Patents by Inventor Takaya HIGA

Takaya HIGA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Assist apparatus, design assist method, design assist system, and computer readable medium
    Patent number: 12229485
    Abstract: There is provided a design assist apparatus including an inputting unit configured to input an analysis condition including substrate information of a thermal analysis target and current detection element information, and a display control unit configured to control a display unit to display, on the display unit, a thermal analysis result based on the analysis condition, in which the display control unit is configured to control the display unit to display, on the display unit and in a mutually identifiable manner, a first thermal analysis result based on a first analysis condition input by the inputting unit and a second thermal analysis result based on a second analysis condition obtained by changing at least one of the substrate information and the current detection element information from the first analysis condition.
    Type: Grant
    Filed: December 1, 2021
    Date of Patent: February 18, 2025
    Assignee: Asahi Kasei Microdevices Corporation
    Inventors: Takaya Higa, Taisuke Fujita
  • ASSIST APPARATUS, DESIGN ASSIST METHOD, DESIGN ASSIST SYSTEM, AND COMPUTER READABLE MEDIUM
    Publication number: 20220171909
    Abstract: There is provided a design assist apparatus including an inputting unit configured to input an analysis condition including substrate information of a thermal analysis target and current detection element information, and a display control unit configured to control a display unit to display, on the display unit, a thermal analysis result based on the analysis condition, in which the display control unit is configured to control the display unit to display, on the display unit and in a mutually identifiable manner, a first thermal analysis result based on a first analysis condition input by the inputting unit and a second thermal analysis result based on a second analysis condition obtained by changing at least one of the substrate information and the current detection element information from the first analysis condition.
    Type: Application
    Filed: December 1, 2021
    Publication date: June 2, 2022
    Inventors: Takaya HIGA, Taisuke FUJITA