Patents by Inventor Takashi Yamato

Takashi Yamato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11422143
    Abstract: The sample measuring apparatus includes a suction unit that includes a nozzle and a drive unit that raises and lowers the nozzle, and suctions a first liquid and a second liquid that is different from the first liquid; a liquid surface detecting unit that detects liquid surfaces of the first liquid and the second liquid; a control unit that controls the suction unit, and a measuring unit that measures a measurement sample prepared from the suctioned first liquid; wherein the control unit controls the suction unit to suction the first liquid and the second liquid based on the respective liquid surface detection result of the first liquid and the second liquid detected while lowering the nozzle, and a second speed at which the nozzle descends when detecting the liquid surface of the second liquid is faster than a first speed at which the nozzle descends when detecting the liquid surface of the first liquid.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: August 23, 2022
    Assignee: SYSMEX CORPORATION
    Inventors: Takashi Yamato, Jun Inagaki, Shunsuke Saito, Yoshinori Nakamura
  • Patent number: 10908175
    Abstract: A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.
    Type: Grant
    Filed: November 23, 2016
    Date of Patent: February 2, 2021
    Assignee: SYSMEX CORPORATION
    Inventors: Hiroshi Kurono, Takashi Yamato
  • Publication number: 20190265264
    Abstract: The sample measuring apparatus includes a suction unit that includes a nozzle and a drive unit that raises and lowers the nozzle, and suctions a first liquid and a second liquid that is different from the first liquid; a liquid surface detecting unit that detects liquid surfaces of the first liquid and the second liquid; a control unit that controls the suction unit, and a measuring unit that measures a measurement sample prepared from the suctioned first liquid; wherein the control unit controls the suction unit to suction the first liquid and the second liquid based on the respective liquid surface detection result of the first liquid and the second liquid detected while lowering the nozzle, and a second speed at which the nozzle descends when detecting the liquid surface of the second liquid is faster than a first speed at which the nozzle descends when detecting the liquid surface of the first liquid.
    Type: Application
    Filed: February 26, 2019
    Publication date: August 29, 2019
    Inventors: Takashi YAMATO, Jun INAGAKI, Shunsuke SAITO, Yoshinori NAKAMURA
  • Patent number: 10261016
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Grant
    Filed: March 15, 2016
    Date of Patent: April 16, 2019
    Assignee: SYSMEX CORPORATION
    Inventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
  • Publication number: 20170074895
    Abstract: A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.
    Type: Application
    Filed: November 23, 2016
    Publication date: March 16, 2017
    Applicant: SYSMEX CORPORATION
    Inventors: Hiroshi KURONO, Takashi YAMATO
  • Patent number: 9541567
    Abstract: A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.
    Type: Grant
    Filed: June 22, 2011
    Date of Patent: January 10, 2017
    Assignee: SYSMEX CORPORATION
    Inventors: Hiroshi Kurono, Takashi Yamato
  • Patent number: 9395380
    Abstract: A specimen processing apparatus comprising: a specimen processing section which includes a movable section and processes a specimen by moving the movable section; and a controller for determining whether the movable section was moved while a specimen processing operation by the specimen processing section was stopped, and controlling the specimen processing section to perform a preparing operation for starting the specimen processing operation based on the determination result, is disclosed. A control method for a specimen processing apparatus is also disclosed.
    Type: Grant
    Filed: July 23, 2010
    Date of Patent: July 19, 2016
    Assignee: SYSMEX CORPORATION
    Inventors: Takashi Yamato, Hiroshi Kurono
  • Publication number: 20160195560
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Application
    Filed: March 15, 2016
    Publication date: July 7, 2016
    Applicant: SYSMEX CORPORATION
    Inventors: Norimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
  • Patent number: 9316583
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Grant
    Filed: April 2, 2015
    Date of Patent: April 19, 2016
    Assignee: SYSMEX CORPORATION
    Inventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
  • Patent number: 9176155
    Abstract: A sample processing apparatus includes a sample processing unit for obtaining a sample from a sample container and performing a predetermined process of the sample; a transport unit which includes a transport region for transporting, in a transport operation, a sample rack holding the sample container to the sample processing unit, and a rack removal region where the sample rack is accessible to an operator. A restraining member is also provided, which restrains contact by the operator to the sample rack on the transport region. A transport controller controls the transport unit to transport the sample rack on the transport region to the rack removal region after a predetermined transport suspension event occurs during the transport operation.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: November 3, 2015
    Assignee: SYSMEX CORPORATION
    Inventors: Takashi Yamato, Hiroshi Kurono
  • Patent number: 9157924
    Abstract: A specimen analyzing apparatus for measuring a specimen by using a reagent which has a dispensing mechanism which includes a dispensing tube for suctioning and discharging liquid; a reagent container holder from which a reagent container is removable when the reagent container is in a container removal area; a receiving section for receiving a replacement command for a replacement of the reagent; and a controller for controlling the dispensing mechanism so as to retreat the dispensing tube from the container removal area when the replacement command has been received by the receiving section. Also, a control method for a specimen analyzing apparatus.
    Type: Grant
    Filed: August 27, 2010
    Date of Patent: October 13, 2015
    Assignee: SYSMEX CORPORATION
    Inventors: Takashi Yamato, Hiroshi Kurono
  • Patent number: 9097689
    Abstract: An apparatus for generating throughput information of a sample analyzer is disclosed. Specifically, this apparatus generates throughput information of a sample analyzer capable of measuring a sample on a plurality of measurement items in which measurement time differs from each other. The apparatus receives an input of a plurality of measurement orders, wherein a measurement order includes a designation of at least one measurement item, generates the throughput information of the sample analyzer based on the received plurality of measurement orders; and outputs the generated throughput information.
    Type: Grant
    Filed: June 29, 2011
    Date of Patent: August 4, 2015
    Assignee: SYSMEX CORPORATION
    Inventors: Takashi Yamato, Hisashi Nakatsuka, Hiroshi Kurono
  • Publication number: 20150211995
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Application
    Filed: April 2, 2015
    Publication date: July 30, 2015
    Applicant: SYSMEX CORPORATION
    Inventors: Norimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
  • Patent number: 9068956
    Abstract: A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount greater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.
    Type: Grant
    Filed: July 31, 2012
    Date of Patent: June 30, 2015
    Assignee: SYSMEX CORPORATION
    Inventors: Kazuya Fukuda, Hiroki Koike, Hironori Katsumi, Takashi Yamato, Masayuki Ikeda, Tsuyoshi Fukuzaki, Daisuke Nakano, Masanori Imazu, Nobuhiro Kitagawa
  • Patent number: 9028756
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Grant
    Filed: August 30, 2013
    Date of Patent: May 12, 2015
    Assignee: Sysmex Corporation
    Inventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
  • Patent number: 8938857
    Abstract: To provide a slide hinge which can be easily attached to a door or a cabinet main body of honeycomb cardboard, on which attaching screws do not work well, and which is further devised to eliminate a risk of escape from the door after the fixation, fittings enabling a coupling case to be attached to the door even without attaching screws or nails are provided; furthermore, each of the fittings comprises an attaching case part integrally connected to each side portion of the coupling case, and an fitting for each attaching case part; then, this fitting comprises a locking plate housed into the attaching case part and a diameter expanding means pushing out craw portions of the locking plate; the diameter expanding means further comprises an operating plate with pressurizing portions protruding on an outer circumference and a cap locked by a locking plate on each attaching case part.
    Type: Grant
    Filed: October 2, 2013
    Date of Patent: January 27, 2015
    Assignees: Katoh Electrical Machinery Co., Ltd., Toppan Cosmo, Inc., The Hard Industries. Inc.
    Inventors: Hideki Motosugi, Takashi Yamato, Hozumi Ikuta
  • Publication number: 20140096343
    Abstract: To provide a slide hinge which can be easily attached to a door or a cabinet main body of honeycomb cardboard, on which attaching screws do not work well, and which is further devised to eliminate a risk of escape from the door after the fixation, fittings enabling a coupling case to be attached to the door even without attaching screws or nails are provided; furthermore, each of the fittings comprises an attaching case part integrally connected to each side portion of the coupling case, and an fitting for each attaching case part; then, this fitting comprises a locking plate housed into the attaching case part and a diameter expanding means pushing out craw portions of the locking plate; the diameter expanding means further comprises an operating plate with pressurizing portions protruding on an outer circumference and a cap locked by a locking plate on each attaching case part.
    Type: Application
    Filed: October 2, 2013
    Publication date: April 10, 2014
    Applicants: KATOH ELECTRICAL MACHINERY CO., LTD., THE HARD INDUSTRIES. INC., TOPPAN COSMO, INC.
    Inventors: Hideki MOTOSUGI, Takashi YAMATO, Hozumi IKUTA
  • Publication number: 20140004612
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Application
    Filed: August 30, 2013
    Publication date: January 2, 2014
    Applicant: SYSMEX CORPORATION
    Inventors: Norimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
  • Patent number: 8545760
    Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: October 1, 2013
    Assignee: Sysmex Corporation
    Inventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
  • Patent number: 8455256
    Abstract: A sample processing apparatus, including: a sample processing unit for obtaining a sample from a sample container positioned at a sample obtaining position and performing a predetermined process of the sample; a transport unit for transporting a sample rack holding the sample container via the sample obtaining position; and a transport controller for performing a stop process to stop the transport operation of the sample rack by the transport unit when a transport suspension event has occurred during the transport operation of the sample rack, and for controlling the transport unit to restart the transport operation of the sample rack from a stop position at which the sample rack has been stopped by the stop process.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: June 4, 2013
    Assignee: Sysmex Corporation
    Inventors: Takashi Yamato, Hiroshi Kurono, Hiroki Koike