Patents by Inventor Takayuki Itagaki

Takayuki Itagaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated detection of nanoparticles using single-particle inductively coupled plasma mass spectrometry (SP-ICP-MS)
    Patent number: 11075066
    Abstract: Particles such as nanoparticles in a sample are analyzed by single-particle inductively coupled plasma-mass spectrometry (spICP-MS). The sample is processed in an ICP-MS system to acquire time scan data corresponding to ion signal intensity versus time. A signal distribution, corresponding to ion signal intensity and the frequency at which the ion signal intensity was measured, is determined from the time scan data. A particle detection threshold is determined as an intersection point of an ionic signal portion and a particle signal portion of the signal distribution. The particle signal portion corresponds to measurements of particles in the sample, and the ionic signal portion corresponds to measurements of components in the sample other than particles. The particle detection threshold separates the particle signal portion from the ionic signal portion, and may be utilized to determine data regarding the particles.
    Type: Grant
    Filed: October 2, 2019
    Date of Patent: July 27, 2021
    Assignee: Agilent Technologies, Inc.
    Inventors: Takayuki Itagaki, Steven Wilbur, Michiko Yamanaka
  • AUTOMATED DETECTION OF NANOPARTICLES USING SINGLE-PARTICLE INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (SP-ICP-MS)
    Publication number: 20200135443
    Abstract: Particles such as nanoparticles in a sample are analyzed by single-particle inductively coupled plasma-mass spectrometry (spICP-MS). The sample is processed in an ICP-MS system to acquire time scan data corresponding to ion signal intensity versus time. A signal distribution, corresponding to ion signal intensity and the frequency at which the ion signal intensity was measured, is determined from the time scan data. A particle detection threshold is determined as an intersection point of an ionic signal portion and a particle signal portion of the signal distribution. The particle signal portion corresponds to measurements of particles in the sample, and the ionic signal portion corresponds to measurements of components in the sample other than particles. The particle detection threshold separates the particle signal portion from the ionic signal portion, and may be utilized to determine data regarding the particles.
    Type: Application
    Filed: October 2, 2019
    Publication date: April 30, 2020
    Inventors: Takayuki Itagaki, Steven Wilbur, Michiko Yamanaka