Abstract: An electronic component includes a laminate including internal electrodes alternately laminated in a lamination direction with dielectric layers interposed therebetween. The laminate includes main surfaces opposite to each other in the lamination direction, side surfaces opposite to each other in a width direction, and end surfaces opposite to each other in a length direction, and external electrodes provided on surfaces of the laminate and electrically connected to the internal electrodes. Each of the dielectric layers includes Ti and Mg. When a cross section including the length direction and the width direction of the laminate is viewed from the lamination direction, side margin portions in which the internal electrodes do not exist each include a dielectric including Ti and Mg with a molar ratio in each of the side margin portions smaller than a molar ratio of Mg to Ti included in each of the dielectric layers.

Abstract: A leakage inspection device includes an inspection chamber in which an inspection object is disposed to be filled with a tracer gas, and a circulation passage which connects a suction port disposed in the inspection chamber and a blowout port disposed at a position away from the suction port in the inspection chamber with each other. The leakage inspection device includes a blower disposed in the circulation passage to circulate gas by sucking from the inspection chamber through the suction port and by blowing out from the blowout port. The leakage inspection device includes a detector configured to detect the tracer gas leaked from the inspection object and contained in the gas flowing through the circulation passage at a position separated by a predetermined distance or more from the blower toward the blowout port in the circulation passage.

Abstract: A leakage inspection device includes an inspection chamber in which an inspection object is disposed to be filled with a tracer gas, and a circulation passage which connects a suction port disposed in the inspection chamber and a blowout port disposed at a position away from the suction port in the inspection chamber with each other. The leakage inspection device includes a blower disposed in the circulation passage to circulate gas by sucking from the inspection chamber through the suction port and by blowing out from the blowout port. The leakage inspection device includes a detector configured to detect the tracer gas leaked from the inspection object and contained in the gas flowing through the circulation passage at a position separated by a predetermined distance or more from the blower toward the blowout port in the circulation passage.

Abstract: An electronic component includes a laminate including internal electrodes alternately laminated in a lamination direction with dielectric layers interposed therebetween. The laminate includes main surfaces opposite to each other in the lamination direction, side surfaces opposite to each other in a width direction, and end surfaces opposite to each other in a length direction, and external electrodes provided on surfaces of the laminate and electrically connected to the internal electrodes. Each of the dielectric layers includes Ti and Mg. When a cross section including the length direction and the width direction of the laminate is viewed from the lamination direction, side margin portions in which the internal electrodes do not exist each include a dielectric including Ti and Mg with a molar ratio in each of the side margin portions smaller than a molar ratio of Mg to Ti included in each of the dielectric layers.

Abstract: A multilayer ceramic capacitor that has alternately stacked dielectric layers containing, as their main constituent, a barium titanate based compound that has a perovskite-type crystal structure; and internal electrode layers with electrode defects. The internal electrode layers are 0.6 ?m or less in thickness. The electrode defects have electrode defects containing an Al—Si based oxide mainly containing Al and Si. The number of the electrode defects containing the Al—Si based oxide is 30% or more in number ratio to the total number of electrode defects in the internal electrodes.

Abstract: A dielectric ceramic that contains Al and Si, as well as a barium titanate-based compound having a perovskite type crystal structure as a primary component. The total molar amount of Al and Si is 2 to 4 parts by mole with respect to 100 parts by mole of Ti, and the content ratio of Al with respect to the total molar amount is 0.2 or less (excluding 0) on the molar ratio basis. The dielectric ceramic may also contain at least one specific rare earth element Re, such as Gd, Tb, or Dy.

Abstract: Provide is a laminated ceramic capacitor which can suppress the decrease in dielectric constant even when ceramic layers are further reduced in thickness. The laminated ceramic capacitor includes a laminate having a plurality of stacked ceramic layers stacked and a plurality of internal electrodes formed along interfaces between the ceramic layers; and a plurality of external electrodes formed on the outer surface of the laminate and electrically connected to the internal electrodes ceramic grains in contact with both of adjacent internal electrodes adjacent with a ceramic layer interposed therebetween are present in the ceramic layers and the internal electrodes are 0.60 ?m or less in thickness.

Abstract: A raw ceramic portion is formed on each of first and second lateral surfaces of a raw ceramic body. The raw ceramic portions contain ceramic particles and more of at least one constituent selected from Ba, Mg, Mn, and a rare-earth element between the ceramic particles than the ceramic section of the raw ceramic body in terms of total amount. The raw ceramic body is fired with the raw ceramic portions thereon. In this way, a ceramic electronic component is obtained that has a main body left after the raw ceramic body is fired with the raw ceramic portions thereon.

Abstract: A multilayer ceramic capacitor that has alternately stacked dielectric layers containing, as their main constituent, a barium titanate based compound that has a perovskite-type crystal structure; and internal electrode layers with electrode defects. The internal electrode layers are 0.6 ?m or less in thickness. The electrode defects have electrode defects containing an Al—Si based oxide mainly containing Al and Si. The number of the electrode defects containing the Al—Si based oxide is 30% or more in number ratio to the total number of electrode defects in the internal electrodes.

Abstract: A dielectric ceramic that contains Al and Si, as well as a barium titanate-based compound having a perovskite type crystal structure as a primary component. The total molar amount of Al and Si is 2 to 4 parts by mole with respect to 100 parts by mole of Ti, and the content ratio of Al with respect to the total molar amount is 0.2 or less (excluding 0) on the molar ratio basis. The dielectric ceramic may also contain at least one specific rare earth element Re, such as Gd, Tb, or Dy.

Abstract: Provided is a laminated ceramic capacitor which produces excellent lifetime characteristics in a high-temperature loading test even when dielectric layers are reduced in thickness. The dielectric ceramic contains, as its main constituent, a compound represented by the general formula (Ba1-x-yCaxRey)(Ti1-zMz)O3 (where Re is at least one or more elements selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and Y, and M is at least one or more elements selected from among Mg, Mn, Al, Cr, and Zn), 0?x?0.2, 0.002?y?0.1, and 0.001?z?0.05. This dielectric ceramic has crystal grains of 20 nm or more and 150 nm or less in average grain size.

Abstract: Provided is a laminated ceramic capacitor that can suppress the decrease in insulation resistance after a moisture-resistance loading test. It contains ceramic layers which include: main-phase grains that have a perovskite-type compound containing Ba and Ti and optionally containing Ca, Sr, Zr, and Hf; and secondary-phase grains that have an average grain size of 100 nm or more and have a Si content of 50 mol % or more per grain, the average grain boundary number, represented by (Average Thickness for Ceramic Layers 3)/(Average Grain Size for Main Phase Grains)?1, is greater than 0 and 3.0 or less, and the average grain size for the secondary-phase grains is ¼ or more of the average thickness for the ceramic layers 3.

Abstract: A raw ceramic portion is formed on each of first and second lateral surfaces of a raw ceramic body. The raw ceramic portions contain ceramic particles and more of at least one constituent selected from Ba, Mg, Mn, and a rare-earth element between the ceramic particles than the ceramic section of the raw ceramic body in terms of total amount. The raw ceramic body is fired with the raw ceramic portions thereon. In this way, a ceramic electronic component is obtained that has a main body left after the raw ceramic body is fired with the raw ceramic portions thereon.

Abstract: Provided is a laminated ceramic capacitor that can suppress the decrease in insulation resistance after a moisture-resistance loading test. It contains ceramic layers which include: main-phase grains that have a perovskite-type compound containing Ba and Ti and optionally containing Ca, Sr, Zr, and Hf; and secondary-phase grains that have an average grain size of 100 nm or more and have a Si content of 50 mol % or more per grain, the average grain boundary number, represented by (Average Thickness for Ceramic Layers 3)/(Average Grain Size for Main Phase Grains)?1, is greater than 0 and 3.0 or less, and the average grain size for the secondary-phase grains is 1/4 or more of the average thickness for the ceramic layers 3.

Abstract: Provide is a laminated ceramic capacitor which can suppress the decrease in dielectric constant even when ceramic layers are further reduced in thickness. The laminated ceramic capacitor includes a laminate having a plurality of stacked ceramic layers stacked and a plurality of internal electrodes formed along interfaces between the ceramic layers; and a plurality of external electrodes formed on the outer surface of the laminate and electrically connected to the internal electrodes ceramic grains in contact with both of adjacent internal electrodes adjacent with a ceramic layer interposed therebetween are present in the ceramic layers and the internal electrodes are 0.60 ?m or less in thickness.

Abstract: A dielectric ceramic capacitor that has excellent reliability and particularly excellent life characteristics in a load test even when the thickness of a dielectric ceramic layer is reduced uses a dielectric ceramic as a dielectric ceramic layer in a laminated ceramic capacitor which is a substance containing, as the main component, (Ba, R)(Ti, V)O3 or (Ba, Ca, R)(Ti, V)O3 in which R is at least one selected from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and Y, and in which both V and R are present uniformly in the main component particles.

Abstract: A laminated ceramic capacitor which provides favorable life characteristics, even when a high electric field strength is applied while dielectric ceramic layers are reduced in layer thickness to less than 1 ?m, contains a dielectric ceramic a compound represented by: (Ba1-x/100Cax/100)mTiO3 (0?x?20) as its main constituent, and as its accessory constituent, aMg-bSi-cMn-dR (R is at least one of La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and Y, and a, b, c, and d (part by mol) respectively satisfy the conditions of 0.1<a?20.0, 0.5<b?20.0, 0.1<c?10.0, and 1.0<d?30.0 with respect to 100 parts by mol of the main constituent). The average grain size is 20 nm or more and less than 100 nm for crystal grains in a sintered body obtained by firing the dielectric ceramic.

Abstract: A dielectric ceramic which is capable of achieving a laminated ceramic capacitor with high reliability, in particular, favorable lifetime characteristics in a load test, even when a dielectric ceramic layer is reduced in thickness contains one of (Ba,R)(Ti,Mn)O3 and (Ba,Ca,R)(Ti,Mn)O3 (R being La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and/or Y) as a main component, and M (M being Fe, Co, V, W, Cr, Mo, Cu, Al, and/or Mg) and Si as accessory components. The area of a region in which M is present is 10% or less on average of a cross section of each main component grain.

Abstract: A dielectric ceramic which is capable of achieving a laminated ceramic capacitor with high reliability, in particular, favorable lifetime characteristics in a load test, even when a dielectric ceramic layer is reduced in thickness, contains one of Ba(Ti, Mn)O3 and (Ba, Ca)(Ti, Mn)O3 as a main component, and R (La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and/or Y), M (Fe, Co, V, W, Cr, Mo, Cu, Al, and/or Mg) and Si as accessory components. The area of a region in which at least one of R and M is present is 10% or less on average on a cross section of each main component grain.

Abstract: A monolithic ceramic capacitor includes dielectric ceramic layers having a thickness of less than 1 ?m. When this thickness is t and the crystal grains of a dielectric ceramic of the layers have a mean diameter of r, a mean number N of grain boundaries satisfies 0<N?2 where N=t/r?1. The dielectric ceramic contains, as a main component, a perovskite type compound ABO3 (where A is Ba or Ba and at least one of Ca and Sr, B is Ti or Ti and at least one of Zr and Hf), and further contains Mn and V as auxiliary components. On the basis of 100 molar parts of the main component, the content of Mn is 0.05 to 0.75 molar parts, the content of V is 0.05 to 0.75 molar parts, and the total content of Mn and V is 0.10 to 0.80 molar parts.