Patents by Inventor Takazumi Ishizu

Takazumi Ishizu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060060300
    Abstract: A plasma treatment method of etching a substrate to be processed by using a gas plasma in a treatment chamber. The method includes exhausting reaction products obtained by etching and released into a vapor phase as a gas from the treatment chamber, wherein the reaction products on an outer periphery of the substrate are more efficiently exhausted and setting a deposition probability of the reaction products in a central part of a plane of the substrate to be low and setting a deposition probability of the reaction products in a peripheral part of a plane of the substrate to be high. The setting of the deposition probability is effected by setting a temperature in the central part of the substrate higher than a temperature in the peripheral part of the substrate.
    Type: Application
    Filed: November 16, 2005
    Publication date: March 23, 2006
    Inventors: Kazue Takahashi, Saburo Kanai, Yoshiaki Satou, Takazumi Ishizu
  • Publication number: 20050087093
    Abstract: The invention provides a railway car body that causes less noise and that can be manufactured easily. The railway car comprises a subframe 40 disposed below a floor of the car body with a clearance therebetween, and a bogie 30 disposed below the subframe 40 with a clearance therebetween, wherein car body 10 and subframe 40 are connected via a center pin 50 protruding downward from car body 10, and subframe 40 and bogie 30 are connected via a second center pin 70 protruding upward from the bogie. The lower end of the second center pin 70 is connected to the bogie 30 via a coupling link 110.
    Type: Application
    Filed: September 3, 2004
    Publication date: April 28, 2005
    Inventors: Takazumi Ishizu, Hideo Takaki, Michio Sebata
  • Publication number: 20030060054
    Abstract: A plasma treatment method of etching a substrate to be processed by using a gas plasma in a treatment chamber. The method includes exhausting reaction products obtained by etching and released into a vapor phase as a gas from the treatment chamber, wherein the reaction products on an outer periphery of the substrate are more efficiently exhausted and setting a deposition probability of the reaction products in a central part of a plane of the substrate to be low and setting a deposition probability of the reaction products in a peripheral part of a plane of the substrate to be high. The setting of the deposition probability is effected by setting a temperature in the central part of the substrate higher than a temperature in the peripheral part of the substrate.
    Type: Application
    Filed: November 6, 2002
    Publication date: March 27, 2003
    Inventors: Kazue Takahashi, Saburo Kanai, Yoshiaki Satou, Takazumi Ishizu
  • Patent number: 6482747
    Abstract: Plasma treatment apparatus and method in which an influence on the treatment characteristics of reaction products in plasma treatment such as etching is offset, thereby enabling uniform treatment characteristics to be obtained in the plane of a substrate are provided. In a plasma treatment method of treating a substrate to be processed by using a gas plasma via a mask in a treatment chamber, plasma treatment is performed while optimizing an amount of deposition of a side wall protection layer, equalizing the optimized deposition amount in the center of the substrate and that in a peripheral part, and maintaining the uniformity in the plane of the side wall protection layer.
    Type: Grant
    Filed: December 22, 1998
    Date of Patent: November 19, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Kazue Takahashi, Saburo Kanai, Yoshiaki Satou, Takazumi Ishizu
  • Patent number: 6156663
    Abstract: Provided is a method of processing a sample by generating plasma by an electromagnetic wave, wherein a material containing carbon, such as silicon carbide (Sic), is disposed in a vacuum container serving as a discharge region. The inside of an etching chamber is cleaned by O.sub.2 cleaning treatment by using a sheet type dry etching apparatus, and after an inner wall temperature of the etching chamber is set and controlled, a sample is conveyed into the etching chamber, and a TiN cap layer, an Al--Cu alloy layer and a TiN barrier layer are plasma-etched in order by using BCl.sub.3 /Cl.sub.2 /CH.sub.4 /Ar gases with the pattern of a resist film as a mask.
    Type: Grant
    Filed: September 27, 1996
    Date of Patent: December 5, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Katsuya Watanabe, Saburo Kanai, Ryoji Hamasaki, Tsuyoshi Yoshida, Yutaka Omoto, Masayuki Kojima, Syunji Sasabe, Tadamitsu Kanekiyo, Takazumi Ishizu
  • Patent number: 5122175
    Abstract: The present invention consists in that a nitrogen gas line and a liquid nitrogen line are subjected to hot-blast baking with clean nitrogen gas and a gas containing oxygen, whereby outgasses such as moisture to develop from heat exchangers, valves and piping can be excluded. Moreover, in order to obtain nitrogen gas of very high purity, liquid nitrogen of low contents of high-boiling components as subjected to rectifying separation is derived and gasified, and the liquid nitrogen is introduced into co-adsorbers so as to absorb and remove carbon monoxide difficult of separation by the rectifying separation, whereupon the liquid nitrogen and the nitrogen gas are obtained as products.
    Type: Grant
    Filed: May 31, 1990
    Date of Patent: June 16, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Shozi Koyama, Takazumi Ishizu, Junichi Hosokawa, Masahiro Yamazaki, Shinjiroo Ueda, Kanji Fujimori
  • Patent number: 4746343
    Abstract: The invention discloses a method of gas separation which pressurizes part of a raw gas issuing from the outlet of an adsorbing tower by employing a compressor portion of an expander compressor, cools the pressurized gas by means of a main heat exchanger, and expands the cooled gas by means of an expansion turbine of the expander compressor, thereby efficiently carrying out gas separation with a simple arrangement.
    Type: Grant
    Filed: October 30, 1986
    Date of Patent: May 24, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Takazumi Ishizu, Masahiro Yamazaki, Shozi Koyama, Kazunori Nagae, Junichi Hosokawa
  • Patent number: 4746332
    Abstract: Nitrogen having purity of 99.9999% or more can be produced continuously by contacting a starting gas mixture comprising 90% by volume or more of nitrogen and 10% by volume or less of oxygen with A-type zeolite package in an adsorption column at an adsorption temperature of -100.degree. to -196.degree. C. to remove oxygen from the starting gas mixture and regenerating A-type zeolite by heating it at a temperature higher than the adsorption temperature.
    Type: Grant
    Filed: September 25, 1986
    Date of Patent: May 24, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Masaomi Tomomura, Tetsuro Haga, Shunsuke Nogita, Kiyoshi Ichihara, Takazumi Ishizu
  • Patent number: 4704139
    Abstract: A method of separating gases which includes: a step which introduces into a separating cell a mixture gas that contains paramagnetic gases and nonparamagnetic gases, and which separates the paramagnetic gases and the nonparamagnetic gases from the mixture gas via a permeable membrane in the separating cell; and a step which applies a magnetic field to a gas stream of the mixture gas nearly at right angles therewith to form a high gradient magnetic field region, so that the paramagnetic gases and the nonparamagnetic gases are separated from the mixture gas by the high gradient magnetic field.
    Type: Grant
    Filed: September 4, 1986
    Date of Patent: November 3, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Akio Yamamoto, Takazumi Ishizu, Kiyoshi Ichihara