the nozzle to the substrate held by the holding device, a movement device that moves the nozzle with respect to the substrate held by the holding device, and a control device including circuitry that executes a scan process in which the circuitry controls the rotation, movement and supply devices such that while the liquid is supplied from the nozzle to the substrate, the nozzle is moved back and forth over the substrate between first and second positions on outer peripheral side of the substrate relative to the first position. The circuit of the control device executes the scan process multiple times while changing the first position.
    Type: Grant
    Filed: February 28, 2018
    Date of Patent: August 18, 2020
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Hiroyuki Suzuki, Takashi Yabuta, Jun Nonaka
  • Publication number: 20190309120
    Abstract: The present invention aims to provide a method of producing a polyether polyol having a low aldehyde content, the method including simpler steps; and a method of producing polyurethane foam having a reduced amount of aldehyde volatilization. The present invention provides a method of producing a polyether polyol (F) including step (1) of obtaining a crude polyether polyol composition (D2) having a pH higher than 5.0 by contact of a crude polyether polyol composition (D1) containing a polyether polyol (A) with an acid catalyst (B) in the presence of water, the polyether polyol (A) being obtainable by ring-opening polymerization of an alkylene oxide with an active hydrogen compound; and step (2) of removing a volatile component containing an aldehyde (C) after step (1).
    Type: Application
    Filed: December 28, 2017
    Publication date: October 10, 2019
    Applicant: SANYO CHEMICAL INDUSTRIES, LTD.
    Inventors: Erika NOBUKUNI, Takashi YABUTA
  • Patent number: 10236192
    Abstract: A liquid processing apparatus of the present disclosure holds and rotate a substrate in a substrate holding unit, ejects an etching liquid while moving a main nozzle of a main nozzle unit between a first position where the etching liquid reaches a center of the substrate and a second position closer to a peripheral side of the substrate than the first position, and then, ejects the etching liquid to the substrate from a sub nozzle provided at a third position closer to the peripheral side of the substrate than the first position at an ejection flow rate higher than that from the main nozzle.
    Type: Grant
    Filed: November 20, 2014
    Date of Patent: March 19, 2019
    Assignee: Tokyo Electron Limited
    Inventors: Jun Nonaka, Shogo Mizota, Tatsuya Nagamatsu, Daisuke Saiki, Kazuhiro Teraoka, Takashi Yabuta
  • Publication number: 20180254199
    Abstract: A substrate processing apparatus includes a holding device that holds a substrate horizontally, a rotation device that rotates the holding device such that the substrate held by the holding device is rotated, a supply device that includes a nozzle and supplies etching liquid from the nozzle to the substrate held by the holding device, a movement device that moves the nozzle with respect to the substrate held by the holding device, and a control device including circuitry that executes a scan process in which the circuitry controls the rotation, movement and supply devices such that while the liquid is supplied from the nozzle to the substrate, the nozzle is moved back and forth over the substrate between first and second positions on outer peripheral side of the substrate relative to the first position. The circuit of the control device executes the scan process multiple times while changing the first position.
    Type: Application
    Filed: February 28, 2018
    Publication date: September 6, 2018
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Hiroyuki SUZUKI, Takashi YABUTA, Jun NONAKA
  • Patent number: 9862007
    Abstract: Disclosed are a substrate liquid processing apparatus and method for performing a liquid processing on a substrate using a processing liquid, and a computer-readable recording medium with a substrate liquid processing program recorded therein. In the method, a first chemical liquid supply step is performed to supply a first chemical liquid from a first chemical liquid supply unit to a processing liquid storage unit, a first chemical liquid purifying step is performed to purify the first chemical liquid in a chemical liquid purifying unit, a second chemical liquid supply step is performed to supply a second chemical liquid from a second chemical liquid supply unit to the processing liquid storage unit, and a processing liquid supply step is performed to supply the processing liquid obtained by mixing the first and second chemical liquids from the processing liquid supply unit to substrate liquid processing units.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: January 9, 2018
    Assignee: Tokyo Electron Limited
    Inventors: Daisuke Saiki, Shogo Mizota, Takashi Yabuta, Jun Nonaka, Tatsuya Nagamatsu, Koji Tanaka, Tomiyasu Maezono
  • Patent number: 9192878
    Abstract: A liquid processing apparatus and a chemical liquid collecting method can suppress corrosion of wirings formed on a substrate. The liquid processing apparatus includes a processing unit configured to perform a liquid process by supplying a chemical liquid to a substrate; a collecting line configured to collect the chemical liquid supplied to the processing unit; a supply line configured to supply the collected chemical liquid to the processing unit; and a gas supply unit configured to supply an inert gas into the collecting line.
    Type: Grant
    Filed: December 27, 2013
    Date of Patent: November 24, 2015
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Shogo Mizota, Takashi Yabuta, Tatsuya Nagamatsu, Daisuke Saiki
  • Publication number: 20150273538
    Abstract: Disclosed are a substrate liquid processing apparatus and method for performing a liquid processing on a substrate using a processing liquid, and a computer-readable recording medium with a substrate liquid processing program recorded therein. In the method, a first chemical liquid supply step is performed to supply a first chemical liquid from a first chemical liquid supply unit to a processing liquid storage unit, a first chemical liquid purifying step is performed to purify the first chemical liquid in a chemical liquid purifying unit, a second chemical liquid supply step is performed to supply a second chemical liquid from a second chemical liquid supply unit to the processing liquid storage unit, and a processing liquid supply step is performed to supply the processing liquid obtained by mixing the first and second chemical liquids from the processing liquid supply unit to substrate liquid processing units.
    Type: Application
    Filed: March 24, 2015
    Publication date: October 1, 2015
    Inventors: Daisuke Saiki, Shogo Mizota, Takashi Yabuta, Jun Nonaka, Tatsuya Nagamatsu, Koji Tanaka, Tomiyasu Maezono
  • Publication number: 20150147888
    Abstract: A liquid processing apparatus of the present disclosure holds and rotate a substrate in a substrate holding unit, ejects an etching liquid while moving a main nozzle of a main nozzle unit between a first position where the etching liquid reaches a center of the substrate and a second position closer to a peripheral side of the substrate than the first position, and then, ejects the etching liquid to the substrate from a sub nozzle provided at a third position closer to the peripheral side of the substrate than the first position at an ejection flow rate higher than that from the main nozzle.
    Type: Application
    Filed: November 20, 2014
    Publication date: May 28, 2015
    Inventors: Jun Nonaka, Shogo Mizota, Tatsuya Nagamatsu, Daisuke Saiki, Kazuhiro Teraoka, Takashi Yabuta
  • Publication number: 20140377463
    Abstract: Disclosed is a liquid processing method which may de-electrify the surface of a hydrophobized substrate. A substrate electrified according to a liquid processing is de-electrified by supplying a hydrophobizing liquid to a surface of the substrate subjected to the liquid processing while rotating the substrate, and performing rinsing by supplying an alkaline rinsing liquid to the hydrophobized surface of the substrate.
    Type: Application
    Filed: June 6, 2014
    Publication date: December 25, 2014
    Inventors: Yosuke Hachiya, Hisashi Kawano, Mitsunori Nakamori, Jun Nonaka, Shogo Mizota, Tatsuya Nagamatsu, Daisuke Saiki, Kazuhiro Teraoka, Takashi Yabuta
  • Patent number: 8859647
    Abstract: An antistatic resin composition is provided, from which a thermoplastic resin molded article having a sufficient permanent antistatic property without impairing an excellent mechanical property or a good appearance of the molded article, even in a case that the content of an antistatic agent contained in the composition is less than that in a conventional composition, is provided. The antistatic resin composition contains an antistatic agent (A) and a thermoplastic resin (B), in which a melt viscosity ratio of the thermoplastic resin (B) to the antistatic agent (A) at 220° C. is 0.5-5 and an absolute value of a difference between solubility parameters (SPs) of the antistatic agent (A) and the thermoplastic resin (B) is 1.0-3.0. The antistatic resin molded article is obtained by molding the antistatic resin composition.
    Type: Grant
    Filed: July 30, 2010
    Date of Patent: October 14, 2014
    Assignee: Sanyo Chemical Industries, Ltd.
    Inventors: Takashi Yabuta, Hidetoshi Noda, Masanori Hattori
  • Publication number: 20140182455
    Abstract: A liquid processing apparatus and a chemical liquid collecting method can suppress corrosion of wirings formed on a substrate. The liquid processing apparatus includes a processing unit configured to perform a liquid process by supplying a chemical liquid to a substrate; a collecting line configured to collect the chemical liquid supplied to the processing unit; a supply line configured to supply the collected chemical liquid to the processing unit; and a gas supply unit configured to supply an inert gas into the collecting line.
    Type: Application
    Filed: December 27, 2013
    Publication date: July 3, 2014
    Applicant: Tokyo Electron Limited
    Inventors: Shogo Mizota, Takashi Yabuta, Tatsuya Nagamatsu, Daisuke Saiki
  • Patent number: 8475668
    Abstract: Provided are a substrate liquid processing apparatus, a substrate liquid processing method, and a computer readable storage medium having a substrate liquid processing program stored therein that can prevent the occurrence of the electrostatic breakdown caused by the discharge of electric charges in a substrate. The substrate liquid processing apparatus processes a circuit-forming surface of the substrate with a chemical liquid. Furthermore, prior to processing the substrate with the chemical liquid, the substrate liquid processing apparatus performs an anti-static process for an surface opposite to the circuit-forming surface of the substrate by an anti-static liquid, thereby emitting the electric charges on the substrate.
    Type: Grant
    Filed: October 12, 2010
    Date of Patent: July 2, 2013
    Assignee: Tokyo Electron Limited
    Inventors: Hiroshi Tanaka, Teruomi Minami, Yosuke Kawabuchi, Norihiro Ito, Fumihiro Kamimura, Takashi Yabuta, Kazuki Kosai, Takeshi Uno, Kenji Sekiguchi, Yasushi Fujii
  • Patent number: 8308870
    Abstract: Disclosed are a cleaning apparatus and a cleaning method, which can collect a chemical liquid without reducing the throughput after a substrate is subjected to a cleaning treatment and dried by using a drying solvent, such as IPA. The disclosed cleaning apparatus carries out a chemical liquid cleaning treatment, a rinsing treatment, and a drying treatment with IPA, in order, on a wafer W while rotating wafer W, and includes a cleaning liquid supply device for supplying a cleaning liquid for cleaning the drain cup and the drain tube to the drain cup in a state where the cleaning liquid is not supplied to the wafer. Also, the apparatus further includes a control unit for controlling respective components of the cleaning apparatus. The control unit, after the cleaning treatment and then the rinsing treatment of wafer W, at the time when the drying treatment is performed by IPA, controls the cleaning liquid to be supplied to the drain cup.
    Type: Grant
    Filed: November 2, 2009
    Date of Patent: November 13, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Teruomi Minami, Takashi Yabuta, Satoru Tanaka, Hirotaka Maruyama, Kouichi Eguchi
  • Patent number: 8303723
    Abstract: In a liquid processing apparatus configured to remove, from a substrate including a first film and a second film formed above the first film, the first film and the second film, a first chemical-liquid supply part supplies, to a substrate W, a first liquid for dissolving the first film, a second chemical-liquid supply part supplies a second chemical liquid for weakening the second film, and a fluid supply part serving also as an impact giving part gives a physical impact to the second film so as to break the second film and supplies a fluid for washing away debris of the broken second film. A control device controls the respective parts such that, after the second liquid has been supplied and then the fluid has been supplied from the fluid supply part, the first chemical liquid is supplied.
    Type: Grant
    Filed: December 10, 2009
    Date of Patent: November 6, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Teruomi Minami, Fumihiro Kamimura, Kazuki Kosai, Takashi Yabuta, Kenji Yokomizo, Shogo Mizota
  • Publication number: 20120128945
    Abstract: An antistatic resin composition is provided, from which a thermoplastic resin molded article having a sufficient permanent antistatic property without impairing an excellent mechanical property or a good appearance of the molded article, even in a case that the content of an antistatic agent contained in the composition is less than that in a conventional composition, is provided. The antistatic resin composition contains an antistatic agent (A) and a thermoplastic resin (B), in which a melt viscosity ratio of the thermoplastic resin (B) to the antistatic agent (A) at 220° C. is 0.5-5 and an absolute value of a difference between solubility parameters (SPs) of the antistatic agent (A) and the thermoplastic resin (B) is 1.0-3.0. The antistatic resin molded article is obtained by molding the antistatic resin composition.
    Type: Application
    Filed: July 30, 2010
    Publication date: May 24, 2012
    Applicant: SANYO CHEMICAL INDUSTRIES, LTD.
    Inventors: Takashi Yabuta, Hidetoshi Noda, Masanori Hattori
  • Patent number: 8113221
    Abstract: After a rinse process on a wafer W is performed by feeding pure water to the surface of the wafer W at a predetermined flow rate while rotating the wafer W in an approximately horizontal state, a feed amount of the pure water to the wafer W is reduced, and a pure-water feed point is moved outward from the center of the wafer W. In this manner, the wafer W is subjected to a spin dry process while forming a liquid film in a substantially outer region of the pure-water feed point.
    Type: Grant
    Filed: March 8, 2011
    Date of Patent: February 14, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Hiromitsu Nanba, Takashi Yabuta, Takehiko Orii
  • Publication number: 20110155193
    Abstract: After a rinse process on a wafer W is performed by feeding pure water to the surface of the wafer W at a predetermined flow rate while rotating the wafer W in an approximately horizontal state, a feed amount of the pure water to the wafer W is reduced, and a pure-water feed point is moved outward from the center of the wafer W. In this manner, the wafer W is subjected to a spin dry process while forming a liquid film in a substantially outer region of the pure-water feed point.
    Type: Application
    Filed: March 8, 2011
    Publication date: June 30, 2011
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Hiromitsu NANBA, Takashi YABUTA, Takehiko ORII
  • Publication number: 20110089137
    Abstract: Provided are a substrate liquid processing apparatus, a substrate liquid processing method, and a computer readable storage medium having a substrate liquid processing program stored therein that can prevent the occurrence of the electrostatic breakdown caused by the discharge of electric charges in a substrate. The substrate liquid processing apparatus processes a circuit-forming surface of the substrate with a chemical liquid. Furthermore, prior to processing the substrate with the chemical liquid, the substrate liquid processing apparatus performs an anti-static process for an surface opposite to the circuit-forming surface of the substrate by an anti-static liquid, thereby emitting the electric charges on the substrate.
    Type: Application
    Filed: October 12, 2010
    Publication date: April 21, 2011
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Hiroshi TANAKA, Teruomi MINAMI, Yosuke KAWABUCHI, Norihiro ITO, Fumihiro KAMIMURA, Takashi YABUTA, Kazuki KOSAI, Takeshi UNO, Kenji SEKIGUCHI, Yasushi FUJII