Patents by Inventor Takefumi Ueda

Takefumi Ueda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing of semiconductor device and a fabrication process of a semiconductor device including a testing process
    Patent number: 6721676
    Abstract: A process of converting simulation data to test data used for testing an integrated circuit includes the steps of detecting a transition of state of the simulation data, extracting an event from the simulation data in response to the transition, and creating the test data in response to the event.
    Type: Grant
    Filed: April 22, 1999
    Date of Patent: April 13, 2004
    Assignee: Fujitsu Limited
    Inventor: Takefumi Ueda