Patents by Inventor Takaya Satoh
Takaya Satoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240110897Abstract: A second polymer is prepared through derivatization of a first polymer. Kendrick Mass Defect (KMD) analysis is applied on a mass spectrum of the second polymer, to thereby produce a plot. Meanwhile, a plurality of mass candidates for a non-primary-chain segment are calculated based on a mass spectrum of the first polymer. The KMD analysis is applied on the plurality of mass candidates, to thereby produce reference images. A mass of the non-primary-chain segment is identified through matching of two KMD analysis results.Type: ApplicationFiled: September 28, 2023Publication date: April 4, 2024Inventors: Takaya Satoh, Masahiro Hashimoto, Haruo Iwabuchi
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Publication number: 20230377116Abstract: A pre-processor applies a pre-process to an original mass image produced through mass spectrometry of a sample, to produce a model input image. An image quality converter has an image quality conversion model produced through machine learning based on a group of images produced by a scanning electron microscope, and produces a model output image through image quality conversion of the model input image. A post-processor applies a post-process to the model output image, to produce a mass image after image quality conversion.Type: ApplicationFiled: May 17, 2023Publication date: November 23, 2023Inventors: Masahiko Takei, Takaya Satoh
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Publication number: 20220406585Abstract: Peak determination is executed with respect to the mass spectrum of a sample to generate a peak list. For each of the plurality of peaks contained in the peak list, a Kendrick mass (KM) of a designated monomer is calculated. An RKM is calculated, the RKM being a fractional part of a value obtained by dividing the KM by the integer mass of the monomer, or a remainder of dividing a nominal Kendrick mass (NKM) by the integer mass of the monomer. A plurality of peaks contained in the peak list and satisfying a grouping condition, including the permissible range of the RKM of the starting point peak, are grouped.Type: ApplicationFiled: June 17, 2022Publication date: December 22, 2022Inventor: Takaya Satoh
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Publication number: 20220122825Abstract: A first peak list is generated based on a mass spectrum of a first polymer sample, and a second peak list is generated based on a mass spectrum of a second polymer sample. Based on the first peak list and the second peak list, a numerical value array (a differential value array, a ratio array) showing a difference between the peak lists is calculated. Based on the numerical value array and a correlated m/z array corresponding to the numerical value array, a KMD plot and an RKM plot are generated as a difference plot.Type: ApplicationFiled: October 18, 2021Publication date: April 21, 2022Inventor: Takaya Satoh
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Patent number: 11211150Abstract: A preprocessor extracts a plurality of spectra to be processed, from an overall mass spectrum. A simulated spectrum generator having a learned model generates a simulated spectrum having a peak discriminating action, from each mass spectrum. A postprocessor generates a combined simulated spectrum based on the plurality of simulated spectra. A peak filter executes peak discrimination on a peak list using the combined simulated spectrum.Type: GrantFiled: August 27, 2020Date of Patent: December 28, 2021Assignee: JEOL Ltd.Inventors: Fuminori Uematsu, Takaya Satoh, Masahiko Takei
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Publication number: 20210065849Abstract: A preprocessor extracts a plurality of spectra to be processed, from an overall mass spectrum. A simulated spectrum generator having a learned model generates a simulated spectrum having a peak discriminating action, from each mass spectrum. A postprocessor generates a combined simulated spectrum based on the plurality of simulated spectra. A peak filter executes peak discrimination on a peak list using the combined simulated spectrum.Type: ApplicationFiled: August 27, 2020Publication date: March 4, 2021Inventors: Fuminori Uematsu, Takaya Satoh, Masahiko Takei
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Patent number: 10629420Abstract: An ion intensity array is computed for each mass spectrum forming a mass spectrum array. For each ion intensity array, a plurality of indices a˜e showing a plurality of characteristics of the mass spectrum as a whole are computed. Based on the plurality of indices, a plurality of index distribution images are computed. A plurality of index distribution images may alternatively be computed based on a mass image array generated from the mass spectrum array.Type: GrantFiled: January 23, 2019Date of Patent: April 21, 2020Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Publication number: 20190228956Abstract: An ion intensity array is computed for each mass spectrum forming a mass spectrum array. For each ion intensity array, a plurality of indices a˜e showing a plurality of characteristics of the mass spectrum as a whole are computed. Based on the plurality of indices, a plurality of index distribution images are computed. A plurality of index distribution images may alternatively be computed based on a mass image array generated from the mass spectrum array.Type: ApplicationFiled: January 23, 2019Publication date: July 25, 2019Inventor: Takaya Satoh
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Patent number: 9536727Abstract: A flight-of-time mass spectrometer is offered which can provide a variable range of collisional energies that can be made wider than heretofore. Also, a method of controlling this spectrometer is offered. The spectrometer has an ion source, a first mass analyzer, an ion gate, a potential lift, a collisional cell, a second mass analyzer, a detector, and a potential control portion for controlling the potential on the potential lift. When the precursor ions selected by the ion gate enter the potential lift, the potential control portion sets the potential on the conductive box at V1. When the potential on the potential lift is varied, the potential control portion varies the potential on the potential lift from V1 to V2 while precursor ions are traveling through the potential lift.Type: GrantFiled: September 12, 2013Date of Patent: January 3, 2017Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Patent number: 9048071Abstract: An imaging mass spectrometer capable of reducing the dependence of the resolution of a projection image on mass is offered. Also, a method of controlling this spectrometer is offered. The imaging mass spectrometer includes: a plate on which a sample is placed; a lens system through which ions generated by irradiating the sample with laser light pass; an ion optical system for separating the ions according to flight time corresponding to mass-to-charge ratio; a detection system for measuring arrival positions and flight times of the ions passed through the ion optical system and generating an image of the sample when it is ionized; and a voltage control portion for sweeping the voltage applied to an electrode included in the lens system such that the lens effect of the lens system increases with time during a given period synchronized with the laser irradiation.Type: GrantFiled: September 12, 2013Date of Patent: June 2, 2015Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Patent number: 8766175Abstract: A tandem time-of-flight mass spectrometer is offered which can perform MS/MS measurements efficiently without sample wastage by ingeniously combining flight time ranges required by precursor ions with measurement times actually taken to measure the precursor ions. The mass spectrometer has an array input means for causing the flight time ranges required by selected precursor ions and the actually taken measurement times in which the precursor ions are measured to be appropriately arrayed in a time-sequential manner such that the flight time ranges and measurement times do not overlap each other.Type: GrantFiled: May 15, 2013Date of Patent: July 1, 2014Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Publication number: 20140166874Abstract: An imaging mass spectrometer capable of reducing the dependence of the resolution of a projection image on mass is offered. Also, a method of controlling this spectrometer is offered. The imaging mass spectrometer includes: a plate on which a sample is placed; a lens system through which ions generated by irradiating the sample with laser light pass; an ion optical system for separating the ions according to flight time corresponding to mass-to-charge ratio; a detection system for measuring arrival positions and flight times of the ions passed through the ion optical system and generating an image of the sample when it is ionized; and a voltage control portion for sweeping the voltage applied to an electrode included in the lens system such that the lens effect of the lens system increases with time during a given period synchronized with the laser irradiation.Type: ApplicationFiled: September 12, 2013Publication date: June 19, 2014Applicant: JEOL Ltd.Inventor: Takaya Satoh
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Publication number: 20140077076Abstract: A flight-of-time mass spectrometer is offered which can provide a variable range of collisional energies that can be made wider than heretofore. Also, a method of controlling this spectrometer is offered. The spectrometer has an ion source, a first mass analyzer, an ion gate, a potential lift, a collisional cell, a second mass analyzer, a detector, and a potential control portion for controlling the potential on the potential lift. When the precursor ions selected by the ion gate enter the potential lift, the potential control portion sets the potential on the conductive box at V1. When the potential on the potential lift is varied, the potential control portion varies the potential on the potential lift from V1 to V2 while precursor ions are traveling through the potential lift.Type: ApplicationFiled: September 12, 2013Publication date: March 20, 2014Applicant: JEOL Ltd.Inventor: Takaya Satoh
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Patent number: 8653451Abstract: A flight-of-time mass spectrometer and method of flight-of-time mass spectrometry. The spectrometer includes a storage portion, a parameter adjusting portion, a parameter setting portion, and a flight time measuring portion. The parameter adjusting portion calculates values of an adjustment parameter correlated with any specified m/z value based on an adjustment table. The parameter setting portion sets the delayed extraction parameters of the ion source based on the values of the adjustment parameters calculated by the parameter adjusting portion.Type: GrantFiled: May 22, 2012Date of Patent: February 18, 2014Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Publication number: 20130306859Abstract: A tandem time-of-flight mass spectrometer is offered which can perform MS/MS measurements efficiently without sample wastage by ingeniously combining flight time ranges required by precursor ions with measurement times actually taken to measure the precursor ions. The mass spectrometer has an array input means for causing the flight time ranges required by selected precursor ions and the actually taken measurement times in which the precursor ions are measured to be appropriately arrayed in a time-sequential manner such that the flight time ranges and measurement times do not overlap each other.Type: ApplicationFiled: May 15, 2013Publication date: November 21, 2013Applicant: JEOL Ltd.Inventor: Takaya Satoh
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Publication number: 20130289892Abstract: A data compression method for use by a flight-of-time mass spectrometer reduces the amount of digital data, which are converted from mass spectra by a digitizer, by thinning out their data points without reducing the amount of information over the whole range. The mass spectrometer has a data processing unit including data reduction means which reduces the number of data points of digital data delivered from the digitizer in response to an electrical signal indicative of ions based on a previously entered data table such that m/z regions partitioned by given flight times or given ink are set to have different numbers of data points.Type: ApplicationFiled: March 11, 2013Publication date: October 31, 2013Applicant: JEOL LTD.Inventor: Takaya Satoh
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Patent number: 8563923Abstract: An orthogonal acceleration time-of-flight mass spectrometer has: an ion source for ionizing a sample; a conductive box into which the ions are introduced; ion acceleration device causing the ions to be accelerated in a pulsed manner in synchronism with a signal giving a starting point of measurement; and ion detector for detecting the ions in synchronism with the acceleration of the ions. The conductive box is provided with an ion injection port and an ion exit port. A lift voltage is applied to the conductive box. This voltage is switched in synchronism with the signal giving the starting point of the measurement.Type: GrantFiled: November 12, 2008Date of Patent: October 22, 2013Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Patent number: 8330100Abstract: Tandem time-of-flight mass spectrometry method and apparatus permits an ion gate to be time set optimally at all times if the instrumental conditions are modified. Delayed extraction conditions for the mass-to-charge ratios of plural reference substances and optimum values of the time for which the ion gate is opened are measured and stored in a data table. Delayed extraction conditions and opening time of the ion gate which optimize the mass resolution at the mass-to-charge ratio of the desired precursor ions are found based on values stored in the table.Type: GrantFiled: August 31, 2011Date of Patent: December 11, 2012Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Publication number: 20120298855Abstract: A flight-of-time mass spectrometer and method of flight-of-time mass spectrometry. The spectrometer includes a storage portion, a parameter adjusting portion, a parameter setting portion, and a flight time measuring portion. The parameter adjusting portion calculates values of an adjustment parameter correlated with any specified m/z value based on an adjustment table. The parameter setting portion sets the delayed extraction parameters of the ion source based on the values of the adjustment parameters calculated by the parameter adjusting portion.Type: ApplicationFiled: May 22, 2012Publication date: November 29, 2012Applicant: JEOL LTD.Inventor: Takaya SATOH
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Publication number: 20120085905Abstract: A tandem time-of-flight mass spectrometer having enhanced duty cycle is offered. The inventive mass spectrometer has an ion storage means and a time-calculating means, in addition to the components of a normal tandem time-of-flight mass spectrometer. The time-calculating means finds the time between the instant at which precursor ions are ejected from the ion storage means and the instant at which the ions arrive at a position inside the orthogonal acceleration region where the ions pass into the following first TOF ion optical system at a maximum passage efficiency. The precursor ions are accelerated in a pulsed manner according to the instant at which the ions reach the position giving the maximum passage efficiency.Type: ApplicationFiled: October 3, 2011Publication date: April 12, 2012Applicant: JEOL LTD.Inventor: Takaya Satoh