Patents by Inventor Takashi Yamato
Takashi Yamato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11422143Abstract: The sample measuring apparatus includes a suction unit that includes a nozzle and a drive unit that raises and lowers the nozzle, and suctions a first liquid and a second liquid that is different from the first liquid; a liquid surface detecting unit that detects liquid surfaces of the first liquid and the second liquid; a control unit that controls the suction unit, and a measuring unit that measures a measurement sample prepared from the suctioned first liquid; wherein the control unit controls the suction unit to suction the first liquid and the second liquid based on the respective liquid surface detection result of the first liquid and the second liquid detected while lowering the nozzle, and a second speed at which the nozzle descends when detecting the liquid surface of the second liquid is faster than a first speed at which the nozzle descends when detecting the liquid surface of the first liquid.Type: GrantFiled: February 26, 2019Date of Patent: August 23, 2022Assignee: SYSMEX CORPORATIONInventors: Takashi Yamato, Jun Inagaki, Shunsuke Saito, Yoshinori Nakamura
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Patent number: 10908175Abstract: A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.Type: GrantFiled: November 23, 2016Date of Patent: February 2, 2021Assignee: SYSMEX CORPORATIONInventors: Hiroshi Kurono, Takashi Yamato
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Publication number: 20190265264Abstract: The sample measuring apparatus includes a suction unit that includes a nozzle and a drive unit that raises and lowers the nozzle, and suctions a first liquid and a second liquid that is different from the first liquid; a liquid surface detecting unit that detects liquid surfaces of the first liquid and the second liquid; a control unit that controls the suction unit, and a measuring unit that measures a measurement sample prepared from the suctioned first liquid; wherein the control unit controls the suction unit to suction the first liquid and the second liquid based on the respective liquid surface detection result of the first liquid and the second liquid detected while lowering the nozzle, and a second speed at which the nozzle descends when detecting the liquid surface of the second liquid is faster than a first speed at which the nozzle descends when detecting the liquid surface of the first liquid.Type: ApplicationFiled: February 26, 2019Publication date: August 29, 2019Inventors: Takashi YAMATO, Jun INAGAKI, Shunsuke SAITO, Yoshinori NAKAMURA
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Patent number: 10261016Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: GrantFiled: March 15, 2016Date of Patent: April 16, 2019Assignee: SYSMEX CORPORATIONInventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
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Publication number: 20170074895Abstract: A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.Type: ApplicationFiled: November 23, 2016Publication date: March 16, 2017Applicant: SYSMEX CORPORATIONInventors: Hiroshi KURONO, Takashi YAMATO
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Patent number: 9541567Abstract: A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.Type: GrantFiled: June 22, 2011Date of Patent: January 10, 2017Assignee: SYSMEX CORPORATIONInventors: Hiroshi Kurono, Takashi Yamato
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Patent number: 9395380Abstract: A specimen processing apparatus comprising: a specimen processing section which includes a movable section and processes a specimen by moving the movable section; and a controller for determining whether the movable section was moved while a specimen processing operation by the specimen processing section was stopped, and controlling the specimen processing section to perform a preparing operation for starting the specimen processing operation based on the determination result, is disclosed. A control method for a specimen processing apparatus is also disclosed.Type: GrantFiled: July 23, 2010Date of Patent: July 19, 2016Assignee: SYSMEX CORPORATIONInventors: Takashi Yamato, Hiroshi Kurono
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Publication number: 20160195560Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: ApplicationFiled: March 15, 2016Publication date: July 7, 2016Applicant: SYSMEX CORPORATIONInventors: Norimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
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Patent number: 9316583Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: GrantFiled: April 2, 2015Date of Patent: April 19, 2016Assignee: SYSMEX CORPORATIONInventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
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Patent number: 9176155Abstract: A sample processing apparatus includes a sample processing unit for obtaining a sample from a sample container and performing a predetermined process of the sample; a transport unit which includes a transport region for transporting, in a transport operation, a sample rack holding the sample container to the sample processing unit, and a rack removal region where the sample rack is accessible to an operator. A restraining member is also provided, which restrains contact by the operator to the sample rack on the transport region. A transport controller controls the transport unit to transport the sample rack on the transport region to the rack removal region after a predetermined transport suspension event occurs during the transport operation.Type: GrantFiled: September 16, 2010Date of Patent: November 3, 2015Assignee: SYSMEX CORPORATIONInventors: Takashi Yamato, Hiroshi Kurono
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Patent number: 9157924Abstract: A specimen analyzing apparatus for measuring a specimen by using a reagent which has a dispensing mechanism which includes a dispensing tube for suctioning and discharging liquid; a reagent container holder from which a reagent container is removable when the reagent container is in a container removal area; a receiving section for receiving a replacement command for a replacement of the reagent; and a controller for controlling the dispensing mechanism so as to retreat the dispensing tube from the container removal area when the replacement command has been received by the receiving section. Also, a control method for a specimen analyzing apparatus.Type: GrantFiled: August 27, 2010Date of Patent: October 13, 2015Assignee: SYSMEX CORPORATIONInventors: Takashi Yamato, Hiroshi Kurono
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Patent number: 9097689Abstract: An apparatus for generating throughput information of a sample analyzer is disclosed. Specifically, this apparatus generates throughput information of a sample analyzer capable of measuring a sample on a plurality of measurement items in which measurement time differs from each other. The apparatus receives an input of a plurality of measurement orders, wherein a measurement order includes a designation of at least one measurement item, generates the throughput information of the sample analyzer based on the received plurality of measurement orders; and outputs the generated throughput information.Type: GrantFiled: June 29, 2011Date of Patent: August 4, 2015Assignee: SYSMEX CORPORATIONInventors: Takashi Yamato, Hisashi Nakatsuka, Hiroshi Kurono
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Publication number: 20150211995Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: ApplicationFiled: April 2, 2015Publication date: July 30, 2015Applicant: SYSMEX CORPORATIONInventors: Norimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
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Patent number: 9068956Abstract: A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount greater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.Type: GrantFiled: July 31, 2012Date of Patent: June 30, 2015Assignee: SYSMEX CORPORATIONInventors: Kazuya Fukuda, Hiroki Koike, Hironori Katsumi, Takashi Yamato, Masayuki Ikeda, Tsuyoshi Fukuzaki, Daisuke Nakano, Masanori Imazu, Nobuhiro Kitagawa
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Patent number: 9028756Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: GrantFiled: August 30, 2013Date of Patent: May 12, 2015Assignee: Sysmex CorporationInventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
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Patent number: 8938857Abstract: To provide a slide hinge which can be easily attached to a door or a cabinet main body of honeycomb cardboard, on which attaching screws do not work well, and which is further devised to eliminate a risk of escape from the door after the fixation, fittings enabling a coupling case to be attached to the door even without attaching screws or nails are provided; furthermore, each of the fittings comprises an attaching case part integrally connected to each side portion of the coupling case, and an fitting for each attaching case part; then, this fitting comprises a locking plate housed into the attaching case part and a diameter expanding means pushing out craw portions of the locking plate; the diameter expanding means further comprises an operating plate with pressurizing portions protruding on an outer circumference and a cap locked by a locking plate on each attaching case part.Type: GrantFiled: October 2, 2013Date of Patent: January 27, 2015Assignees: Katoh Electrical Machinery Co., Ltd., Toppan Cosmo, Inc., The Hard Industries. Inc.Inventors: Hideki Motosugi, Takashi Yamato, Hozumi Ikuta
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Publication number: 20140096343Abstract: To provide a slide hinge which can be easily attached to a door or a cabinet main body of honeycomb cardboard, on which attaching screws do not work well, and which is further devised to eliminate a risk of escape from the door after the fixation, fittings enabling a coupling case to be attached to the door even without attaching screws or nails are provided; furthermore, each of the fittings comprises an attaching case part integrally connected to each side portion of the coupling case, and an fitting for each attaching case part; then, this fitting comprises a locking plate housed into the attaching case part and a diameter expanding means pushing out craw portions of the locking plate; the diameter expanding means further comprises an operating plate with pressurizing portions protruding on an outer circumference and a cap locked by a locking plate on each attaching case part.Type: ApplicationFiled: October 2, 2013Publication date: April 10, 2014Applicants: KATOH ELECTRICAL MACHINERY CO., LTD., THE HARD INDUSTRIES. INC., TOPPAN COSMO, INC.Inventors: Hideki MOTOSUGI, Takashi YAMATO, Hozumi IKUTA
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Publication number: 20140004612Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: ApplicationFiled: August 30, 2013Publication date: January 2, 2014Applicant: SYSMEX CORPORATIONInventors: Norimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
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Patent number: 8545760Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.Type: GrantFiled: September 28, 2007Date of Patent: October 1, 2013Assignee: Sysmex CorporationInventors: Norimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
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Patent number: 8455256Abstract: A sample processing apparatus, including: a sample processing unit for obtaining a sample from a sample container positioned at a sample obtaining position and performing a predetermined process of the sample; a transport unit for transporting a sample rack holding the sample container via the sample obtaining position; and a transport controller for performing a stop process to stop the transport operation of the sample rack by the transport unit when a transport suspension event has occurred during the transport operation of the sample rack, and for controlling the transport unit to restart the transport operation of the sample rack from a stop position at which the sample rack has been stopped by the stop process.Type: GrantFiled: September 16, 2010Date of Patent: June 4, 2013Assignee: Sysmex CorporationInventors: Takashi Yamato, Hiroshi Kurono, Hiroki Koike