Abstract: A compound having formula (1) has excellent heat resistance. In formula (1), X represents a divalent polycyclic condensed ring group having two or more thiophene rings and having an sp3 carbon atom as a constituent element. R1 and R2 each represent an alkyl group, R3 represents an alkyl group, k represents an integer of 0 to 4, and A represents a group having formula (a1), (a2), or (b1): R4, R5, R6, R7, R8, and R9 each represent an alkyl group, E1 and E2 each represent —C(R10)(R11)—, —C(O)—, —O—, or —NR12—. R10 and R11 each represent an alkyl group, R12 represents an alkyl group, m and n each represent 0 or 1, where m+n=1.

Abstract: A photosensitive composition comprising a polymer compound composed of a repeating unit represented by the following formula (1) and at least one repeating unit selected from the group consisting of a repeating unit represented by the following formula (2), a repeating unit represented by the following formula (3) and a repeating unit represented by the following formula (4), and a compound having at least two azide groups: In the formula (1), Ar1 represents a phenyl group or a naphthyl group, and in the formula (2), Ar2 represents a phenyl group or a naphthyl group. l, m, n1 and n2 are numbers satisfying l?15 and m+n1+n2=100-l, and 1+n2?10 when the total amount of all repeating units contained in the above-described polymer compound is taken as 100.

Abstract: To provide a photosensitive composition excellent in a patterning property and capable of producing an organic thin-film transistor exhibiting high carrier mobility by being used in an insulation layer. A photosensitive composition comprising a polymer compound containing at least one repeating unit selected from the group consisting of a repeating unit represented by the following formula (1) and a repeating unit represented by the following formula (2) and a compound having at least two azide groups: In the formula (1), Ar1 represents a phenyl group or a naphthyl group, and in the formula (2), Ar2 represents a phenyl group or a naphthyl group. l and m are numbers satisfying that 1?15 and l+m>90 when the total amount of all repeating units contained in the above-described polymer compound is taken as 100.

Abstract: A film comprising a polymer compound and a low molecular weight compound having carrier transportability, wherein the content of the low molecular weight compound is 5 to 40 parts by mass with respect to 100 parts by mass of the sum of the polymer compound and the low molecular weight compound, the diffraction intensity A specified by the following measuring method A is 3 to 50, and the intensity ratio (A/B) of the diffraction intensity A specified by the following measuring method A to the diffraction intensity B specified by the following measuring method B is 30 or less: (Measuring method A) the diffraction intensity A is the maximum diffraction intensity in a range of scattering vector of 1 nm?1 to 5 nm?1 in a profile obtained by an Out-of plane measuring method using a film X-ray diffraction method; (Measuring method B) the diffraction intensity B is the maximum diffraction intensity in a range of scattering vector of 10 nm?1 to 21 nm?1 in a profile obtained by an In-plane measuring method using a film X

Abstract: A film comprising a polymer compound and a low molecular weight compound having carrier transportability, wherein the content of the low molecular weight compound is 5 to 40 parts by mass with respect to 100 parts by mass of the sum of the polymer compound and the low molecular weight compound, the diffraction intensity A specified by the following measuring method A is 3 to 50, and the intensity ratio (A/B) of the diffraction intensity A specified by the following measuring method A to the diffraction intensity B specified by the following measuring method B is 30 or less: (Measuring method A) the diffraction intensity A is the maximum diffraction intensity in a range of scattering vector of 1 nm?1 to 5 nm?1 in a profile obtained by an Out-of plane measuring method using a film X-ray diffraction method; (Measuring method B) the diffraction intensity B is the maximum diffraction intensity in a range of scattering vector of 10 nm?1 to 21 nm?1 in a profile obtained by an In-plane measuring method using a film X

Abstract: A composition comprising a polymer compound containing a structural unit represented by the formula (1) and a compound represented by the formula (2): [wherein Ring A and Ring B each independently represent a heterocyclic ring, and this heterocyclic ring may have a substituent. Ring C represents an aromatic hydrocarbon ring or a heterocyclic ring, and these rings may have a substituent. Z1 represents a group represented by the formula (Z-1), a group represented by the formula (Z-2), a group represented by the formula (Z-3), a group represented by the formula (Z-4) or a group represented by the formula (Z-5). A plurality of Z1 may be mutually the same or different.] [wherein R1 represents an alkyl group, a cycloalkyl group, an alkoxy group, a cycloalkoxy group, an alkylthio group, a cycloalkylthio group, an aryl group or a monovalent heterocyclic ring group, and these groups may have a substituent. When there are a plurality of R1, they may be the same or different.

Abstract: Thin-film transistor includes column-shaped protrusion portion having a side surface and protruding from a main surface of the substrate, a gate insulating layer including a first layer and a second layer, at least part of the gate insulating layer being in a channel region extending along the side surface, a gate electrode in contact with the gate insulating layer, a source electrode and a drain electrode isolated from one another, at least part of one of the source electrode and the drain electrode overlap the protrusion portion and the other being in a region that does not overlap the protrusion portion or the one electrode, and a semiconductor layer in contact with at least part of the source electrode, at least part of the drain electrode, and at least part of the gate insulating layer in the channel region directly or with a functional layer interposed.

Abstract: To provide an organic semiconductor composition that can exhibit a high carrier transport property and give uniform characteristics. An organic semiconductor composition characterized by containing a high molecular weight compound having a carrier transport property and a low molecular weight compound, in which the low molecular weight compound has a structure represented by Formula (1) and a content ratio of the low molecular weight compound is from 5 to 95 parts by mass relative to a total of 100 parts by mass of the high molecular weight compound and the low molecular weight compound, [where, E represents a sulfur atom or a selenium atom, three E's may be the same or may be different from one another, and an aromatic ring in Formula may have substituents].

Abstract: To provide an organic semiconductor composition that can exhibit a high carrier transport property and give uniform characteristics. An organic semiconductor composition characterized by containing a high molecular weight compound having a carrier transport property and a low molecular weight compound, in which the low molecular weight compound has a structure represented by Formula (1) and a content ratio of the low molecular weight compound is from 5 to 95 parts by mass relative to a total of 100 parts by mass of the high molecular weight compound and the low molecular weight compound, [where, E represents a sulfur atom or a selenium atom, three E's may be the same or may be different from one another, and an aromatic ring in Formula may have substituents].